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STUDY ON THE CHEMICAL CONSTITUENTS OF BIDENS BIPINNATA A NEW POLYACETYLENE GLYCOSIDE 被引量:1
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《Chinese Chemical Letters》 SCIE CAS CSCD 1992年第4期287-288,共2页
A new naturally occurring compound 1-polyacetylene glycoside has been isolated form the n- butanol soluble fraction of the leaves of Bidens bipinnata. The chemical structure of 1 was shown to be 3E, 11E—Diethenylene ... A new naturally occurring compound 1-polyacetylene glycoside has been isolated form the n- butanol soluble fraction of the leaves of Bidens bipinnata. The chemical structure of 1 was shown to be 3E, 11E—Diethenylene 5. 7. 9—triacetylene, 1, 13—tridecanglycol-2-O-β-D-glycoside named bipinnatpolyacetyloside according to spectral analyses of UV. IR. FDMS, ~1H-NMR, ~H-~H COSY, ^(13)C-NMR and DEPT. 展开更多
关键词 OH STUDY ON THE CHEMICAL CONSTITUENTS OF BIDENS BIPINNATA A new POLYACETYLENE GLYCOSIDE ppm DEPT MHz
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A NEW CHEMICAL OSCILLATOR INDUCED BY SURFACTANT WITH GLUCOSE AS THE SUBSTRATE
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作者 Zhan Bo HE Zhi HUANG Tiren GU (Institute of Physical Chemistry and Department of Chemistry,Peking University,Beijing 100871) 《Chinese Chemical Letters》 SCIE CAS CSCD 1991年第2期177-178,共2页
A new Belousov-Zhabotinsky oscillator induced by Triton X-100 (a nonionic surfactant)with glucose as the organic substrate and Ce^(4+)as the catalyst has been reported in this paper.
关键词 AS A new CHEMICAL OSCILLATOR INDUCED BY SURFACTANT WITH GLUCOSE AS THE SUBSTRATE
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High Quality SiGe Layer Deposited by a New Ultrahigh Vacuum Chemical Vapor Deposition System
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作者 Guangli LUO, Xiaofeng LIN, Peiyi CHEN and Peixin TSIAN (Institute of Microelectronics, Tsinghua University, Beijing 100084, China 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2000年第1期94-96,共3页
An ultrahigh vacuum chemical vapor deposition (UHV/CVD) system is developed and the details of its construction and operation are reported. Using high purity SiH4 and GeH4 reactant gases, the Si0.82Ge0.18 layer is dep... An ultrahigh vacuum chemical vapor deposition (UHV/CVD) system is developed and the details of its construction and operation are reported. Using high purity SiH4 and GeH4 reactant gases, the Si0.82Ge0.18 layer is deposited at 550℃. With the measurements by double crystal X-ray diffraction (DCXRD), transmission electron microscopy (TEM) and Rutherford backscattering spectroscppy (RBS) techniques, it is shown that the crystalline quality of the SiGe layer is good, and the underlying SiGe/Si heterointerface is sharply defined. 展开更多
关键词 SIGE high High Quality SiGe Layer Deposited by a new Ultrahigh Vacuum Chemical Vapor Deposition System
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