Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Si...Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been provided.In this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA.The proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is minimized.All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA.Experimental results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method.展开更多
单粒子软错误是高辐照空间环境下影响计算可靠性的主要因素.随着芯片晶体管数的快速增长,单粒子软错误的威胁日益严重.结果错误(silent data corruption,SDC)是单粒子软错误造成的一种故障类型.由于SDC是隐蔽传播的,SDC的检测是单粒子...单粒子软错误是高辐照空间环境下影响计算可靠性的主要因素.随着芯片晶体管数的快速增长,单粒子软错误的威胁日益严重.结果错误(silent data corruption,SDC)是单粒子软错误造成的一种故障类型.由于SDC是隐蔽传播的,SDC的检测是单粒子软错误防护的难点.寻找SDC脆弱指令是目前检测SDC的重要途径.现有方法需要进行巨量的错误注入,时间代价巨大.首先根据数据关联图建立了指令的数据依赖关系,研究了函数间和函数内部错误传播过程;进而推导出判定SDC脆弱指令的充分条件,提出了SDC脆弱指令识别方法,该方法在错误注入中依据充分条件推测潜在的SDC脆弱指令.实验表明,在保证较高准确率和覆盖率的前提下,时间代价显著减少.展开更多
文摘Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system electronics.However,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been provided.In this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in FPGA.The proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is minimized.All of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host FPGA.Experimental results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method.
文摘单粒子软错误是高辐照空间环境下影响计算可靠性的主要因素.随着芯片晶体管数的快速增长,单粒子软错误的威胁日益严重.结果错误(silent data corruption,SDC)是单粒子软错误造成的一种故障类型.由于SDC是隐蔽传播的,SDC的检测是单粒子软错误防护的难点.寻找SDC脆弱指令是目前检测SDC的重要途径.现有方法需要进行巨量的错误注入,时间代价巨大.首先根据数据关联图建立了指令的数据依赖关系,研究了函数间和函数内部错误传播过程;进而推导出判定SDC脆弱指令的充分条件,提出了SDC脆弱指令识别方法,该方法在错误注入中依据充分条件推测潜在的SDC脆弱指令.实验表明,在保证较高准确率和覆盖率的前提下,时间代价显著减少.
