摘要
计算了几种典型的接地方式下卫星介质构件中深层充电所致的最大电场及表面电位 ,并进行比较分析 .结果表明 ,在同样的辐射环境条件下 ,正面接地及两面同时接地时平板介质构件中最大电场比背面接地时低一个量级以上 ,因此前两种接地方式中介质相对较安全 ;单面接地时被充电介质与相邻金属部件或接地物体之间存在放电的可能 ,而两面同时接地时则不会发生 .
In this paper, the maximum electric field intensity and surface potential of a planar dielectric on satellite induced by deep dielectric charging (DDC) in typical grounding patterns are calculated and compared. It is shown that if the dielectric is grounded on the outer surface alone or on both outer and inner surfaces, the induced maximum electric field intensities are smaller than that grounded on the inner surface alone by one order or more; thus in the former two grounding patterns, the dielectric is more immune from DDC. On the other hand, if the dielectric is grounded on one single surface, it is possible to discharge between the dielectric and other metal parts or grounded objects near enough. As for grounding on both surfaces, the situation of discharge impossible.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2004年第5期1611-1616,共6页
Acta Physica Sinica
基金
国家高技术研究发展计划 (批准号 :863 2 7 7 1)资助的课题~~
