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Measurement of Refractive Index Ranging from 1.42847 to 2.48272 at 1064 nm Using a Quasi-Common-Path Laser Feedback System 被引量:1
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作者 徐玲 谈宜东 +1 位作者 张书练 孙利群 《Chinese Physics Letters》 SCIE CAS CSCD 2015年第9期21-24,共4页
Wavelength 1064 nm is one of the most widely used laser wavelengths in industries and science. The high-precision measurement of the refractive index of optical materials at 1064 nm is significant for improving the op... Wavelength 1064 nm is one of the most widely used laser wavelengths in industries and science. The high-precision measurement of the refractive index of optical materials at 1064 nm is significant for improving the optical design. We study the direct measurement of refractive index at 1064nm of lasers, including cMcium fluoride (CaF2), fused silica and zinc selenide (ZnSe), whose refractive indices cover a large range from 1.42847 to 2.48272. The measurement system is built based on the quasi-common-path Nd:YAG laser feedback interferometry. The thickness can be measured simultaneously with the refractive index. The results demonstrate that the system has absolute uncertainties of ~10-5 and ~10-4 mm in refractive index and thickness measurement, respectively. 展开更多
关键词 In Measurement of Refractive Index Ranging from 1.42847 to 2.48272 at 1064 nm Using a Quasi-Common-Path Laser Feedback System AOM
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