摘要
机载电子设备中广泛采用的静态随机存储器(Static Random Access Memory,SRAM)型现场可编程门阵列(Field Programmable Gate Array,FPGA)易受到大气中子辐射的影响而发生单粒子翻转。为了提高抗干扰能力,针对SRAM型FPGA需要进行抗单粒子翻转防护,提出了一种Xilinx FPGA有效配置位的保护方法。该方法提取电路中的有效配置位,纠错电路检测到电路中发生单粒子翻转时,纠正有效配置位上发生的翻转。实验表明该方法可以有效保护Xilinx FPGA的有效配置位并提高了纠错电路的效率。
The SRAM-based FPGA,which is widely used in airborne electronic equipment,is susceptible to single event upset due to atmospheric neutron radiation.In order to improve the anti-jamming capability,a protection method for the essential configuration bits of Xilinx FPGA is proposed for SRAM-based FPGA that need to be protected against single event upset.After the essential configuration bits are extracted,when the error correction circuit detects that a single event upset occurs in the circuit,the upset on the essential bit will be corrected.Experiment shows that this method can effectively protect the essential configuration bits of Xilinx FPGA and improve the efficiency of the error correction circuit.
作者
王鹏
刘正清
田毅
WANG Peng;LIU Zhengqing;TIAN Yi(College of Safety Science and Engineering,Civil Aviation University of China,Tianjin 300300,China)
出处
《电讯技术》
北大核心
2022年第3期379-384,共6页
Telecommunication Engineering
基金
中国民航大学实验室创新基金(2020CXJJ42)。
关键词
机载电子设备
单粒子翻转(SEU)
容错方法
有效配置位
airborne electronic equipment
single event upset(SEU)
mitigation method
essential configuration bits
