摘要
开发了一种数字集成电路测试仪,该测试仪以C8051F410微控制器为核心,用户可针对不同待测芯片来选择+3.3V或+5V电源供电,操作界面与测试结果通过液晶显示屏进行人机交互,能够对常用的74系列数字集成电路芯片进行快速、稳定的功能性测试。
A testing instrument is developed for digital IC.Functional testing of the frequently-used 74 series digital ICs could be done quickly and steadily by this instrument,which is based on microcontroller C8051F410.User could choose +3.3V or +5V power supply for different IC.The operation interface and the test result is showed on LCD module.
出处
《电子测试》
2014年第3X期10-11,共2页
Electronic Test
