摘要
介绍了计算机断层扫描 (CT)成像的基本原理和设备基本组成 ,并用微焦点工业CT系统来分析钡钨阴极的内部微细结构 ,充分证明了微焦点工业CT系统在对钡钨阴极的分析中有着良好的应用。
By introducing the basic principles and the constitutes of computed tomography(CT),the inner fine structure of the barium tungsten cathode analyzed by the microfocus industrial CT are discussed.These results indicate the excellent application of the microfocus industrial CT in the barium tungsten cathode.
出处
《真空电子技术》
2002年第6期49-50,共2页
Vacuum Electronics
