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Superperiodic Feature on Silicon-Sputtered Highly Oriented Pyrolytic Graphite 被引量:1

Superperiodic Feature on Silicon-Sputtered Highly Oriented Pyrolytic Graphite
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摘要 Superperiodic feature was observed by scanning tunneling microscopy (STM) on the surface of highly oriented pyrolytic graphite (HOPG) on which silicon was sputtered. The superlattice was analyzed by the moire pattern hypothesis, and the lattice constant is 7.03 nm. For the superlattice, the observed boundaries between the superlattice and the normal graphite areas were zigzag, which was in good agreement with the result predicted theoretically. In addition, the observed lattice constants varied slightly in the superperiodic feature area. This implies the role of intralayer strain in the formation of the observed superlattice on the graphite surface. Superperiodic feature was observed by scanning tunneling microscopy (STM) on the surface of highly oriented pyrolytic graphite (HOPG) on which silicon was sputtered. The superlattice was analyzed by the moire pattern hypothesis, and the lattice constant is 7.03 nm. For the superlattice, the observed boundaries between the superlattice and the normal graphite areas were zigzag, which was in good agreement with the result predicted theoretically. In addition, the observed lattice constants varied slightly in the superperiodic feature area. This implies the role of intralayer strain in the formation of the observed superlattice on the graphite surface.
出处 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2003年第3期246-248,共3页 材料科学技术(英文版)
基金 The authors thank the National Natural Science Foundation of China for support by two grants:No.50025204 and No.59895156.
关键词 Highly oriented graphite Scanning tunneling microscopy SUPERLATTICE SILICON Highly oriented graphite, Scanning tunneling microscopy, Superlattice, Silicon
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