摘要
对系统可靠性串联、并联和n中取k可靠度区间的最小上界(LUB)和最大上界(GLB)进行了分 析,这里假设系统的寿命分布是负指数型,并就系统中不同部件数目下,针对各种情况进行了详细的研究。
In this paper, the least upper bounds (LUB) and greatest lower bounds (GLB) for the reliability of the several type systems are analyzed. It is assumed that the life - time distribution of each component is negative exponential. In each case the behaving of LUB and GLB is studied.
出处
《电子产品可靠性与环境试验》
2003年第1期43-45,共3页
Electronic Product Reliability and Environmental Testing
关键词
可靠性
指数分布
可靠度区间估计
寿命
reliability
exponential distribution
reliability bounds estimate
