摘要
应用现场椭圆偏振光谱技术并结合循环伏安法,研究了镍电极表面Ni(OH)2与NiOOH的相互转化,以均匀膜模型拟合实验数据获得表面膜厚度的变化规律,采用以光学参量变化速率(Vop)为参数的椭圆偏振光谱方法能直接反映出体系的特征.Vop参量与表面膜厚度的变化率间存在密切关系,Vop反映了电极表面表面膜厚度的变化率.
Electrochemical reactions of Ni(OH)_2/NiOOH system were studied by using in-situ spectroscopic ellipsometry and the conventional electrochemical methods. By fitting data from ellipsometric measurements with the model of constant growth rate of a uniform film, thickness of the surface film was obtained. A new ellipsometric function' Optical tracking rate', Vop, can directly describe characteristics of this system. Experimental results indicated that Vop reflected change rate of surface film thickness on the electrode.
出处
《西南师范大学学报（自然科学版）》
CAS
CSCD
北大核心
2003年第5期721-724,共4页
Journal of Southwest China Normal University(Natural Science Edition)
