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Sub-external cavity effect and elimination method in laser self-mixing interference wave plate measurement system 被引量:1
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作者 牛海莎 牛燕雄 宋建军 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第2期349-354,共6页
Laser self-mixing interference(SMI) wave plate measurement method is a burgeoning technique for its simplicity and efficiency. But for the non-coated sample, the reflected light from the surface can seriously affect... Laser self-mixing interference(SMI) wave plate measurement method is a burgeoning technique for its simplicity and efficiency. But for the non-coated sample, the reflected light from the surface can seriously affect the measurement results.To analyze the reason theoretically, a self-consistent model for laser operation with a sub-external and an external cavity is established, and the sub-external cavity formed by the sample and a cavity mirror is proved to be the main error source.A synchronous tuning method is proposed to eliminate the sub-external cavity effect. Experiments are carried out on the synchronously tuning double external cavities self-mixing interference system, and the error of the system is in the range of -0.435°~0.387° compared with the ellipsometer. The research plays an important role in improving the performance and enlarging the application range of the laser self-mixing interference system. 展开更多
关键词 self-mixing interference non-coated wave plate measurement self-consistent model
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COMPACT PHASE GRATING INTERFERENCE SENSOR FOR MICRO-DISPLACEMENT 被引量:2
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作者 XIAO Gang XIE Tiebang WANG Xuanze 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2006年第1期131-133,共3页
On the basis of existing techniques, a compact micro-displacement sensor of phase grating interference (PGI) is described, which adopts cylindrical hologram diffraction grating as the calibration standard. The optic... On the basis of existing techniques, a compact micro-displacement sensor of phase grating interference (PGI) is described, which adopts cylindrical hologram diffraction grating as the calibration standard. The optical principle of the sensor is explained, and the relation between the grating motion displacement and the phase shift of interference stripes is deduced. The improvement of the integral structure and the method of photoelectric signal processing are described in detail. With the software system based on the virtual instrument development platform Labwindows/CVI and other hardwares such as the precision displacement worktable, the surfaces of typical parts are measured and the characterization results are given. The sensor has wide measuring range and high resolution, its sensitivity and resolution being independent of the wavelength of the incident light. The vertical measuring range is 0-6 mm, and the vertical resolution is 0.005μm. The experimental results show that the sensor can be used to measure and characterize the surface topography parameters of the plane and curved surface. 展开更多
关键词 Sensor Surface topography Phase grating interference(PGI)Micro-displacement measurement
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Research on EMI Noise Measurement Technology Based on Wavelet Analysis
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作者 Xu Li Long Zaiyun 《Journal of Electronic Research and Application》 2018年第1期1-6,共6页
Aiming at the problem that it is difficult to measure the electromagnetic radiation produced by the equipment at present,this paper presents a method for measuring the noise of electromagnetic interference(EMI)based o... Aiming at the problem that it is difficult to measure the electromagnetic radiation produced by the equipment at present,this paper presents a method for measuring the noise of electromagnetic interference(EMI)based on wavelet analysis.The technique uses time frequency localization features of the wavelet transform,based on threshold function filtering method to filter the test signal,which makes it possible in open space or noisy environment for measurement of electromagnetic interference of equipment.Simulation and experimental results show that the technique is able to eliminate or attenuate the noise in the frequency band of 30Hz^1000MHz. 展开更多
关键词 ELECTROMAGNETIC interference(EMI)measurement WAVELET analysis frequency DIVISION filter THRESHOLD function
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Simultaneous refractive index and temperature measurements by using dual interference in an all-fiber Mach–Zehnder interferometer
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作者 闫旭 傅海威 +1 位作者 李辉栋 乔学光 《Chinese Optics Letters》 SCIE EI CAS CSCD 2016年第3期23-27,共5页
A Fourier analysis applied to the Mach-Zehnder interferometer (MZI) transmission spectrum for simultaneous refractive index (RI) and temperature measurements is proposed and experimentally demonstrated in this Let... A Fourier analysis applied to the Mach-Zehnder interferometer (MZI) transmission spectrum for simultaneous refractive index (RI) and temperature measurements is proposed and experimentally demonstrated in this Letter. In the fast Fourier transform (FFT) spectrum of the MZI transmission spectrum, several frequency components are generally observed, which means that the transmission spectrum of the MZI is formed by the superposition of some dual-mode interference (DMI) spectra, and each frequency component represents different core-cladding interferences. We can select some dominant frequency components in the FFT spectrum of the MZI transmission spectrum to take the inverse FFT (IFFT). Then, the corresponding DMI patterns can be obtained. Due to the shift of the wavelength of these DMI spectra with changes in the environmental parameters, we can use the coefficient matrix of these DMI spectra for multi-parameter sensing. In this Letter, two DMI patterns are separated from the resultant transmission spectrum of the MZI. As the RI and temperature change, the shifts of the two DMI patterns with respect to the RI and temperature will be observed. The sensitivities of the RI and temperature are -137.1806 nm/RIU (RI unit) and 0.0860 nm/℃, and -22.9955 nm/RIU and 0.0610 nm/℃ for the two DMIs. Accordingly, it can be used to simultaneously measure RI and temperature changes. The approach can eliminate the influence of multiple interferences and improve the accuracy of the sensor. 展开更多
关键词 RIU MZI DMI Simultaneous refractive index and temperature measurements by using dual interference in an all-fiber Mach Zehnder interferometer
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RESEARCH ON INPUT IMPEDANCE OF DIPOLE ANTENNA IN GTEM CELL
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作者 Xing Shuguang Lv Xiaode Ding Chibiao 《Journal of Electronics(China)》 2014年第6期603-608,共6页
The formula of input impedance of dipole antenna in Gigahertz Transverse ElectroM agnetic(GTEM) cell based on the dyadic Green's function is first obtained in this paper. The validation of the formula is verified ... The formula of input impedance of dipole antenna in Gigahertz Transverse ElectroM agnetic(GTEM) cell based on the dyadic Green's function is first obtained in this paper. The validation of the formula is verified by the results of theoretical derivation and simulation with well agreements. In comparison with the formula of input impedance in free space, the relationship between the change of input impedance with the length of antenna and the position of antenna in GTEM cell is obtained. In addition, some meaningful conclusions are presented, which not only can be referred by the further research of ElectroM agnetic Interference(EMI) measurements in GTEM cell, but also provide the theoretical basis for testing compensation and error analysis. 展开更多
关键词 Electro Magnetic interference(EMI) measurement Gigahertz Transverse ElectroM agnetic(GTEM) cell Dipole antenna Input impedance Dyadic Green’s function
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