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Low-Loss Dielectric Material Characterization and High-Q Resonator Design from Microwave to Millimetre Waves Frequencies
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作者 Jean-Michel Le Floch Michael E. Tobar +8 位作者 georges Humbert David Mouneyrac Denis Ferachou Romain Bara Michel Aubourg john g. hartnett Dominique Cros Jean-Marc Blondy Jerzy Krupka 《Journal of Physical Science and Application》 2011年第1期15-28,共14页
Dielectric resonators are key components in many microwave and millimetre wave circuits and applications, including high-Q filters and frequency-determining elements for precision frequency synthesis. Multilayered and... Dielectric resonators are key components in many microwave and millimetre wave circuits and applications, including high-Q filters and frequency-determining elements for precision frequency synthesis. Multilayered and bulk low-loss single crystal and polycrystalline dielectric structures have become very important for designing these devices. Proper design requires careful electromagnetic characterisation of low-loss material properties. This includes exact simulation with precision numerical software and precise measurements of resonant modes. For example, we have developed the Whispering Gallery mode technique, which has now become the standard for characterizing low-loss structures. This paper will review some of the common characterisation techniques used in the microwave to millimetre wave frequency regime. 展开更多
关键词 Dielectric resonator Bragg mode whispering gaUery mode bulk and thin film characterization.
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