Control charts(CCs)are one of the main tools in Statistical Process Control that have been widely adopted in manufacturing sectors as an effective strategy for malfunction detection throughout the previous decades.Mea...Control charts(CCs)are one of the main tools in Statistical Process Control that have been widely adopted in manufacturing sectors as an effective strategy for malfunction detection throughout the previous decades.Measurement errors(M.E’s)are involved in the quality characteristic of interest,which can effect the CC’s performance.The authors explored the impact of a linearmodel with additive covariate M.E on the multivariate cumulative sum(CUSUM)CC for a specific kind of data known as compositional data(CoDa).The average run length(ARL)is used to assess the performance of the proposed chart.The results indicate that M.E’s significantly affects themultivariate CUSUM-CoDaCCs.The authors haveused theMarkov chainmethod to study the impact of different involved parameters using six different cases for the variance-covariance matrix(VCM)(i.e.,uncorrelated with equal variances,uncorrelated with unequal variances,positively correlated with equal variances,positively correlated with unequal variances,negatively correlatedwith equal variances and negatively correlated with unequal variances).The authors concluded that the error VCM has a negative impact on the performance of themultivariate CUSUM-CoDa CC,as the ARL increases with an increase in the value of the error VCM.The subgroup size m and powering operator b positively impact the proposed CC,as the ARL decreases with an increase in m or b.The number of variables p also has a negative impact on the performance of the proposed CC,as the values of ARL increase with an increase in p.For the implementation of the proposal,two illustrated examples have been reported formultivariate CUSUM-CoDaCCs inthe presence ofM.E’s.Onedealswith themanufacturingprocessof uncoated aspirin tablets,and the other is based on monitoring the machines involved in the muesli manufacturing process.展开更多
基金supported by the National Natural Science Foundation of China (Grant No.71802110)the Humanity and Social Science Foundation of theMinistry of Education of China (Grant No.19YJA630061).
文摘Control charts(CCs)are one of the main tools in Statistical Process Control that have been widely adopted in manufacturing sectors as an effective strategy for malfunction detection throughout the previous decades.Measurement errors(M.E’s)are involved in the quality characteristic of interest,which can effect the CC’s performance.The authors explored the impact of a linearmodel with additive covariate M.E on the multivariate cumulative sum(CUSUM)CC for a specific kind of data known as compositional data(CoDa).The average run length(ARL)is used to assess the performance of the proposed chart.The results indicate that M.E’s significantly affects themultivariate CUSUM-CoDaCCs.The authors haveused theMarkov chainmethod to study the impact of different involved parameters using six different cases for the variance-covariance matrix(VCM)(i.e.,uncorrelated with equal variances,uncorrelated with unequal variances,positively correlated with equal variances,positively correlated with unequal variances,negatively correlatedwith equal variances and negatively correlated with unequal variances).The authors concluded that the error VCM has a negative impact on the performance of themultivariate CUSUM-CoDa CC,as the ARL increases with an increase in the value of the error VCM.The subgroup size m and powering operator b positively impact the proposed CC,as the ARL decreases with an increase in m or b.The number of variables p also has a negative impact on the performance of the proposed CC,as the values of ARL increase with an increase in p.For the implementation of the proposal,two illustrated examples have been reported formultivariate CUSUM-CoDaCCs inthe presence ofM.E’s.Onedealswith themanufacturingprocessof uncoated aspirin tablets,and the other is based on monitoring the machines involved in the muesli manufacturing process.
