摘要
本文把扩展电阻法应用于陶瓷微区电导性能研究.建立了微区的定位标识系统,可精确、方便地对选定的微区进行电导性能及组分的重复测定.该方法在研究Ba(Sn_(1-x)Sb_x)O_3、ZnO及BaTiO_3半导体瓷应用中得到有意义的结果.
The principle and features of the spreading resistance method are described. This method has been successfully applied to the measurement of the microregion conductivity for the first time. An identification system for microregion location has been designed. The relationships between the microregion resistance and the constitution of semiconducting ceramics, including Ba(Sn1-xSbx)O3, ZnO and BaTiO3 have been investigated and meaningful results have been obtained. From the relations between microregion Ba/(Sn + Sb) and P, in the Ba (Sn1-xSbx)O3 system, it can be seen that SnO3 and BaSnO3 are of low-resistance phase while Ba3Sn2O3 is of high-resistance phase.
出处
《华中理工大学学报》
CSCD
北大核心
1992年第2期7-12,共6页
Journal of Huazhong University of Science and Technology
关键词
陶瓷
扩展电阻法
半导体
微区电导
ceramics
spreading resistance method
semiconductor
microre- gion electrical conduction
