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A low temperature processed Si-quantum-dot poly-Si TFT nonvolatile memory device
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作者 孙玮 《Journal of Semiconductors》 EI CAS CSCD 2013年第6期77-80,共4页
This paper reports on a successful demonstration of poly-Si TFT nonvolatile memory with a much reduced thermal-budget.The TFT uses uniform Si quantum-dots(size -10 nm and density -10-(11) cm-(-2)) as storage med... This paper reports on a successful demonstration of poly-Si TFT nonvolatile memory with a much reduced thermal-budget.The TFT uses uniform Si quantum-dots(size -10 nm and density -10-(11) cm-(-2)) as storage media,obtained via LPCVD by flashing SiH4/H2 at 580℃for 15 s on a Si3N4 surface.The poly-Si grain-enlargement step was shifted after source/drain formation.The NiSix-silicided source/drain enables a fast lateral-recrystallization,and thus grain-enlargement can be accomplished by a much reduced thermal-cycle(i.e., 550℃/4 h).The excellent memory characteristics suggest that the proposed poly-Si TFT Si quantum-dot memory and associated processes are promising for use in wider TFT applications,such as system-on-glass. 展开更多
关键词 poly-silicon TFT nonvolatile memory low-thermal-budget metal-induced lateral crystallization siquantum-dots
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