摘要
阐述电子元器件可靠性保证的发展历程和背景、国内电子元器件现状。探讨元器件使用可靠性保证技术以及存在的问题,提出应对方法,包括筛选检测、破坏性物理分析、失效分析、应用验证、伪空包检查。分析元器件质量保证发展趋势。
This paper describes the development history and background of reliability assurance for electronic components,as well as the current situation of electronic components in China.It explores the reliability assurance technology and existing problems in the use of electronic components,proposes response methods,including screening and testing,destructive physical analysis,failure analysis,application verification,and pseudo empty package inspection.It analyzes the development trend of component quality assurance.
作者
刘龙超
LIU Longchao(Beijing Jinghanyu Electronic Engineering Technology Co.,Ltd.,Beijing 102200,China)
出处
《电子技术（上海）》
2024年第4期357-359,共3页
Electronic Technology
关键词
电子元器件
可靠性
质量验证
electronic devices
reliability
quality verification
