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基于LabVIEW和PCI-2005的毫欧电阻测量

Milliohm Resistance Measurements Based on LabVIEW and PCI-2005
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摘要 随着电工测量技术的发展,越来越多的电气设备和精密仪器上会用到毫欧电阻,对于毫欧电阻参数的精准测量就越来越重要。普通的万用表难以满足毫欧电阻参数的精准测量,为了精准测量毫欧电阻参数,利用LabVIEW程序开发平台和PCI-2005信号采集卡设计了信号采集与处理系统。分析了PCI-2005信号采集卡的AD采样方法,运用AD采样技术,开发相应的LabVIEW应用程序,对毫欧电阻进行参数测量。其中,主要分析了毫欧电阻的测量原理和测量时产生的零点漂移现象,最终实现电阻值的测量,误差在2%以内。 With the development of electrical measurement technology,more and more electrical equipment and precision instruments will use milliohm resistors,and the accurate measurement of milliohm resistor parameters is becoming more and more important.Ordinary multimeter is difficult to meet the accurate measurement of milliohm resistor parameters,in order to accurately measure milliohm resistor parameters,the signal acquisition and processing system is designed by using the LabVIEW program development platform and PCI-2005 signal acquisition card.The AD sampling method of PCI-2005 signal acquisition card is analyzed,and the corresponding LabVIEW application is developed by using AD sampling technology to measure the parameters of milliohm resistor.Among them,the measurement principle of milliohm resistors and the zero drift phenomenon generated during measurement are mainly aralyzed,and finally the measurement of resistor value is realized,and the error is within 2%.
作者 张莹文 卫延波 陈菲 王佳 ZHANG Yingwen;WEI Yanbo;CHEN Fei;WANG Jia(Luoyang Normal University,College of Physical and Electronic Information,Luoyang 471934,China)
出处 《电子质量》 2024年第2期27-31,共5页 Electronics Quality
基金 洛阳师范学院2018年校级高等教育教改立项项目“开关电源原理与设计教学内容和课程体系的改革研究”(2018xjgj037)资助。
关键词 LABVIEW PCI-2005数据采集卡 毫欧电阻参数测量 LabVIEW PCI-2005 data acquisition card milliohms resistance measurement
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