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老炼试验中工装夹具对大功率器件的影响

Influence of Fixture on High-power Devices in Burn-in Test
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摘要 随着芯片技术的不断发展,当前大功率电子器件正朝着高功率水平、高集成度方向发展,其自身发热量也在不断地增大。同时大功率器件工作时产生的热量将会使得器件的温度不断升高,从而导致器件性能的恶化甚至损坏。因此,此类器件在散热问题已成为大功率器件老化工序的重点问题。对大功率器件老化夹具的散热性能进行了对比和研究,为大功率器件在老化工序中的夹具的选择提供一定的参考依据。 With the continuous development of chip technology, high-power electrical appliances are currently developing in the direction of high power level and high integration, and their own heat is constantly increasing. At the same time, the heat generated by the operation of high-power devices will cause the temperature of the device to rise,which will cause deterioration or even damage to the performance of the device. Therefore, the heat dissipation problem of such devices has become the key problem in the burn-in process of high-power devices. The heat dissipation performance of aging fixtures of high-power devices is compared and studied, which provides a certain reference basis for selecting fixtures for high-power devices in the burn-in process.
作者 邵振宇 吴忧 谢小猛 SHAO Zhenyu;WU You;XIE Xiaomeng(No.58 Research Institute of China Electronics Technology Group Corporation,Wuxi 214035,China)
出处 《电子质量》 2023年第1期63-67,共5页 Electronics Quality
关键词 大功率器件 夹具 散热 老炼试验 high-power device fixture heat dissipation burn-in test
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