O437 98063653三聚噻吩衍生物的三阶非线性光学系数研究=Third—order microscopic nonlinearities of α—terthiophene and its derivatives[刊,中]/孙岳明,丁志峰,刘举正(东南大学化学化工系.江苏,南京(210018))//东南大学学报.—199...O437 98063653三聚噻吩衍生物的三阶非线性光学系数研究=Third—order microscopic nonlinearities of α—terthiophene and its derivatives[刊,中]/孙岳明,丁志峰,刘举正(东南大学化学化工系.江苏,南京(210018))//东南大学学报.—1997,27(4).—122—展开更多
There are prominent nonlinear characteristics that we hope for the semiconductor nano-clusters doped fiber. Refractive index of fiber core can be effectively changed by adulteration. This technology can provide a new ...There are prominent nonlinear characteristics that we hope for the semiconductor nano-clusters doped fiber. Refractive index of fiber core can be effectively changed by adulteration. This technology can provide a new method for developing photons components. Because the semiconductor nano-cluster has quantum characteristics, Based on first-order perturba- tion theory and classical theory of fiber, we deduced refractive index expressions of fiber core, which was semiconductor nano-cluster doped fiber. Finally, third-order nonlinear coefficient equation was gained. Using this equation, we calculated SMF-28 fiber nonlinear coefficient. The equation shows that new third-order coefficient was greater.展开更多
The buckling design of micro-films has various potential applications to engineering.The substrate prestrain,interconnector buckling amplitude and critical strain are important parameters for the buckling design.In th...The buckling design of micro-films has various potential applications to engineering.The substrate prestrain,interconnector buckling amplitude and critical strain are important parameters for the buckling design.In the presented analysis,the buckled film shape was described approximately by a trigonometric function and the buckled film amplitude was obtained by minimizing the total strain energy.However,this method only generates the first-order approximate solution for the nonlinear buckling.In the present paper,an asymptotic analysis based on the rigorous nonlinear differential equation for the buckled micro-film deformations is proposed to obtain more accurate relationship of the buckling amplitude and critical strain to prestrain.The obtained results reveal the nonlinear relation and are significant to accurate buckling design of micro-films.展开更多
文摘O437 98063653三聚噻吩衍生物的三阶非线性光学系数研究=Third—order microscopic nonlinearities of α—terthiophene and its derivatives[刊,中]/孙岳明,丁志峰,刘举正(东南大学化学化工系.江苏,南京(210018))//东南大学学报.—1997,27(4).—122—
基金the National Natural Science Foundation* This workis supported by the National Natural Science Foundationof China (Grant No 60544002 and 60477032)
文摘There are prominent nonlinear characteristics that we hope for the semiconductor nano-clusters doped fiber. Refractive index of fiber core can be effectively changed by adulteration. This technology can provide a new method for developing photons components. Because the semiconductor nano-cluster has quantum characteristics, Based on first-order perturba- tion theory and classical theory of fiber, we deduced refractive index expressions of fiber core, which was semiconductor nano-cluster doped fiber. Finally, third-order nonlinear coefficient equation was gained. Using this equation, we calculated SMF-28 fiber nonlinear coefficient. The equation shows that new third-order coefficient was greater.
基金supported by the National Natural Science Foundation of China (Grant Nos. 11002077 and 11072215)
文摘The buckling design of micro-films has various potential applications to engineering.The substrate prestrain,interconnector buckling amplitude and critical strain are important parameters for the buckling design.In the presented analysis,the buckled film shape was described approximately by a trigonometric function and the buckled film amplitude was obtained by minimizing the total strain energy.However,this method only generates the first-order approximate solution for the nonlinear buckling.In the present paper,an asymptotic analysis based on the rigorous nonlinear differential equation for the buckled micro-film deformations is proposed to obtain more accurate relationship of the buckling amplitude and critical strain to prestrain.The obtained results reveal the nonlinear relation and are significant to accurate buckling design of micro-films.
