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Effective passivation of black phosphorus transistor against ambient degradation by an ultra-thin tin oxide film 被引量:2

Effective passivation of black phosphorus transistor against ambient degradation by an ultra-thin tin oxide film
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摘要 Recently, two-dimensional (2D) layered semiconducting materials have been considered as promising channel materials to construct aggressively-scaled transistors owing to their excellent electrostatics and remained high carrier mobility even at atomic thickness (1,2)Among all of the emerging 2D semiconductors.
出处 《Science Bulletin》 SCIE EI CAS CSCD 2019年第9期570-574,共5页 科学通报(英文版)
基金 supported by the National Key Research & Development Program (2016YFA0201901) the National Natural Science Foundation of China (61621061, 61427901, 61274015 and 61888102)
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