摘要
文中介绍了半导体激光二极管(LD)寿命测试的理论依据,给出了寿命测试的数学模型,并据此设计了LD高温加速寿命自动测试系统。系统通过采集恒流工作LD的平均输出光功率随时间变化的信息,绘制LD的老化曲线,即恒流条件下的P-t曲线,或通过采集恒功工作LD的工作电流随时间变化的信息,即恒功条件下的I-t曲线,然后推断LD正常条件下的使用寿命。
The theory of Laser Diode life testing and mathematic model of life testing were introduced, and a high-temperature accelerating LDs automatic life testing system was developed from these. By sampling the power/current of LDs,which works under automatic current control (ACC)/ automatic power control (APC), power-time(P-t)/current-time(I-t) curve of LDs is ploted, and thus concludes the normal working life of LDs.
出处
《激光与红外》
CAS
CSCD
北大核心
2004年第2期124-127,共4页
Laser & Infrared
