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基于非概率理论的引信MEMS安全与解除隔离装置闭锁机构可靠性评估 被引量:3

Fuze MEMS S&A Device Latching Mechanism Reliability Assessment Based on Non-probability Theory
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摘要 针对引信MEMS安全与解除隔离装置样本数量少、结构不确定、参数精确的统计规律难以获得、概率可靠性分析方法在小样本条件下不适用等问题,提出一种基于非概率理论的小样本条件下MEMS安解装置闭锁机构可靠性评估方法。该方法以非概率理论为基础,结合薄板弯曲理论建立MEMS安解装置闭锁机构的可靠性模型,得出其可靠性指标,然后进行区间变量的敏感性分析。对样本进行离心实验,模拟炮弹发射时离心环境,实验结果表明,MEMS安全与解除隔离装置闭锁机构具有很高的闭锁可靠性。实验结果与非概率理论分析结果保持一致,验证了非概率理论在引信MEMS安全与解除隔离装置可靠性评估上的有效性。 At present,the sample size of the fuze MEMS S&A device is small,the precise statistical laws of the structural uncertain parameters are difficult to obtain,and the probabilistic reliability analysis method is not applicable under the small sample condition.A reliability assessment method of the MEMS S&A device latching mechanism under the small sample condition based on non-probability theory is proposed.Based on non-probability theory,combined with thin plate bending theory to establish the reliability model of the MEMS S&A device latching mechanism and derive its reliability index;then sensitivity analysis of interval variables is performed,then centrifugal experiments were conducted on the samples to simulate the centrifugal environment when the shells were fired.The experimental results show that the latching mechanism of the MEMS an unlocking device has high latching reliability,which is consistent with the results of non-probability theory analysis.The validity of the non-probability theory in the reliability assessment of the fuze MEMS S&A device latching mechanism is verified.
作者 潘黎成 曹云 雷胜洪 陆海宁 聂伟荣 席占稳 PAN Licheng;CAO Yun;LEI Shenghong;LU Haining;NIE Weirong;XI Zhanwen(School of Mechanical Engineering,Nanjing University of Science and Technology,Nanjing 210094,China;Chongqing Changan Industry(Group)CO.,LTD,Chongqing 401120,China)
出处 《探测与控制学报》 CSCD 北大核心 2023年第2期11-19,共9页 Journal of Detection & Control
关键词 引信 微机电系统 安全与解除隔离装置 非概率理论 可靠性评估 fuze MEMS S&A device non-probability theory reliability assessment
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