Power consumption in test mode is much higher than that in normal mode,which is prone to causing circuit damage and reducing the yield of chips.To reduce the power dissipation efficiently,a modified linear feedback sh...Power consumption in test mode is much higher than that in normal mode,which is prone to causing circuit damage and reducing the yield of chips.To reduce the power dissipation efficiently,a modified linear feedback shift register(LFSR)is designed to decrease switching activity dramatically during the generation of address sequences for memory built-in self-test(MBIST).The address models are generated by a blend of two address generators with an optimized address partition and two distinct controlled clock signals.An address generator circuit for MBIST of 64 k×32 static random access memory(SRAM)is designed to illustrate the proposed scheme.Experimental results show that when the address bus size is 16 bits,compared with the traditional LFSR,the proposed LFSR can reduce the switching activity and dynamic power by 71.1%and 68.2%,respectively,with low area overhead.展开更多
基金Foundation items:Fundamental Research Funds for the Central Universities(No.JUSRP51510)Primary Research&Development Plan of Jiangsu Province(No.BE2019003-2)。
文摘Power consumption in test mode is much higher than that in normal mode,which is prone to causing circuit damage and reducing the yield of chips.To reduce the power dissipation efficiently,a modified linear feedback shift register(LFSR)is designed to decrease switching activity dramatically during the generation of address sequences for memory built-in self-test(MBIST).The address models are generated by a blend of two address generators with an optimized address partition and two distinct controlled clock signals.An address generator circuit for MBIST of 64 k×32 static random access memory(SRAM)is designed to illustrate the proposed scheme.Experimental results show that when the address bus size is 16 bits,compared with the traditional LFSR,the proposed LFSR can reduce the switching activity and dynamic power by 71.1%and 68.2%,respectively,with low area overhead.
