摘要
为了提高过擦除修复的可靠性以及提高过擦除修复的效率,设计了一种基于Nor型闪存存储器的过擦除修复流程。本文首先介绍了过擦除现象的产生以及对Nor型闪存存储器正常工作的影响,并介绍了一种解决过擦除现象的常用方法,即软编程。随后对一种传统的擦除流程进行了研究,引入两种当下常用的过擦验证流程并对它们的过擦验证效率进行分析。在此基础上提出了一种新的过擦除验证流程,也就是后文提到的组合过擦除修复流程,该流程将非严重过擦除存储单元的擦除时间缩短,同时可对严重过擦除存储单元进行更精细的修复,从而达到提高过擦除修复的可靠性以及修复效率。最后实验表明该过擦除流程的优化结果良好,实用性很强。
In order to improve the reliability and efficiency of over-erase repair,an over-erase repair process based on Nor-type flash memory is designed.This paper firstly introduces the occurrence of over-erase phenomenon and its influence on the normal operation of Nor-type flash memory,and introduces a common method to solve over-erase phenomenon,namely soft programming.Then,a traditional erasing process is studied,and two commonly used over-erasing verification processes are introduced and their over-erasing verification efficiency is analyzed.On this basis,a new over-erasure verification process is proposed,the combined erasure repair process is described below,which shortens the erasing time of non-severely over-erased memory cells,and can perform finer repairs on severely over-erased memory cells,so as to improve the Reliability and repair efficiency of over-erase repair.The final experiment shows that the optimization result of the over-erase process is good,and the practicability is very strong.
作者
罗笠洋
徐俊
LUO Li-yang;XU Jun(Southeast University;No.58 Research Institute,China Electronics Technology Corporation)
出处
《中国集成电路》
2023年第5期36-40,47,共6页
China lntegrated Circuit
关键词
过擦除
过擦除修复
软编程
优化修复流程
Over-erase
Over-erase repair
Soft programming
Optimized repair process
