摘要
提出一种新的投影栅相位测量方法———两步相移法。该方法只需两幅相移条纹图 ,因此计算量小 ,速度快。给出了实验及计算结果 ,并同四步相移法进行了比较 ,证明了该方法具有较高的精度。
The phase measurement method by grating projection is an effective technique in 3-D shape measurement. A novel method two-step phase-shifting technique for phase measurement profilometry is proposed. In this method only two phase-shifted fringe patterns are necessary in order to extract the phase values, and the phase unwrapping procure is not needed. Hence, this method requires little computing time. The experimental results are given. A comparison, which demonstrates the high accuracy of the new method, is made between the proposed two-step and conventional four-step phase-shifting method.
出处
《光学学报》
EI
CAS
CSCD
北大核心
2003年第1期75-79,共5页
Acta Optica Sinica
基金
国家自然科学基金 (10 0 72 0 17)
非线性力学国家重点实验室开放课题资助课题
