摘要
作为红外成像设备的核心部件,红外焦平面阵列(Infrared Focal Plane Array, IRFPA)探测器的性能直接影响设备的成像质量。无法避免的衍射效应会导致像元间存在串音现象,严重影响探测器的性能。提出了一种基于狭缝光学系统的串音测试方法。利用高精度狭缝光学测试设备获取狭缝范围内探测像元与其横向相邻像元的电平数据,同时实现对串音现象的定量评价。使用中波320×256碲镉汞(30μm)探测器、中波320×256碲镉汞(50μm)探测器和中波320×256锑化铟(30μm)探测器的测试数据验证所提出的串音测试方法。结果表明,所提出的方法可准确描述串音现象并定量分析串音现象对探测器性能的影响。与现有小光点测试方法相比,该方法更易聚焦,得到的串音量化结果更准确,提高了测试效率。
As the core component of infrared imaging equipment,the performance of the infrared focal plane array(IRFPA)detector directly affects the imaging quality of the equipment.The unavoidable diffraction effect can lead to crosstalk between pixels,seriously affecting the performance of the detector.A crosstalk testing method based on slit optical system is proposed,which uses high-precision slit optical testing equipment to obtain the level data of the detection pixels and their horizontally adjacent pixels within the slit range,and at the same time achieves quantitative evaluation of crosstalk phenomenon.This article uses test data from medium wave 320×256 mercury cadmium telluride(30μm)detector,medium wave 320×256 mercury cadmium telluride(50μm)detector,and medium wave 320×256 indium antimonide(30μm)detector to verify the proposed crosstalk testing method.The verification results demonstrate that the proposed method can accurately describe the crosstalk phenomenon and quantitatively analyze the impact of crosstalk on detector performance.Compared with existing small light point testing methods,the proposed method is easier to focus and obtains more accurate crosstalk quantification results,achieving an improvement in testing efficiency.
作者
刘璇
王亮
LIU Xuan;WANG Liang(North China Research Institute of Electro-Optics,Beijing 100015,China)
出处
《红外》
CAS
2024年第9期17-22,共6页
Infrared
关键词
红外焦平面
衍射
串音
狭缝
定量分析
infrared focal plane
diffraction
crosstalk
slit
quantitative analysis
