摘要
For the last several years, the linear array x-ray detector for x-ray imaging with gallium arsenide direct conversion sensitive elements has been developed and tested at the In-stitute for High Energy Physics. The array consists of 16 sensitive modules. Each module has 128 gallium arsenide (GaAs) sensitive elements with 200 μm pitch. Current article describes two key program procedures of initial dark current compensation of each sensitive element in the linear array, and sensitivity adjustment for alignment of strip pattern in the raw image data. As a part of evaluation process a modular transfer function (MTF) was measured with the slanted sharp-edge object under RQA5 technique as it described in the International Electrotechnical Commission 62220-1 standard (high voltage 70 kVp, additional aluminium filter 21 mm) for images with compensated dark currents and adjusted sensitivity of detector elements. The 10% level of the calculated MTF function has spatial resolution within 2 - 3 pair of lines per mm for both vertical and horizontal orientation.
For the last several years, the linear array x-ray detector for x-ray imaging with gallium arsenide direct conversion sensitive elements has been developed and tested at the In-stitute for High Energy Physics. The array consists of 16 sensitive modules. Each module has 128 gallium arsenide (GaAs) sensitive elements with 200 μm pitch. Current article describes two key program procedures of initial dark current compensation of each sensitive element in the linear array, and sensitivity adjustment for alignment of strip pattern in the raw image data. As a part of evaluation process a modular transfer function (MTF) was measured with the slanted sharp-edge object under RQA5 technique as it described in the International Electrotechnical Commission 62220-1 standard (high voltage 70 kVp, additional aluminium filter 21 mm) for images with compensated dark currents and adjusted sensitivity of detector elements. The 10% level of the calculated MTF function has spatial resolution within 2 - 3 pair of lines per mm for both vertical and horizontal orientation.
作者
Mikhail Polkovnikov
Mikhail Polkovnikov(Department of Experimental Physics, Institute for High Energy Physics (IHEP), National Research Center “Kurchatov Institute”, Protvino, Russia)
