期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
BSIM-CMG Compact Model for IC CAD: from FinFET to Gate-All-Around FET Technology 被引量:1
1
作者 avirup dasgupta Chenming Hu 《Journal of Microelectronic Manufacturing》 2020年第4期2-11,共10页
We discuss the BSIM-CMG compact model for SPICE simulations of any common multi-gate(CMG)device.This is an industry standard model which has been used extensively for FinFETs IC design and simulation,and has now been ... We discuss the BSIM-CMG compact model for SPICE simulations of any common multi-gate(CMG)device.This is an industry standard model which has been used extensively for FinFETs IC design and simulation,and has now been extended to accurately model gate-allaround FET(GAAFET).We present the core framework of BSIM-CMG and discuss the latest updates that capture various physical phenomena originating from the quantum confinement of electrons by the small cross section of the GAAFET channel.Special attention is paid to providing suitable model parameters that can be adjusted using software tools to match the model with manufactured transistors very accurately.Furthermore,the model’s speed allows the use of Monte Carlo circuit simulation to account for random device variations encountered in manufacturing.This model is the industry standard compact model for GAAFETs and will help bridge the wide divide between GAA IC manufacturing and design,starting at 3nm/2nm technologies. 展开更多
关键词 GATE-ALL-AROUND GAAFET FINFET BSIM BSIM-CMG Compact model Quantum NANOSHEET 3D TRANSISTOR
下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部