摘要
提出了基于双谱分析的表面粗糙度特征分析方法。通过理论计算 ,对几种典型的机械加工表面轮廓试件的实验研究 ,认为双谱具有抑制高斯噪声和保留相位信息的能力 ,可以反映表面轮廓的偏斜度 ,特别是偏离高斯型的表面轮廓。对于符合高斯分布的轮廓其双谱近似于零 ,不符合高斯分布的轮廓其双谱不为零。
Based on bispectrum analysis, a new characterizing method of surface roughness is presented. By means of the theory computations and experiments on some representative machining specimen surfaces, the valuable results have been obtained that not only can bispectrum restrain Gaussian noise and reserve phase component, but also reflect the skewness of surface amplitude distribution, especially for non-Gaussian or non-symmetric surfaces. It should be pointed out that the bispectrum of surface profiles according with Gaussian distribution equals to zero, and vice versa.
出处
《宇航计测技术》
CSCD
2002年第6期8-13,共6页
Journal of Astronautic Metrology and Measurement
关键词
表面粗糙度
双谱分析
特征分析
Subject terms Roughness Bispectrum Spectrum analysis
