The simulation software, HFSS （high frequency structure simulator）, is introduced in microwave oven design. In the cold test, a network analyzer is used to measure the reflection coefficient （S11） of the cavity un...The simulation software, HFSS （high frequency structure simulator）, is introduced in microwave oven design. In the cold test, a network analyzer is used to measure the reflection coefficient （S11） of the cavity under empty and loaded states over the frequency range from 2.448 GHz to 2.468 GHz. In the hot test, a piece of wet thermal paper and an infrared thermal imaging camera are used to measure the electric field distributions on the mica and turntable. In the cold test, the simulation agrees well with the experiment no matter in empty state or loaded state. In the hot test, the simulation agrees well with the experiment in general in empty state and approximately in loaded state. The little difference in both cold and hot test may be due to that the model in simulation is not absolutely identical with that in experiment or the inadequate precision of infrared thermal imaging camera.展开更多
基金supported by the National Natural Science Foundation of China under Grant No.10775029Vacuum Electronics National Laboratory Foundation under Grant No. NKLC001-063Postdoctoral Foundation under Grant No.20070411149
文摘The simulation software, HFSS （high frequency structure simulator）, is introduced in microwave oven design. In the cold test, a network analyzer is used to measure the reflection coefficient （S11） of the cavity under empty and loaded states over the frequency range from 2.448 GHz to 2.468 GHz. In the hot test, a piece of wet thermal paper and an infrared thermal imaging camera are used to measure the electric field distributions on the mica and turntable. In the cold test, the simulation agrees well with the experiment no matter in empty state or loaded state. In the hot test, the simulation agrees well with the experiment in general in empty state and approximately in loaded state. The little difference in both cold and hot test may be due to that the model in simulation is not absolutely identical with that in experiment or the inadequate precision of infrared thermal imaging camera.
