The surface treatments on CdSe wafers were studied by means of SEM,XPS and micro-current test instrument.The relations between electrical properties of CdSe wafers and surface topography,composition and structure were...The surface treatments on CdSe wafers were studied by means of SEM,XPS and micro-current test instrument.The relations between electrical properties of CdSe wafers and surface topography,composition and structure were analyzed.The results show that the change of surface composition by etching is beneficial to decrease leakage current.Meanwhile,the increase of oxygen on surface caused by passivation can largely decrease leakage current.When passivating time is 40 min,the wafers surface appears smooth and compact,which will decrease the density of surface state,the optimal electrical property of the wafer is therefore obtained.展开更多
目的评价60μg乙型肝炎疫苗(Hepatitis B vaccine,HepB)快速免疫程序在≥16岁健康易感人群中的免疫原性和安全性。方法采用单中心、随机、开放、平行对照的非劣效临床试验,在云南省某县招募≥16岁健康受试者,按1∶1随机分配至试验组和...目的评价60μg乙型肝炎疫苗(Hepatitis B vaccine,HepB)快速免疫程序在≥16岁健康易感人群中的免疫原性和安全性。方法采用单中心、随机、开放、平行对照的非劣效临床试验,在云南省某县招募≥16岁健康受试者,按1∶1随机分配至试验组和对照组,试验组按照0、2月免疫程序接种2剂次60μg HepB,对照组按照0、1、6月免疫程序接种3剂次20μg HepB,检测受试者免疫前和全程免疫后30d血清乙肝表面抗体(Hepatitis B surface antibody,HBsAb),观察每剂次免疫后30d内不良事件,比较两组HBsAb阳转率和几何平均浓度(Geometric mean concentration,GMC)以及不良事件发生率。结果试验组、对照组受试者HepB全程免疫后HBsAb阳转率分别为93.09%(95%CI:90.36%-95.83%)、97.94%(95%CI:96.42%-99.46%),率差为-4.85%(95%CI:-7.96%~-1.73%),率差的95%CI下限>-10%;GMC(mIU/mL)分别为425.48(95%CI:346.74-524.81)、790.32(95%CI:645.65-954.99);不良事件总发生率分别为20.66%(95%CI:17.82%-25.50%)、18.44%(95%CI:16.21%-20.67%),且征集性不良反应均为1级和2级不良反应。结论60μg HepB快速免疫程序在≥16岁健康易感人群中的HBsAb阳转率非劣效于20μg HepB常规免疫程序,不良事件发生率与常规免疫程序相当,具有良好的免疫原性和安全性。展开更多
基金Project supported by the 863 High-Tech Program of China(2002AA325030)
文摘The surface treatments on CdSe wafers were studied by means of SEM,XPS and micro-current test instrument.The relations between electrical properties of CdSe wafers and surface topography,composition and structure were analyzed.The results show that the change of surface composition by etching is beneficial to decrease leakage current.Meanwhile,the increase of oxygen on surface caused by passivation can largely decrease leakage current.When passivating time is 40 min,the wafers surface appears smooth and compact,which will decrease the density of surface state,the optimal electrical property of the wafer is therefore obtained.
文摘目的评价60μg乙型肝炎疫苗(Hepatitis B vaccine,HepB)快速免疫程序在≥16岁健康易感人群中的免疫原性和安全性。方法采用单中心、随机、开放、平行对照的非劣效临床试验,在云南省某县招募≥16岁健康受试者,按1∶1随机分配至试验组和对照组,试验组按照0、2月免疫程序接种2剂次60μg HepB,对照组按照0、1、6月免疫程序接种3剂次20μg HepB,检测受试者免疫前和全程免疫后30d血清乙肝表面抗体(Hepatitis B surface antibody,HBsAb),观察每剂次免疫后30d内不良事件,比较两组HBsAb阳转率和几何平均浓度(Geometric mean concentration,GMC)以及不良事件发生率。结果试验组、对照组受试者HepB全程免疫后HBsAb阳转率分别为93.09%(95%CI:90.36%-95.83%)、97.94%(95%CI:96.42%-99.46%),率差为-4.85%(95%CI:-7.96%~-1.73%),率差的95%CI下限>-10%;GMC(mIU/mL)分别为425.48(95%CI:346.74-524.81)、790.32(95%CI:645.65-954.99);不良事件总发生率分别为20.66%(95%CI:17.82%-25.50%)、18.44%(95%CI:16.21%-20.67%),且征集性不良反应均为1级和2级不良反应。结论60μg HepB快速免疫程序在≥16岁健康易感人群中的HBsAb阳转率非劣效于20μg HepB常规免疫程序,不良事件发生率与常规免疫程序相当,具有良好的免疫原性和安全性。
