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975 nm multimode semiconductor lasers with high-order Bragg diffraction gratings
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作者 Zhenwu liu Li Zhong +1 位作者 suping liu Xiaoyu Ma 《Journal of Semiconductors》 EI CAS CSCD 2024年第3期38-44,共7页
The 975 nm multimode diode lasers with high-order surface Bragg diffraction gratings have been simulated and calcu-lated using the 2D finite difference time domain(FDTD)algorithm and the scattering matrix method(SMM).... The 975 nm multimode diode lasers with high-order surface Bragg diffraction gratings have been simulated and calcu-lated using the 2D finite difference time domain(FDTD)algorithm and the scattering matrix method(SMM).The periods and etch depth of the grating parameters have been optimized.A board area laser diode(BA-LD)with high-order diffraction grat-ings has been designed and fabricated.At output powers up to 10.5 W,the measured spectral width of full width at half maxi-mum(FWHM)is less than 0.5 nm.The results demonstrate that the designed high-order surface gratings can effectively nar-row the spectral width of multimode semiconductor lasers at high output power. 展开更多
关键词 laser diodes distributed Bragg reflector high order gratings high power laser diodes narrow spectrum width
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Study of quantum well mixing induced by impurity-free vacancy in the primary epitaxial wafers of a 915 nm semiconductor laser
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作者 Tianjiang He suping liu +5 位作者 Wei Li Li Zhong Xiaoyu Ma Cong Xiong Nan Lin Zhennuo Wang 《Journal of Semiconductors》 EI CAS CSCD 2023年第10期70-76,共7页
Output power and reliability are the most important characteristic parameters of semiconductor lasers.However,catas-trophic optical damage(COD),which usually occurs on the cavity surface,will seriously damage the furt... Output power and reliability are the most important characteristic parameters of semiconductor lasers.However,catas-trophic optical damage(COD),which usually occurs on the cavity surface,will seriously damage the further improvement of the output power and affect the reliability.To improve the anti-optical disaster ability of the cavity surface,a non-absorption window(NAW)is adopted for the 915 nm InGaAsP/GaAsP single-quantum well semiconductor laser using quantum well mix-ing(QWI)induced by impurity-free vacancy.Both the principle and the process of point defect diffusion are described in detail in this paper.We also studied the effects of annealing temperature,annealing time,and the thickness of SiO_(2) film on the quan-tum well mixing in a semiconductor laser with a primary epitaxial structure,which is distinct from the previous structures.We found that when compared with the complete epitaxial structure,the blue shift of the semiconductor laser with the primary epi-taxial structure is larger under the same conditions.To obtain the appropriate blue shift window,the primary epitaxial struc-ture can use a lower annealing temperature and shorter annealing time.In addition,the process is less expensive.We also pro-vide references for upcoming device fabrication. 展开更多
关键词 catastrophic optical damage primary epitaxial structure impurity-free vacancy disordering quantum well intermixing non-absorption window
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Research on quantum well intermixing of 680 nm AlGaInP/GaInP semiconductor lasers induced by composited Si-Si_(3)N_(4) dielectric layer 被引量:2
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作者 Tianjiang He suping liu +4 位作者 Wei Li Cong Xiong Nan Lin Li Zhong Xiaoyu Ma 《Journal of Semiconductors》 EI CAS CSCD 2022年第8期46-52,共7页
The optical catastrophic damage that usually occurs at the cavity surface of semiconductor lasers has become the main bottleneck affecting the improvement of laser output power and long-term reliability.To improve the... The optical catastrophic damage that usually occurs at the cavity surface of semiconductor lasers has become the main bottleneck affecting the improvement of laser output power and long-term reliability.To improve the output power of 680 nm AlGaInP/GaInP quantum well red semiconductor lasers,Si-Si_(3)N_(4)composited dielectric layers are used to induce its quantum wells to be intermixed at the cavity surface to make a non-absorption window.Si with a thickness of 100 nm and Si_(3)N_(4)with a thickness of 100 nm were grown on the surface of the epitaxial wafer by magnetron sputtering and PECVD as diffusion source and driving source,respectively.Compared with traditional Si impurity induced quantum well intermixing,this paper realizes the blue shift of 54.8 nm in the nonabsorbent window region at a lower annealing temperature of 600 ℃ and annealing time of 10 min.Under this annealing condition,the wavelength of the gain luminescence region basically does not shift to short wavelength,and the surface morphology of the whole epitaxial wafer remains fine after annealing.The application of this process condition can reduce the difficulty of production and save cost,which provides an effective method for upcoming fabrication. 展开更多
关键词 high power semiconductor laser rapid thermal annealing composited dielectric layer quantum well intermixing optical catastrophic damage nonabsorbent window
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Analysis of the time domain characteristics of tapered semiconductor lasers 被引量:1
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作者 Desheng Zeng Li Zhong +1 位作者 suping liu Xiaoyu Ma 《Journal of Semiconductors》 EI CAS CSCD 2020年第3期49-53,共5页
We use traveling wave coupling theory to investigate the time domain characteristics of tapered semiconductor lasers with DBR gratings.We analyze the influence of the length of second order gratings on the power and s... We use traveling wave coupling theory to investigate the time domain characteristics of tapered semiconductor lasers with DBR gratings.We analyze the influence of the length of second order gratings on the power and spectrum of output light,and optimizing the length of gratings,in order to reduce the mode competition effect in the device,and obtain the high power output light wave with good longitudinal mode characteristics. 展开更多
关键词 tapered semiconductor lasers time domain characteristics DBR gratings mode competition
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Researching the 915 nm high-power and high-brightness semiconductor laser single chip coupling module 被引量:3
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作者 Xin Wang Cuiluan Wang +4 位作者 Xia Wu Lingni Zhu Hongqi Jing Xiaoyu Ma suping liu 《Journal of Semiconductors》 EI CAS CSCD 2017年第2期69-72,共4页
Based on the high-speed development of the fiber laser in recent years, the development of researching 915 nm semiconductor laser as main pumping sources of the fiber laser is at a high speed. Because the beam quality... Based on the high-speed development of the fiber laser in recent years, the development of researching 915 nm semiconductor laser as main pumping sources of the fiber laser is at a high speed. Because the beam quality of the laser diode is very poor, the 915 nm laser diode is generally based on optical fiber coupling module to output the laser. Using the beam-shaping and fiber-coupling technology to improve the quality of output beam light, we present a kind of high-power and high-brightness semiconductor laser module, which can output 13.22 W through the optical fiber. Based on 915 nm GaAs semiconductor laser diode which has output power of 13.91 W, we describe a thoroughly detailed procedure for reshaping the beam output from the semiconductor laser diode and coupling the beam into the optical fiber of which the core diameter is 105 μm and the numerical aperture is 0.18. We get 13.22 W from the output fiber of the module at 14.5 A, the coupling efficiency of the whole module is 95.03% and the brightness is 1.5 MW/cm^2 -str. The output power of the single chip semiconductor laser module achieves the advanced level in the domestic use. 展开更多
关键词 半导体激光器 光纤耦合 从模块 高亮度 半导体激光二极管 大功率 光纤激光器 单片
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1.06 μm high-power InGaAs/GaAsP quantum well lasers 被引量:2
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作者 Haili Wang Li Zhong +2 位作者 Jida Hou suping liu Xiaoyu Ma 《Journal of Semiconductors》 EI CAS CSCD 2017年第11期66-70,共5页
The high power and low internal loss 1.06 μm InGaAs/GaAsP quantum well lasers with asymmetric waveguide structure were designed and fabricated. For a 4000 μm cavity length and 100 μm stripe width device,the maximum... The high power and low internal loss 1.06 μm InGaAs/GaAsP quantum well lasers with asymmetric waveguide structure were designed and fabricated. For a 4000 μm cavity length and 100 μm stripe width device,the maximum output power and conversion efficiency of the device are 7.13 W and 56.4%, respectively. The cavity length dependence of the threshold current density and conversion efficiency have been investigated theoretically and experimentally; the laser diode with 4000 μm cavity length shows better characteristics than that with 3000 and 4500 μm cavity length: the threshold current density is 132.5 A/cm^2, the slope efficiency of 1.00 W/A and the junction temperature of 15.62 K were achieved. 展开更多
关键词 量子阱激光器 高功率 阈值电流密度 最大输出功率 转换效率 激光二极管 波导结构 砷化铟镓
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中国南亚热带土壤易分解有机碳和水稳性团聚体对造林的响应 被引量:2
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作者 Yuanqi Chen Yu Zhang +4 位作者 Shiqin Yu Feng Li suping liu Lixia Zhou Shenglei Fu 《Journal of Plant Ecology》 SCIE CSCD 2021年第2期191-201,共11页
造林被认为可以提高土壤碳稳定性并促进土壤碳累积。然而,实验结果差异很大,造林在提高土壤碳稳定性方面的作用仍存在争议。因此,在森林生态系统中不同土壤碳库对造林如何响应目前尚不清楚。基于此,本文对亚热带地区的尾叶桉林(Eucalypt... 造林被认为可以提高土壤碳稳定性并促进土壤碳累积。然而,实验结果差异很大,造林在提高土壤碳稳定性方面的作用仍存在争议。因此,在森林生态系统中不同土壤碳库对造林如何响应目前尚不清楚。基于此,本文对亚热带地区的尾叶桉林(Eucalyptus urophylla)、厚荚相思林(Acacia crassicarpa)、红锥林(Castanopsis hystrix)、10树种混交林和自然恢复草坡等5种不同林型的土壤碳组分进行了研究,评估其不同土层(0–10、10–20、20–40和40–60 cm)中的土壤易分解有机碳(容易被高锰酸钾氧化的有机碳ROC和土壤可溶性有机碳DOC)及土壤团聚体相关的碳对造林的响应。实验结果表明,造林(与自然恢复草坡比较)和林型并没有显著影响土壤ROC浓度,而自然恢复草坡土壤的DOC浓度在4个土层中均最高。0–10 cm土层中各径级的土壤团聚体其碳(C)浓度均是红锥林最高。此外,在任一土层中,林型对不同径级土壤水稳性团聚体比例的影响均不显著。但是土壤深度显著改变土壤团聚体的分布,0–20 cm土层主要为>0.25 mm粒径的团聚体,20–60 cm土层则是0.053–2 mm粒径的团聚体占主导。这些结果显示造林和林型影响土壤DOC和团聚体C,而且它们相比于ROC对造林的响应更为敏感。研究发现,与自然恢复相比,人工林降低了土壤DOC浓度,暗示它可能会减少土壤C的淋溶损失。此外,红锥林能够通过物理保护提高表土层中土壤碳的稳定性。本研究为关注土壤碳汇功能时的中国南亚热带地区造林树种选择提供了有价值的信息。 展开更多
关键词 造林 碳稳定性 林型 土壤团聚体 碳组分
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Thermal investigation of high-power GaAs-based laser diodes
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作者 Jichuan liu Cuiluan Wang +1 位作者 suping liu Xiaoyu Ma 《Journal of Semiconductors》 EI CAS CSCD 2017年第5期59-61,共3页
The thermal characteristics of high-power AlGaAs/GaAs laser diodes(LDs) at high current(2-10 A)are studied with electrical transient method.The temperature rise increases linearly with the current.The thermal resistan... The thermal characteristics of high-power AlGaAs/GaAs laser diodes(LDs) at high current(2-10 A)are studied with electrical transient method.The temperature rise increases linearly with the current.The thermal resistance of chip is the largest proportion of total thermal resistance.By increasing the width of the chip from 500 to 800 fim,the temperature rise and thermal resistance decrease by 8.5%and 8.8%,respectively. 展开更多
关键词 laser diodes high power temperature rise thermal resistance electrical transient method
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