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气孔缺陷位置对SMT焊点热疲劳寿命影响的数值分析 被引量:2

Numerical Analysis for Effect of Gas Hole Location on SMT Solder Joint Thermal Fatigue Life
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摘要 通过用统一的粘塑性本构方程描述 SMT焊点的力学行为 ,对气孔缺陷在 SMT焊点中不同位置的情况建立二维有限元分析模型 ,并采用有限元方法分析了气孔位置对 SMT焊点疲劳寿命的影响。分析发现 ,与无缺陷焊点相比 ,气孔使焊点中应力应变分布发生了改变 ,使焊点疲劳寿命缩短 ;焊角、焊趾和焊点中部位置的气孔对焊点中的应力应变和焊点的疲劳寿命影响较小 ,而焊点根部气孔的影响则显著。 The unified viscoplastic constitutive model has been used to describe the mechanical behavior of SMT solder joint in this paper, and two dimension finite element analysis models of solder joint with gas hole of different location have also been established. The effect of gas hole location on SMT solder joint fatigue life has been analyzed by finite element method . Compared to the solder joint without hole, it was found that the hole will change the stress/strain distribution of the solder joint around the hole and will shorten the fatigue life of the solder joint. The effects of the hole located at solder joint top, solder joint toe and the center of solder joint on solder joint fatigue life are very small, but the effect of solder joint root on solder joint fatigue life is the greatest.
出处 《中国机械工程》 EI CAS CSCD 北大核心 2003年第8期708-711,共4页 China Mechanical Engineering
基金 现代焊接生产技术国家重点实验室开放课题资助项目
关键词 气孔 SMT焊点 粘塑性 疲劳寿命 gas hole SMT solder joint viscoplastic fatigue life
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  • 1赵秀娟.微电子封装与组装互连软钎焊焊点形态优化设计,哈尔滨工业大学博士论文[M].,2000..

同被引文献19

  • 1王春青,梁旭文,王金铭,钱乙余.SMT焊点形态对热应力分布影响的有限元分析[J].电子工艺技术,1996,17(6):14-17. 被引量:9
  • 2Basaran C, Desaic S, Kundu T. Thermal mechanical finite element analysis of problems in electronic packaging using the disturbed state concept: Part Ⅰ -Ⅱ [ J]. ASME journal of electronic packaging, 1998,120 ( 2 ) :41 - 53.
  • 3Hong Borzen. Finite element modeling of thermal fatigue and damage of solder joints in a ceramic ball grid array package[J]. Journal of electronic materials, 1997,26 (7) :814 - 820.
  • 4Wang Chun qing. Mechanical strength analysis of SMT solder joints by finite element method [ J ]. Welding journal, 1997,76 (2) :67 - 69.
  • 5Bart Vandevelde, Eric Beyne. Solder parameter sensitivity for CSP life -time prediction using simulation- based optimization method [ C ]. Electronic components and technology conference, Florida, USA,2001:281 - 287.
  • 6Robert Darveaux. Effect of simulation methodology on solder joint crack growth correlation[ J ]. 2000 electronic components and technology conference, 1048 -1058.
  • 7Solomon H D. Fatigue of 60/40 solder [ J ]. IEEE trans components, hybrids, manufacturing technology, 1986,9 (4) :423 -432.
  • 8Kneeht S, Fox L. Integrated matrix creep:application to accelerated testing and lifetime prediction [ G ]//J H Lan. Solder joint reliability: Theory and applications. New York :van nostrand reinhold, 1991:508 - 544.
  • 9Solomon H D. Life prediction and accelerated testing [G]//D R Fear,S N Burchett, H S Morgan et al. The mechanics of solder alloy interconnects. New York:van nostrand reinhold, 1994 : 199 - 313.
  • 10Basaran C,Desai C S,Kundu T.Thermal mechanical finite element analysis of problems in electronic packaging using the disturbed state concept[J].ASEM Journal of Electronic Packaging,1998,120(2):41-53.

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