So far much effort has been made to understand the development of electrical treeing. For the simulation based study of electrical treeing, the most common method is to apply DBM stochastic model to simulate the growi...So far much effort has been made to understand the development of electrical treeing. For the simulation based study of electrical treeing, the most common method is to apply DBM stochastic model to simulate the growing of electrical treeing patterns. Previous simulation results showed that this stochastic model is capable of simulating the real electrical treeing patterns in a point-to-plane electrode system. However, this model only allows the tree channels to propagate on equipotential lines proportional to local electrical field. Therefore, it is necessary to develop a novel stochastic model to simulate the electrical patterns in order to get a good agreement with experimental results.展开更多
To investigate the nature of the Ψ（3770） resonance and to measure the cross section for e^＋e^-→DD, a cross-section scan data sample, distributed among 41 center-of-mass energy points from 3.73 to 3.89 GeV, was ta...To investigate the nature of the Ψ（3770） resonance and to measure the cross section for e^＋e^-→DD, a cross-section scan data sample, distributed among 41 center-of-mass energy points from 3.73 to 3.89 GeV, was taken with the BESIII detector operated at the BEPCII collider in the year 2010. By analyzing the large angle Bhabha scattering events, we measure the integrated luminosity of the data sample at each center-of-mass energy point. The total integrated luminosity of the data sample is 76.16±0.04±0.61 pb^-1, where the first uncertainty is statistical and the second systematic.展开更多
文摘So far much effort has been made to understand the development of electrical treeing. For the simulation based study of electrical treeing, the most common method is to apply DBM stochastic model to simulate the growing of electrical treeing patterns. Previous simulation results showed that this stochastic model is capable of simulating the real electrical treeing patterns in a point-to-plane electrode system. However, this model only allows the tree channels to propagate on equipotential lines proportional to local electrical field. Therefore, it is necessary to develop a novel stochastic model to simulate the electrical patterns in order to get a good agreement with experimental results.
基金Supported by National Key Basic Research Program of China(2015CB856700)National Natural Science Foundation of China(NSFC)(11235011,11335008,11425524,11625523,11635010)+13 种基金the Chinese Academy of Sciences(CAS)Large-Scale Scientific Facility Programthe CAS Center for Excellence in Particle Physics(CCEPP)Joint Large-Scale Scientific Facility Funds of the NSFCCAS(U1332201,U1532257,U1532258)CAS Key Research Program of Frontier Sciences(QYZDJ-SSW-SLH003,QYZDJ-SSW-SLH040)100 Talents Program of CASNational 1000 Talents Program of China,INPACShanghai Key Laboratory for Particle Physics and Cosmology,German Research Foundation DFG under Contracts Nos.Collaborative Research Center CRC 1044,FOR 2359Istituto Nazionale di Fisica Nucleare,Italy,Koninklijke Nederlandse Akademie van Wetenschappen(KNAW)(530-4CDP03)Ministry of Development of Turkey(DPT2006K-120470)National Science and Technology fundThe Swedish Research Council,U.S.Department of Energy(DEFG02-05ER41374,DE-SC-0010118,DE-SC-0010504,DE-SC-0012069)University of Groningen(RuG)and the Helmholtzzentrum fuer Schwerionenforschung GmbH(GSI)Darmstadt,WCU Program of National Research Foundation of Korea(R32-2008-000-10155-0)
文摘To investigate the nature of the Ψ（3770） resonance and to measure the cross section for e^＋e^-→DD, a cross-section scan data sample, distributed among 41 center-of-mass energy points from 3.73 to 3.89 GeV, was taken with the BESIII detector operated at the BEPCII collider in the year 2010. By analyzing the large angle Bhabha scattering events, we measure the integrated luminosity of the data sample at each center-of-mass energy point. The total integrated luminosity of the data sample is 76.16±0.04±0.61 pb^-1, where the first uncertainty is statistical and the second systematic.
