In order to accurately measure an object’s three-dimensional surface shape,the influence of sampling on it was studied.First,on the basis of deriving spectra expressions through the Fourier transform,the generation o...In order to accurately measure an object’s three-dimensional surface shape,the influence of sampling on it was studied.First,on the basis of deriving spectra expressions through the Fourier transform,the generation of CCD pixels was analyzed,and its expression was given.Then,based on the discrete expression of deformation fringes obtained after sampling,its Fourier spectrum expression was derived,resulting in an infinitely repeated"spectra island"in the frequency domain.Finally,on the basis of using a low-pass filter to remove high-order harmonic components and retaining only one fundamental frequency component,the inverse Fourier transform was used to reconstruct the signal strength.A method of reducing the sampling interval,i.e.,reducing the number of sampling points per fringe,was proposed to increase the ratio between the sampling frequency and the fundamental frequency of the grating.This was done to reconstruct the object’s surface shape more accurately under the condition of m>4.The basic principle was verified through simulation and experiment.In the simulation,the sampling intervals were 8 pixels,4 pixels,2 pixels,and 1 pixel,the maximum absolute error values obtained in the last three situations were 88.80%,38.38%,and 31.50%in the first situation,respectively,and the corresponding average absolute error values are 71.84%,43.27%,and 32.26%.It is demonstrated that the smaller the sampling interval,the better the recovery effect.Taking the same four sampling intervals in the experiment as in the simulation can also lead to the same conclusions.The simulated and experimental results show that reducing the sampling interval can improve the accuracy of object surface shape measurement and achieve better reconstruction results.展开更多
In Fourier transform profilometry （FTP）, we must restrain spectrum overlapping caused by the nonlinearity of the charge coupled device （CCD） and increase the measurement accuracy of the object shape. Firstly, the ...In Fourier transform profilometry （FTP）, we must restrain spectrum overlapping caused by the nonlinearity of the charge coupled device （CCD） and increase the measurement accuracy of the object shape. Firstly, the causes of producing higher-order spectrum components and inducing spectrum overlapping are analysed theoretically, and a simple physical ex- planation and analytical deduction are given. Secondly, aiming to suppress spectrum overlapping and improve measurement accuracy, the influence of spatial carrier frequency of projection grating on them is analysed. A method of increasing the spatial carrier frequency of projection grating to restrain or reduce the spectrum overlapping significantly is proposed. We then analyze the mechanism of how the spectrum overlapping is reduced. Finally, the simulation results and experimental measurements verify the correction of the proposed theory and method.展开更多
文摘In order to accurately measure an object’s three-dimensional surface shape,the influence of sampling on it was studied.First,on the basis of deriving spectra expressions through the Fourier transform,the generation of CCD pixels was analyzed,and its expression was given.Then,based on the discrete expression of deformation fringes obtained after sampling,its Fourier spectrum expression was derived,resulting in an infinitely repeated"spectra island"in the frequency domain.Finally,on the basis of using a low-pass filter to remove high-order harmonic components and retaining only one fundamental frequency component,the inverse Fourier transform was used to reconstruct the signal strength.A method of reducing the sampling interval,i.e.,reducing the number of sampling points per fringe,was proposed to increase the ratio between the sampling frequency and the fundamental frequency of the grating.This was done to reconstruct the object’s surface shape more accurately under the condition of m>4.The basic principle was verified through simulation and experiment.In the simulation,the sampling intervals were 8 pixels,4 pixels,2 pixels,and 1 pixel,the maximum absolute error values obtained in the last three situations were 88.80%,38.38%,and 31.50%in the first situation,respectively,and the corresponding average absolute error values are 71.84%,43.27%,and 32.26%.It is demonstrated that the smaller the sampling interval,the better the recovery effect.Taking the same four sampling intervals in the experiment as in the simulation can also lead to the same conclusions.The simulated and experimental results show that reducing the sampling interval can improve the accuracy of object surface shape measurement and achieve better reconstruction results.
基金Project supported by the National Natural Science Foundation of China (Grant Nos. 61173122, 60970098, 60803024, 90715043, and 61144006)the Postdoctoral Startup Foundation of Central South University, China (Grant No. 1332/74341016030)
文摘In Fourier transform profilometry （FTP）, we must restrain spectrum overlapping caused by the nonlinearity of the charge coupled device （CCD） and increase the measurement accuracy of the object shape. Firstly, the causes of producing higher-order spectrum components and inducing spectrum overlapping are analysed theoretically, and a simple physical ex- planation and analytical deduction are given. Secondly, aiming to suppress spectrum overlapping and improve measurement accuracy, the influence of spatial carrier frequency of projection grating on them is analysed. A method of increasing the spatial carrier frequency of projection grating to restrain or reduce the spectrum overlapping significantly is proposed. We then analyze the mechanism of how the spectrum overlapping is reduced. Finally, the simulation results and experimental measurements verify the correction of the proposed theory and method.
