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Accelerated Degradation Reliability Modeling and Test Data Statistical Analysis of Aerospace Electrical Connector 被引量:22
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作者 CHEN Wenhua LIU Juan +2 位作者 GAO Liang PAN Jun ZHOU Shengjun 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2011年第6期957-962,共6页
As few or no failures occur during accelerated life test,it is difficult to assess reliability for long-life products with traditional life tests.Reliability assessment using degradation data of product performance ov... As few or no failures occur during accelerated life test,it is difficult to assess reliability for long-life products with traditional life tests.Reliability assessment using degradation data of product performance over time becomes a significant approach.Aerospace electrical connector is researched in this paper.Through the analysis of failure mechanism,the performance degradation law is obtained and the statistical model for degradation failure is set up; according to the research on statistical analysis methods for degradation data,accelerated life test theory and method for aerospace electrical connector based on performance degradation is proposed by improving time series analysis method,and the storage reliability is assessed for Y11X series of aerospace electrical connector with degradation data from accelerated degradation test.The result obtained is basically consistent with that obtained from accelerated life test based on failure data,and the two estimates of product's characteristic life only have a difference of 8.7%,but the test time shortens about a half.As a result,a systemic approach is proposed for reliability assessment of highly reliable and long-life aerospace product. 展开更多
关键词 electrical connector performance degradation RELIABILITY accelerated degradation test
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Step-stress Accelerated Degradation Test Modeling and Statistical Analysis Methods 被引量:14
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作者 CHEN Wenhua LIU Juan +2 位作者 GAO Liang PAN Jun LU Xianbiao 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2013年第6期1154-1159,共6页
In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period, accelerated degradation test data with a large amount of reliability information of prod... In order to get a rapid assessment on the storage reliability of high-reliable and long-life products within the storage period, accelerated degradation test data with a large amount of reliability information of product is adopted. Conducting a constant-stress accelerated degradation test(CSADT) is generally very costly as it requires a large sample size and long time for test. To overcome this problem, it is necessary to carry out research on modeling and statistical analysis methods of step-stress accelerated degradation test (SSADT). Taking electrical connectors as the object, a research is conducted on statistical model and assessment method for SSADT. On the basis of mixed-effect degradation path model, the statistical model of SSADT for electrical connectors is presented, the maximum likelihood method for SSADT data based on mixed-effect degradation model is proposed. SSADT accelerated by temperature stress is conducted to Y11X-1419 type of electrical connectors, and the storage reliability is assessed with the SSADT data. Compared with the result obtained from accelerated life test, the reliability estimation of 32-year storage period for electrical connectors obtained from S SADT data only have a difference of 0.869%, which validates the accuracy of the degradation model and the feasibility of the test data statistic analysis method put forward. 展开更多
关键词 electrical connector performance degradation RELIABILITY accelerated degradation test
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Bayesian optimal design of step stress accelerated degradation testing 被引量:2
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作者 Xiaoyang Li Mohammad Rezvanizaniani +2 位作者 Zhengzheng Ge Mohamed Abuali Jay Lee 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2015年第3期502-513,共12页
This study presents a Bayesian methodology for de- signing step stress accelerated degradation testing (SSADT) and its application to batteries. First, the simulation-based Bayesian de- sign framework for SSADT is p... This study presents a Bayesian methodology for de- signing step stress accelerated degradation testing (SSADT) and its application to batteries. First, the simulation-based Bayesian de- sign framework for SSADT is presented. Then, by considering his- torical data, specific optimal objectives oriented Kullback-Leibler (KL) divergence is established. A numerical example is discussed to illustrate the design approach. It is assumed that the degrada- tion model (or process) follows a drift Brownian motion; the accele- ration model follows Arrhenius equation; and the corresponding parameters follow normal and Gamma prior distributions. Using the Markov Chain Monte Carlo (MCMC) method and WinBUGS software, the comparison shows that KL divergence is better than quadratic loss for optimal criteria. Further, the effect of simulation outiiers on the optimization plan is analyzed and the preferred sur- face fitting algorithm is chosen. At the end of the paper, a NASA lithium-ion battery dataset is used as historical information and the KL divergence oriented Bayesian design is compared with maxi- mum likelihood theory oriented locally optimal design. The results show that the proposed method can provide a much better testing plan for this engineering application. 展开更多
关键词 accelerated testing Bayesian theory KL divergence degradation optimal design battery.
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Priori information analysis of optocoupler accelerated degradation experiment based on failure mechanism verification test 被引量:2
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作者 Xuan-gong Zhang Xi-hui Mu +1 位作者 Jing Feng Hui-zhi Li 《Defence Technology(防务技术)》 SCIE EI CAS CSCD 2020年第2期392-400,共9页
The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions.It is necessary to use accelerated storage test to verify the storage life of long storage products.Especially for small... The optocoupler is a weak link in the inertial navigation platform of a kind of guided munitions.It is necessary to use accelerated storage test to verify the storage life of long storage products.Especially for small sample products,it is very important to obtain prior information for the design and implementation of accelerated degradation test.In this paper,the optocoupler failure mechanism verification test is designed and the experimental results are analyzed and the prior information is obtained.The results show that optocouplers have two failure modes,one is sudden failure and the other is degradation failure;the maximum temperature stress of optocoupler can’t exceed 140℃;the increase of leakage current of optocoupler is caused by movable ions contaminating the LED chip.The surface leakage current is proportional to the adsorption amount.The increase of leakage current makes p-n junction tunneling effect occur which LEDs the failure of the optocoupler.The lifetime distribution model of the optocoupler is determined by the failure physics.The lifetime of the optocoupler is subject to the lognormal distribution.The degeneracy orbit of the optocoupler leakage current is described by a power law model.The estimated values of the orbital parameters are initially calculated and the parameters of its life distribution function are deduced.The above information lays a good foundation for the optimization design and data processing of the accelerated degradation experiment. 展开更多
关键词 Priori information FAILURE MECHANISM FAILURE MECHANISM VERIFICATION test accelerated degradation
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Multiple Objective Test Design for Accelerated Destructive Degradation Tests
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作者 黄硕 杨军 +1 位作者 彭锐 赵宇 《Journal of Donghua University(English Edition)》 EI CAS 2015年第6期954-956,共3页
Accelerated destructive degradation tests(ADDTs)are powerful to provide reliability information in the degradation processes with destructive measurements.In order to carry out an ADDT efficiently,both the estimation ... Accelerated destructive degradation tests(ADDTs)are powerful to provide reliability information in the degradation processes with destructive measurements.In order to carry out an ADDT efficiently,both the estimation precision of parameters and the test cost should be considered.On the basis of the given degradation model and failure criterion,a multiple-objective optimization model for the design of ADDTs is proposed.Under constrains of the maximum measurement time,the total sample size and the number of stress levels,a comprehensive target function is suggested to reflect both the precision of lifetime estimation and total cost,and the optimal test plan is obtained,which is composed by optimal choices for samples size,measurement frequency,and the number of measurements at each stress level.A real example is illustrated to demonstrate the implementation of the proposed approach. 展开更多
关键词 accelerated destructive degradation tests(ADDTs) highly reliable products multiple objectives test cost asymptotic variance
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An Optimal Design of Accelerated Degradation Tests Based on Degradation Performance
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作者 Yunshun Wu 《Open Journal of Statistics》 2019年第6期686-694,共9页
This paper mainly talks about the relationship between an optimal design of accelerated degradation tests and the degradation performance. When there is a linear relationship between the parameter of distribution and ... This paper mainly talks about the relationship between an optimal design of accelerated degradation tests and the degradation performance. When there is a linear relationship between the parameter of distribution and the critical values, a special pattern of accelerated degradation tests is presented by taking the critical values as accelerated variable. And the optimal test plan is obtained by minimizing the asymptotic variance of the MLE of the parameter of distribution. Finally, a numerical example is presented to illustrate the procedures of the test plan. 展开更多
关键词 accelerated degradation test CRITICAL VALUES ASYMPTOTIC Variance OPTIMAL Design
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Constant-Stress Accelerated Degradation Life Test of an Organic Light-Emitting Diode Display under Violet Light
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作者 François-Xavier Fortier Sylvain G. Cloutier 《Engineering(科研)》 2016年第2期45-51,共7页
The lifetime of commercial OLED display devices increases, so does the need for an accelerated lifetime testing method. The present work proposes a simple and accurate blackbox testing approach for commercial PMOLED d... The lifetime of commercial OLED display devices increases, so does the need for an accelerated lifetime testing method. The present work proposes a simple and accurate blackbox testing approach for commercial PMOLED display lifetime assessment using violet light-induced accelerated aging. Maximum likelihood estimations using lognormal distributions are performed based on datasets acquired from samples exposed to six different degrees of violet irradiance and accelerated life model is shown to accurately fit experimental data using an inverse power law. Based on these results, weighted average of the logarithmic standard deviation, the average life and median life can then be obtained for specific conditions of operation of the devices. As this method relies exclusively on violet light-induced degradation at room-temperature, this minimally-invasive testing procedure requires no significant modification to the display hardware architecture. 展开更多
关键词 PMOLED DISPLAYS tests and Measurements LIFETIME Light-Induced Aging accelerated degradation testing
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Residual lifetime prediction model of nonlinear accelerated degradation data with measurement error 被引量:12
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作者 Zhongyi Cai Yunxiang Chen +1 位作者 Qiang Zhang Huachun Xiang 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2017年第5期1028-1038,共11页
For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is ... For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is built. An analytical approximation to the probability density function (PDF) of the product's lifetime is derived in a closed form. The process and data of SSADT are analyzed to obtain the relation model of the observed data under each accelerated stress. The likelihood function for the population-based observed data is constructed. The population-based model parameters and its random coefficient prior values are estimated. According to the newly observed data of the target product in SSADT, an analytical approximation to the PDF of its residual lifetime (RL) is derived in accordance with its individual degradation characteristics. The parameter updating method based on Bayesian inference is applied to obtain the posterior value of random coefficient of the RL model. A numerical example by simulation is analyzed to verify the accuracy and advantage of the proposed model. 展开更多
关键词 accelerated degradation test residual lifetime (RL) prediction measurement error random effect NONLINEARITY
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Consistency check of degradation mechanism between natural storage and enhancement test for missile servo system 被引量:3
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作者 Wang Xu Sun Quan 《Journal of Systems Engineering and Electronics》 SCIE EI CSCD 2019年第2期415-424,共10页
Reliability enhancement testing(RET) is an accelerated testing which hastens the performance degradation process to surface its inherent defects of design and manufacture. It is an important hypothesis that the degrad... Reliability enhancement testing(RET) is an accelerated testing which hastens the performance degradation process to surface its inherent defects of design and manufacture. It is an important hypothesis that the degradation mechanism of the RET is the same as the one of the normal stress condition. In order to check the consistency of two mechanisms, we conduct two enhancement tests with a missile servo system as an object of the study, and preprocess two sets of test data to establish the accelerated degradation models regarding the temperature change rate that is assumed to be the main applied stress of the servo system during the natural storage. Based on the accelerated degradation models and natural storage profile of the servo system, we provide and demonstrate a procedure to check the consistency of two mechanisms by checking the correlation and difference of two sets of degradation data. The results indicate that the two degradation mechanisms are significantly consistent with each other. 展开更多
关键词 reliability ENHANCEMENT testing (RET) degradation model accelerated equation CONSISTENCY CHECK Pearson correlation coefficient
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Strength Degradation of Wood Members Based on the Correlation of Natural and Accelerated Decay Experiments 被引量:2
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作者 Xueliang Wang Qiangang Xu +3 位作者 Xiuxin Wang Junhui Guo Wancheng Cao Chun Xiao 《Journal of Renewable Materials》 SCIE EI 2020年第5期565-577,共13页
An accelerated decay test and a natural decay test were conducted synchronically to explore the strength degradation of decaying wood members under long-term exposure to natural environment.A natural decay test was ca... An accelerated decay test and a natural decay test were conducted synchronically to explore the strength degradation of decaying wood members under long-term exposure to natural environment.A natural decay test was carried out to measure the bending strength,compressive strength parallel to grain and modulus of elasticity of the wood members,with 6 groups of specimens decayed in natural environment for 3 to 18 months respectively.To compare with corresponding decay test,in which 6 other groups of specimens were measured under accelerated conditions.The experimental data collected were evaluated by Pearson productmoment for the correlation.The results indicate that the mechanical properties of the accelerated decay were highly correlated with those in natural environment,both of which decreased in the same trend.Under the given test conditions,the mean value of the accelerated decay test data were curve-fitted to achieve the time-dependent degradation model of the bending strength,the compressive strength parallel to grain,as well as the modulus of elasticity.Due to the high correlation,the acceleration shift factors(ASF)of the two tests were derived,where the bending strength of 2.934,the compressive strength parallel to grain of 2.519 and the elastic modulus of 2.346 were employed to formulate the strength degradation models in the long-term natural environment.The results verify that the exponential functionσ=σ0e^(-βt)enables to exactly capture the degradation of the mechanical properties of wood members decayed in natural environment. 展开更多
关键词 Wood member accelerated decay test natural decay test correlation analysis degradation model
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基于加速退化试验的漏电信号调理电路性能退化及可靠性研究 被引量:2
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作者 牛峰 张博恒 +3 位作者 李贵衡 戴逸华 项石虎 李奎 《电机与控制学报》 EI CSCD 北大核心 2024年第1期61-68,共8页
在电子电路服役过程中,元器件退化会引起电路输出特性变化,降低电子电路的可靠性。漏电信号调理电路作为一种电子电路,其可靠性直接决定了漏电断路器的可靠性。以漏电信号调理电路为研究对象,首先基于灵敏度分析方法确定影响电路性能退... 在电子电路服役过程中,元器件退化会引起电路输出特性变化,降低电子电路的可靠性。漏电信号调理电路作为一种电子电路,其可靠性直接决定了漏电断路器的可靠性。以漏电信号调理电路为研究对象,首先基于灵敏度分析方法确定影响电路性能退化的关键元器件,并对漏电信号调理电路进行了以温度为加速应力、动作电流值为退化特征量的恒定应力加速退化试验;其次根据不同温度应力下的试验数据建立基于Wiener过程的漏电信号调理电路性能退化模型,并利用极大似然估计法求取退化模型的未知参数,进而得出寿命预测的概率密度函数和可靠度函数;最后利用阿伦尼斯(Arrhenius)方程外推出正常应力下漏电信号调理电路的预测寿命。相关结论可为不同电子电路的寿命预测及可靠度分析提供支撑。 展开更多
关键词 加速退化试验 性能退化 退化建模 寿命预测 WIENER过程 电子电路
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基于温度循环加速退化试验的光纤连接器寿命评估
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作者 张楠 冯业为 +2 位作者 李鹏 张泽明 张雯 《环境技术》 2024年第2期146-153,共8页
针对光纤连接器在温度交替变化下寿命评估难的问题,提出一种基于修正Coffin-Manson模型的寿命评估方法。首先,分析了光纤连接器失效模式、机理。接着,开展光纤连接器多个加速应力水平下的温度循环加速退化试验,基于插入损耗加速退化数... 针对光纤连接器在温度交替变化下寿命评估难的问题,提出一种基于修正Coffin-Manson模型的寿命评估方法。首先,分析了光纤连接器失效模式、机理。接着,开展光纤连接器多个加速应力水平下的温度循环加速退化试验,基于插入损耗加速退化数据建立幂函数退化轨迹模型。然后,结合插入损耗的失效阈值,通过假设检验推导不同加速应力水平下光纤连接器的伪失效寿命。最后,引入修正Coffin-Manson加速模型,进而外推空间环境下光纤连接器寿命。本方法评估的某光纤连接器在实际应力水平下的寿命与实际寿命比较接近,验证了修正Coffin-Manson模型方法对光纤连接器寿命评估的有效性和可行性。 展开更多
关键词 光纤连接器 寿命 修正Coffin-Manson模型 温度循环试验 加速退化试验
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复合材料复杂环境效应加速试验设计及评估方法
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作者 赵朋飞 李昊 +2 位作者 刘艳 王增凯 张生鹏 《装备环境工程》 CAS 2024年第7期36-44,共9页
目的指导复合材料在复杂湿热环境下环境适应性摸底与评价试验的开展,分析评估复合材料在复杂综合应力下的激活能参数。方法分析装备全寿命周期复杂自然环境剖面及各环境因素影响效应,确定复合材料各工作阶段敏感应力类型及条件,基于应... 目的指导复合材料在复杂湿热环境下环境适应性摸底与评价试验的开展,分析评估复合材料在复杂综合应力下的激活能参数。方法分析装备全寿命周期复杂自然环境剖面及各环境因素影响效应,确定复合材料各工作阶段敏感应力类型及条件,基于应力加速模型及累积损伤等原理,制定复合材料复杂环境效应综合加速试验剖面。构建复合材料复杂环境条件下的动力学模型,并提出相应参数估计方法。开展复合材料加速试验,并基于实测数据开展复合材料性能退化建模与评估。结果分析了复合材料全寿命周期环境影响因素及环境效应,明确了各工作阶段敏感应力主要有温度、湿度、太阳辐照、温度交变、振动以及冲击等。依据实际环境数据,设计并开展了3组不同湿热条件(80℃/75%RH、80℃/85%RH、80℃/95%RH)的综合试验,收集得到复合材料拉伸强度、拉剪强度、径向弯曲强度以及纬向弯曲强度等4种性能指标的试验数据。试验数据表明,拉剪强度(最大相对退化速率为0.1773/循环)、径向弯曲强度(最大相对退化速率为0.1292/循环)以及纬向弯曲强度(最大相对退化速率为0.2610/循环)等性能参数可用于产品退化建模与评估。通过参数估计,进一步确定了退化速率与湿热应力的关系,并针对当前试验提供了改进依据。结论复杂环境效应综合加速试验对装备复合材料产品经历复杂环境条件的模拟效果和加速效果较好,试验可实施性较强。提出的改进广义Eyring模型可涵盖温度应力与湿热应力的加速效应,并综合考虑多种应力的相互作用,通过少量组合试验便可量化评估激活能等参数。所建模型指出当前基于激活能参考值(Ea=0.7eV)试验方案可由不同温度应力的综合试验数据进一步修正与优化,且所提试验与分析方法主要针对大部分树脂基复合材料产品,并可依据需要推广至电子产品、机电产品等试验对象。 展开更多
关键词 复合材料 复杂环境效应 试验设计 加速试验 湿热应力 性能退化
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基于性能退化的铝电解电容寿命预测方法研究
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作者 王振 肖凯 +1 位作者 张乔木 邹延生 《电子器件》 CAS 2024年第5期1247-1254,共8页
应用表明铝电解电容是电源系统中故障率最高的元件,是影响电源系统长期运行可靠性的关键器件。为了评估铝电解电容在长期应用条件下的可靠性与寿命,对铝电解电容退化机理与退化模型进行研究分析,在已有模型研究成果的基础上,结合铝电解... 应用表明铝电解电容是电源系统中故障率最高的元件,是影响电源系统长期运行可靠性的关键器件。为了评估铝电解电容在长期应用条件下的可靠性与寿命,对铝电解电容退化机理与退化模型进行研究分析,在已有模型研究成果的基础上,结合铝电解电容加速退化试验数据,提出了一种基于幂函数的电容量退化轨迹模型。采用该退化轨迹模型,开展了基于退化量分布的铝电解电容退化数据统计分析与寿命预测。根据寿命预测结果,某型铝电解电容在正常工作条件下95%可靠寿命超过18年。 展开更多
关键词 铝电解电容 寿命预测 退化量分布 加速退化试验 可靠性评估
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可靠性加速试验技术研究
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作者 袁凯 刘杰 +3 位作者 胡靖涵 聂常华 张林 肖宁聪 《自动化仪表》 CAS 2024年第5期19-24,共6页
为了更好地理解和运用可靠性加速试验技术,通过文献调研的方式,对加速寿命试验(ALT)、加速退化试验(ADT)、加速可靠性增长试验(ARGT)、高加速寿命试验(HALT)以及高加速应力筛选(HASS)等可靠性加速试验技术进行了研究。阐述了不同类型的... 为了更好地理解和运用可靠性加速试验技术,通过文献调研的方式,对加速寿命试验(ALT)、加速退化试验(ADT)、加速可靠性增长试验(ARGT)、高加速寿命试验(HALT)以及高加速应力筛选(HASS)等可靠性加速试验技术进行了研究。阐述了不同类型的可靠性加速试验技术在产品全生命周期内的适用阶段及其应用特点,并将可靠性加速试验与传统可靠性模拟试验技术进行了对比。对比结果表明,可靠性加速试验技术已经发展为产品寿命与可靠性评估的新途径,为高可靠性、小子样、长寿命、零失效产品的可靠性评估提供了有效方法,解决了传统可靠性模拟试验技术难以暴露产品设计缺陷和薄弱环节的问题。指出可靠性加速试验技术的应用前景以及未来方向。该研究有利于加强对可靠性加速试验技术的深入理解,以及推进该技术的长久发展。 展开更多
关键词 可靠性试验 全生命周期 加速寿命试验 加速退化试验 加速可靠性增长试验 高加速寿命试验 高加速应力筛选
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蛭石增强垫片加速寿命试验的最高温度应力水平确定研究 被引量:1
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作者 张翠霞 姚炳洋 +2 位作者 胡康 邵春雷 聂政威 《化工机械》 CAS 2024年第2期193-200,259,共9页
研究高可靠性垫片的寿命通常采用加速寿命试验,而加速寿命试验要求失效机理一致,因此合理地选择垫片最高应力水平尤为重要。以蛭石增强垫片为研究对象,进行温度加速退化试验,建立了垫片的幂律退化模型,基于Arrehenius方程和激活能原理... 研究高可靠性垫片的寿命通常采用加速寿命试验,而加速寿命试验要求失效机理一致,因此合理地选择垫片最高应力水平尤为重要。以蛭石增强垫片为研究对象,进行温度加速退化试验,建立了垫片的幂律退化模型,基于Arrehenius方程和激活能原理得到了失效机理转变的温度区间;在给定失效阈值前提下,对伪寿命数据服从Weibull分布进行假设检验,确定了垫片最高温度应力水平为1123 K。对退化过的垫片进行压缩回弹试验,结果表明,当退化温度高于1123 K时,垫片的压缩回弹性能明显下降,进一步说明最高温度应力水平为1123 K的合理性。 展开更多
关键词 密封垫片 加速退化试验 烧失量 失效机理 压缩回弹性能 最高温度应力水平
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微波电子产品贮存状态的SSADT评估方法 被引量:12
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作者 李晓阳 姜同敏 +1 位作者 黄涛 李庚雨 《北京航空航天大学学报》 EI CAS CSCD 北大核心 2008年第10期1135-1138,共4页
针对在贮存期内具有长寿命、高可靠性特点的系统级微波电子产品,为了快速评估其贮存寿命与可靠性指标,提出了使用步进应力加速退化试验(SSADT,Step Stress Ac-celerated Degradation Testig)的试验方法.首先给出SSADT的基本假设.基于该... 针对在贮存期内具有长寿命、高可靠性特点的系统级微波电子产品,为了快速评估其贮存寿命与可靠性指标,提出了使用步进应力加速退化试验(SSADT,Step Stress Ac-celerated Degradation Testig)的试验方法.首先给出SSADT的基本假设.基于该产品的故障模式影响及危害性分析和故障树分析结果,为该产品确定了加速模型.并结合线性漂移布朗运动的首达时(first passage time)分布服从逆高斯分布的特点,建立了SSADT的可靠性评估模型.其次,根据线性漂移布朗运动的独立增量性,给出了可靠性评估模型参数的极大似然法和最小二乘法相结合的评估方法.为了剔除试验中为检测产品性能而引入的通断电对产品贮存寿命与可靠性评估带来的影响,在借鉴可靠性相关标准的基础上,提出了通断电因子退化率折合方法,并得到了线性漂移布朗运动的通断电折合公式.最终的实例证明,采用提出的贮存寿命与可靠性方法能够得到合理的评估结果,从而验证了该方法的正确性. 展开更多
关键词 贮存 可靠性 退化 布朗运动 寿命 加速试验 通断电
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基于累积退化量的电子部件SSADT可靠性评估 被引量:1
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作者 范志锋 齐杏林 崔平 《装备环境工程》 CAS 2013年第5期130-133,共4页
为快速评估新型弹药中电子部件的储存可靠性,提出了使用步进应力加速退化试验(SSADT)的方法。首先给出了电子部件SSADT方案,接着提出了基于累积退化量的电子部件SSADT可靠性评估的基本假设,然后详细分析了基于累积退化量的电子部件SSAD... 为快速评估新型弹药中电子部件的储存可靠性,提出了使用步进应力加速退化试验(SSADT)的方法。首先给出了电子部件SSADT方案,接着提出了基于累积退化量的电子部件SSADT可靠性评估的基本假设,然后详细分析了基于累积退化量的电子部件SSADT可靠性评估思路和方法。该方法实现了"零失效"情况下弹药电子部件的储存可靠性评估。 展开更多
关键词 弹药 电子部件 累积退化量 加速退化试验 步进应力 恒定应力 可靠性评估
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费用约束下含应力优化的CSADT设计 被引量:2
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作者 葛蒸蒸 李晓阳 姜同敏 《北京航空航天大学学报》 EI CAS CSCD 北大核心 2011年第10期1277-1281,共5页
恒定应力加速退化试验(CSADT,Constant Stress Accelerated Degradation Tes-ting)方案中需要确定的变量有应力水平、各应力下样本量、监测间隔和各应力下监测次数.如何对CSADT的应力水平进行优化目前很少有人探讨.针对这一问题提出一... 恒定应力加速退化试验(CSADT,Constant Stress Accelerated Degradation Tes-ting)方案中需要确定的变量有应力水平、各应力下样本量、监测间隔和各应力下监测次数.如何对CSADT的应力水平进行优化目前很少有人探讨.针对这一问题提出一种在费用约束下将上述4个变量进行综合优化的方法.首先用随机过程描述CSADT下产品的性能退化过程,然后以产品在使用条件下p分位寿命可靠度的渐近方差最小为目标,以试验费用不超过预算为约束条件,给出CSADT的4个优化变量,并给出应用该优化方法的仿真算例.最后,优化方案对模型参数偏差的敏感性分析表明,在一定偏差范围内优化结果具有良好的稳健性. 展开更多
关键词 恒定应力加速退化试验 优化设计 费用约束 应力优化
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基于加速退化试验的脉宽调制器贮存寿命预测研究
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作者 游文超 孙高宇 +1 位作者 彭珂菲 黄姣英 《现代电子技术》 北大核心 2024年第16期7-12,共6页
脉宽调制器作为开关电源的核心器件,已广泛应用于航天器中,但其贮存寿命会影响电源系统的可靠性,进而影响航天器任务执行的成败。在寿命评估中,加速退化试验是常用的试验方法,其中激活能值是预测器件贮存寿命的关键,但目前相关标准只有... 脉宽调制器作为开关电源的核心器件,已广泛应用于航天器中,但其贮存寿命会影响电源系统的可靠性,进而影响航天器任务执行的成败。在寿命评估中,加速退化试验是常用的试验方法,其中激活能值是预测器件贮存寿命的关键,但目前相关标准只有器件激活能值的参考范围,缺乏试验相关条件设置的详细描述,这会影响寿命评估的精度。为此,文中以JW1525脉宽调制器为研究对象,分析JW1525的结构及工作原理,设计并完成72 h的加速退化预试验,得到器件的退化敏感参数作为输出电压。根据预试验结果设计并完成440 h的加速退化正式试验,并结合Arrhenius模型对正式试验结果进行数据处理,得到JW1525的激活能为0.29 eV,常温下贮存寿命将近70年。通过详细的器件结构分析和试验开展,得出脉宽调制器的激活能和常温贮存寿命,可为后续研究提供数据和试验基础。 展开更多
关键词 加速退化试验 脉宽调制器 贮存寿命 Arrhenius模型 激活能 退化敏感参数
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