摘要
试样经稀释后,采用电感耦和等离子体发射光谱法(ICP-AES)直接测定盐酸中的微量硅含量,结果表明,选择波长288.158 nm作为分析线,检测限为质量浓度0.02 mg/L,回收率99.9%~103.3%,相对标准偏差2.8%,在质量浓度0.05~5 mg/L内线性关系良好。该方法简便快捷,精密度较好,相对标准偏差2.8%,准确度较高,能满足盐酸中微量硅含量的测定。
After the sample was diluted,the trace silicon content in hydrochloric acid was directly determined by inductively coupled plasma atomic emission spectrometry(ICP-AES).The results showed that the wavelength of 288.158 nm was selected as the analytical line,the detection limit was 0.02 mg/L,the recovery rate was 99.9%~103.3%,the relative standard deviation was 2.8%,and the linear relationship was good in the mass concentration of 0.05~5 mg/L.This method is simple,rapid,with good precision,relative standard deviation of 2.8%,and high accuracy,which can meet the determination of trace silicon content in hydrochloric acid.
作者
许醉笑
XU Zuixiao(Jiangsu Saifushi biology technology Co.Itd,Taizhou,Zhejiang 225300)
出处
《化工生产与技术》
CAS
2022年第2期41-42,I0005,共3页
Chemical Production and Technology
关键词
硅含量
电感耦和等离子体发射光谱法
盐酸
silicon content
inductively coupled plasma atomic emission spectrometry
hydrochloric acid
