摘要
在室温和液氮温度(77K)下用蒸镀法在Si(111)衬底上制备C60薄膜。用扫描电子显微镜(SEM)研究两种不同基底上制备薄膜的微观结构,并用椭圆偏振光谱仪测量了光学参数(包括吸收光谱、折射率及光频介电常数)。结果表明,衬底温度降低,薄膜更均匀,颗粒更细,光学吸收峰位置出现蓝移且在整个光频范围吸收增强。
C60 films were deposited on Si(111) substrates at the room temperature and 77K temperature. The microstructures of the films prepared on two different substrates were studied with the scanning electron microscope; and the optical parameters (including absorption spectrum,refractive index,and dielectric constant) of C60 films were measured with ellipsometer.The results show that with the decrease of the temperature of substrates the uniformity of the film becomes better, and the particles of the film turn smaller, at the optical absorption peaks of C60 film prepared on the 77K substrate presents blue shift, and the absorption increases in the range of overall optical frequencies.
出处
《应用光学》
CAS
CSCD
2003年第1期28-30,共3页
Journal of Applied Optics
基金
湖北省自然科学基金重点项目(2000J001)
