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Progress on mechanical and tribological characterization of 2D materials by AFM force spectroscopy
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作者 Shuai WU Jie GU +6 位作者 Ruiteng LI Yuening TANG Lingxiao GAO Cuihua AN Qibo DENG Libin ZHAO Ning HU 《Friction》 SCIE EI CAS CSCD 2024年第12期2627-2656,共30页
Two-dimensional(2D)materials are potential candidates for electronic devices due to their unique structures and exceptional physical properties,making them a focal point in nanotechnology research.Accurate assessment ... Two-dimensional(2D)materials are potential candidates for electronic devices due to their unique structures and exceptional physical properties,making them a focal point in nanotechnology research.Accurate assessment of the mechanical and tribological properties of 2D materials is imperative to fully exploit their potential across diverse applications.However,their nanoscale thickness and planar nature pose significant challenges in testing and characterizing their mechanical properties.Among the in situ characterization techniques,atomic force microscopy(AFM)has gained widespread applications in exploring the mechanical behaviour of nanomaterials,because of the easy measurement capability of nano force and displacement from the AFM tips.Specifically,AFM-based force spectroscopy is a common approach for studying the mechanical and tribological properties of 2D materials.This review comprehensively details the methods based on normal force spectroscopy,which are utilized to test and characterize the elastic and fracture properties,adhesion,and fatigue of 2D materials.Additionally,the methods using lateral force spectroscopy can characterize the interfacial properties of 2D materials,including surface friction of 2D materials,shear behaviour of interlayers as well as nanoflake-substrate interfaces.The influence of various factors,such as testing methods,external environments,and the properties of test samples,on the measured mechanical properties is also addressed.In the end,the current challenges and issues in AFM-based measurements of mechanical and tribological properties of 2D materials are discussed,which identifies the trend in the combination of multiple methods concerning the future development of the in situ testing techniques. 展开更多
关键词 two-dimensional(2D)materials atomic force microscopy(afm) mechanical properties nanomechanical testing NANOTRIBOLOGY
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Unveiling the nanoscale architectures and dynamics of protein assembly with in situ atomic force microscopy
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作者 Zhaoyi Zhai Sakshi Yadav Schmid +2 位作者 Zhixing Lin Shuai Zhang Fang Jiao 《Aggregate》 EI CAS 2024年第5期181-199,共19页
Proteins play a vital role in different biological processes by forming complexes through precise folding with exclusive inter-and intra-molecular interactions.Understanding the structural and regulatory mechanisms un... Proteins play a vital role in different biological processes by forming complexes through precise folding with exclusive inter-and intra-molecular interactions.Understanding the structural and regulatory mechanisms underlying protein complex formation provides insights into biophysical processes.Furthermore,the principle of protein assembly gives guidelines for new biomimetic materials with potential appli-cations in medicine,energy,and nanotechnology.Atomic force microscopy(AFM)is a powerful tool for investigating protein assembly and interactions across spatial scales(single molecules to cells)and temporal scales(milliseconds to days).It has significantly contributed to understanding nanoscale architectures,inter-and intra-molecular interactions,and regulatory elements that determine protein structures,assemblies,and functions.This review describes recent advancements in elucidating protein assemblies with in situ AFM.We discuss the structures,diffusions,interac-tions,and assembly dynamics of proteins captured by conventional and high-speed AFM in near-native environments and recent AFM developments in the multimodal high-resolution imaging,bimodal imaging,live cell imaging,and machine-learning-enhanced data analysis.These approaches show the significance of broadening the horizons of AFM and enable unprecedented explorations of protein assembly for biomaterial design and biomedical research. 展开更多
关键词 atomic force microscopy biomimetic material high-speed afm in situ protein assembly dynamics protein structure characterization
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A Study on HA Titanium Surface with Atomic Force Microscope (AFM)
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作者 杨晓喻 刘长虹 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2005年第B12期242-245,共4页
Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apathe solution. Samples were observed by optic micros... Three kinds of titanium surface especially the HA surface are analyzed. Titanium was treated by 3 kinds of methods that were acid & alkali, calcic solution and apathe solution. Samples were observed by optic microscope and atomic force microscope ( AFM ) . The typical surface morphology of the acid and alkali group is little holes, and on the two HA surface the tiny protuberances is typical. The surface treated by apatite solution was smoother than the two formers. The rough surface treated with acid and alkali was propitious to Ca^+ , P^- and proteins' adhesion, and the relatively smooth HA surface was of benefit to the cell adhesion. 展开更多
关键词 TITANIUM surface morphology atomic force microscope afm
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基于光偏转原理的AFM光电检测系统设计
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作者 王旭东 温阳 +3 位作者 王慧云 秦丽 温焕飞 马宗敏 《传感器与微系统》 CSCD 北大核心 2024年第3期76-79,共4页
利用光偏转原理设计并实现了原子力显微镜(AFM)的光电检测系统,研究了影响光偏转噪声的影响因素。设计了新型螺旋式嵌套结构调节准直光斑,使激光发散角降低到0.053°,利用压电陶瓷特性设计了高精度三维调节结构,可以在α,β,γ方向... 利用光偏转原理设计并实现了原子力显微镜(AFM)的光电检测系统,研究了影响光偏转噪声的影响因素。设计了新型螺旋式嵌套结构调节准直光斑,使激光发散角降低到0.053°,利用压电陶瓷特性设计了高精度三维调节结构,可以在α,β,γ方向精准调节偏转角度,36mm的聚焦焦距满足了小型化、集成化的设计目标。基于该高灵敏度光电检测系统的设计,AFM系统得到了清晰的硅材料表面台阶结构,系统分辨率达到了0.1nm,为今后的亚原子测量奠定了实验基础。 展开更多
关键词 原子力显微镜 光偏转 准直调节 压电陶瓷
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MICRO/NANO-MACHINING ON SILICON SURFACE WITH A MODIFIED ATOMIC FORCE MICROSCOPE 被引量:4
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作者 Zhao Qingliang,Sun Tao,Dong Shen,Liang Yingchun (School of Mechanical Engineering,Harbin Institute of Technology) 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2001年第3期207-211,共5页
To understand the deformation and removal mechanism of material on nano-scale at ultralow loads,a systemic study on AFM micro/nano-machining on single crystal ailicon is conducted. The results indicate that AFM nano- ... To understand the deformation and removal mechanism of material on nano-scale at ultralow loads,a systemic study on AFM micro/nano-machining on single crystal ailicon is conducted. The results indicate that AFM nano- machining has a precisely dimensional controllability and a good surface quality on nanometer scale.A SEM is adopted to observe nano-machined region and chips,the results indicate that the material removal mechanisms change with the applied normal load. An XPS is used to analyze the changes of chemical composition inside and outside the nano-machined region respectively.The nano-indentation which is conducted with the same AFM diamond tip on the machined region shows a big discrepancy compared with that on the macro-scale. The calculated results show higher nano-hardness and elastic modulus than normal values .This phenomenon on be regarded as the indentation size effect(ISE). 展开更多
关键词 atomic force microscope Diamond tip Nano-machining Single crystal silicon Mechanical property
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Nonlinear control techniques for an atomic force microscope system 被引量:2
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作者 YongchunFANG MatthewFEEMSTER +1 位作者 DarrenDAWSON NaderM.JALILI 《控制理论与应用(英文版)》 EI 2005年第1期85-92,共8页
Two nonlinear control techniques are proposed for an atomic force microscopesystem. Initially, a learning-based control algorithm is developed for the microcantilever-samplesystem that achieves asymptotic cantilever t... Two nonlinear control techniques are proposed for an atomic force microscopesystem. Initially, a learning-based control algorithm is developed for the microcantilever-samplesystem that achieves asymptotic cantilever tip tracking for periodic trajectories. Specifically, thecontrol approach utilizes a learning-based feedforward term to compensate for periodic dynamics andhigh-gain terms to account for non-periodic dynamics. An adaptive control algorithm is thendeveloped to achieve asymptotic cantilever tip tracking for bounded tip trajectories despiteuncertainty throughout the system parameters. Simulation results are provided to illustrate theefficacy and performance of the control strategies. 展开更多
关键词 atomic force microscope adaptive control learning control lyapunov-basedstability analysis
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Surface Electromechanical Coupling on DLC Film with Conductive Atomic Force Microscope 被引量:1
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作者 朱守星 丁建宁 +3 位作者 范真 李长生 蔡兰 杨继昌 《Plasma Science and Technology》 SCIE EI CAS CSCD 2004年第3期2342-2345,共4页
Diamond-like carbon (DLC) film composed of microscopically insulation but microscopically a mixture of conducting (sp2) and insulating (sp3) phases was discussed on the local modification with a conductive atomic forc... Diamond-like carbon (DLC) film composed of microscopically insulation but microscopically a mixture of conducting (sp2) and insulating (sp3) phases was discussed on the local modification with a conductive atomic force microscope (C-APM). Especially, a topographic change was observed when a direct current (DC) bias-voltage was applied to the DLC film. Experimental results show that a nanoscale pit on DLC surface was formed when applying a positive 25 V on DLC film. According to the interacting force between CoCr-coated microelectronic scanning probe (MESP) tip and DLC surface, as well as the Sondheimer oscillation theory, the 'scalewing effect' of the pit was explained. Electromechanical coupling on DLC film suggested that the depth of pits increased with an increase of load applied to surface when the cantilever-deflected signal was less than a certain threshold voltage. 展开更多
关键词 atomic force microscope diamond-like carbon surface modification electromechanical coupling
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基于AFM技术的沥青混合料水稳定性研究进展 被引量:1
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作者 刘玉梅 苏纪壮 +2 位作者 孙敏 贾朝霞 乔瑞哲 《材料导报》 EI CAS CSCD 北大核心 2024年第S01期208-213,共6页
原子力显微镜(Atomic force microscope,AFM)不仅可以从纳米尺度观测沥青表面微观结构,还可以应用不同模式测试其微观力学特性,是研究沥青路面材料微观特性的有力工具。沥青混合料的水损害已经成为沥青路面的主要病害之一,研究表明,沥... 原子力显微镜(Atomic force microscope,AFM)不仅可以从纳米尺度观测沥青表面微观结构,还可以应用不同模式测试其微观力学特性,是研究沥青路面材料微观特性的有力工具。沥青混合料的水损害已经成为沥青路面的主要病害之一,研究表明,沥青结合料与集料之间的水分相互作用是一种出现在微观尺度,甚至纳米尺度的现象,因此从微纳观角度探究在水分存在条件下沥青与集料的结构变化,对于改善沥青混合料水稳定性能,探究其水损害机制具有深远的意义。本文在总结AFM工作原理及沥青微观“bees”结构特性的基础上,重点分析了AFM在纳米尺度上对沥青混合料水稳性能的研究成果,并探讨了AFM在沥青路面材料研究中的发展方向,为今后对于沥青路面病害研究与防治方面提供一定的借鉴。 展开更多
关键词 原子力显微镜 沥青混合料 水稳定性 “bees”结构 粘附性
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Sorting Gold and Sand(Silica) Using Atomic Force Microscope-Based Dielectrophoresis 被引量:1
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作者 Chungman Kim Sunghoon Hong +3 位作者 Dongha Shin Sangmin An Xingcai Zhang Wonho Jhe 《Nano-Micro Letters》 SCIE EI CAS CSCD 2022年第2期1-11,共11页
Additive manufacturing-also known as 3D printing-has attracted much attention in recent years as a powerful method for the simple and versatile fabrication of complicated three-dimensional structures.However,the curre... Additive manufacturing-also known as 3D printing-has attracted much attention in recent years as a powerful method for the simple and versatile fabrication of complicated three-dimensional structures.However,the current technology still exhibits a limitation in realizing the selective deposition and sorting of various materials contained in the same reservoir,which can contribute significantly to additive printing or manufacturing by enabling simultaneous sorting and deposition of different substances through a single nozzle.Here,we propose a dielectrophoresis(DEP)-based material-selective deposition and sorting technique using a pipette-based quartz tuning fork(QTF)-atomic force microscope(AFM) platform DEPQA and demonstrate multi-material sorting through a single nozzle in ambient conditions.We used Au and silica nanoparticles for sorting and obtained 95% accuracy for spatial separation,which confirmed the surfaceenhanced Raman spectroscopy(SERS).To validate the scheme,we also performed a simulation for the system and found qualitative agreement with the experimental results.The method that combines DEP,pipette-based AFM,and SERS may widely expand the unique capabilities of 3D printing and nano-micro patterning for multi-material patterning,materials sorting,and diverse advanced applications. 展开更多
关键词 Dielectrophoresis-empowered Pipette/afm platform On-demand materials sorting Additive 3D printing Multimaterial nano-patterning Nanopipette-based atomic force microscope
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Atomic force microscope study of WC-10Co cemented carbide sintered from nanocrystalline composite powders 被引量:2
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作者 Xiaoliang Shi Gangqin Shao Xinglong Duan Runzhang Yuan 《Journal of University of Science and Technology Beijing》 CSCD 2005年第6期558-563,共6页
In order to compare the spark plasma sintedng (SPS) process plus hot isostatic press (HIP) with vacuum sintedng plus HIP, an investigation was carried out on the topography, microstructure and gain size distributi... In order to compare the spark plasma sintedng (SPS) process plus hot isostatic press (HIP) with vacuum sintedng plus HIP, an investigation was carried out on the topography, microstructure and gain size distribution of nanocrystalline WC-10Co composite powder and the sintered specimens prepared by SPS plus HIP and by vacuum sintering plus HIP by means of atomic force microscopy (AFM). The mechanical properties of the sintered specimens were also investigated. It is very easy to find cobalt lakes in the specimen prepared by vacuum sintering plus HIP process. But the microstructure of the specimen prepared by SPS plus HIP is more homogeneous, and the grain size is smaller than that prepared by vacuum sintering plus HIP. The WC-10Co ultrafine cemented carbide consolidated by SPS plus HIP can reach a relative density of 99.4%, and the transverse rupture strength (TRS) is higher than 3540 MPa, the Rockwell A hardness (HRA) is higher than 92.8, the average grain size is smaller than 300 nm, and the WC-10Co ultrafine cemented carbide with excellent properties is achieved. The specimen prepared by SPS with HIP has better properties and microstructure than that prepared by vacuum sintering with HIP. 展开更多
关键词 WC-10Co nanocrystalline composite powder atomic force microscopy afm spark plasma sintering (SPS) hot isostatic pressing (HIP)
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利用AFM探究聚合物和表面活性剂对油滴间稳定性的影响
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作者 肖帆 王玮 +5 位作者 陈龙鑫 李楷 孙文苑 葛运通 李炯昊 宫敬 《重庆理工大学学报(自然科学)》 CAS 北大核心 2024年第5期216-223,共8页
采用原子力显微镜(AFM)探究水中油滴之间的相互作用,并考察了聚合物聚(4-苯乙烯磺酸钠)(PSS)和阴离子表面活性剂十二烷基硫酸钠(SDS)对油滴稳定性的影响。采用分子动力学模拟软件模拟了PSS和SDS在水中的相互作用。结果表明:在不含聚合... 采用原子力显微镜(AFM)探究水中油滴之间的相互作用,并考察了聚合物聚(4-苯乙烯磺酸钠)(PSS)和阴离子表面活性剂十二烷基硫酸钠(SDS)对油滴稳定性的影响。采用分子动力学模拟软件模拟了PSS和SDS在水中的相互作用。结果表明:在不含聚合物和表面活性剂的盐溶液中油滴容易聚并;当水溶液中加入100 mg/L的PSS会使油滴稳定,这主要是由于PSS吸附层提供了空间位阻,有效阻止了油滴之间的聚并作用;然而,100 mg/L PSS和0.1 mM/L SDS共存时会导致油滴再次聚并,这是因为PSS和SDS同时存在时,两者易形成团簇,只有少部分PSS吸附到界面,此时PSS无法形成有效的空间位阻,导致油滴在相互靠近时发生聚并,从而影响了水包油体系的稳定性。 展开更多
关键词 原子力显微镜 聚合物 表面活性剂 废水 油滴 分子模拟
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Research on a Diamond Tip Wear Mechanism in Atomic Force Microscope-based Micro/nano-machining 被引量:1
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作者 赵清亮 《High Technology Letters》 EI CAS 2001年第3期84-89,共6页
The object is to investigate the wear of an atomic force microscope (AFM) diamond tip when conducting micro/nano machining on single crystal silicon surface. The experimental research and theoretical analysis were car... The object is to investigate the wear of an atomic force microscope (AFM) diamond tip when conducting micro/nano machining on single crystal silicon surface. The experimental research and theoretical analysis were carried out on the worn tip in terms of wear rate, wear mechanism and the effect of the tip wear on micro machining process. The wear rate was calculated as 1.7(10~10mm 3/(N·m) by using a theoretical model combined with the experimental results. Through an integration of an AFM observation on the worn tip features with the FEM simulation of the stress distribution, in addition to the unit cutting force calculation on the AFM diamond tip, the wear mechanism of the AFM diamond tip was concluded as mainly chemical wear, and the wear process was also elaborated as well. 展开更多
关键词 atomic force microscope DIAMOND TIP single crystal silicon micro/nano machining chemical wear
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IMPROVED FABRICATION METHOD FOR CARBON NANOTUBE PROBE OF ATOMIC FORCE MICROSCOPY(AFM) 被引量:1
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作者 XU Zongwei DONG Shen +1 位作者 GUO Liqiu ZHAO Qingliang 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2006年第3期373-375,共3页
An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two hig... An improved arc discharge method is developed to fabricate carbon nanotube probe of atomic force microscopy (AFM) here. First, silicon probe and carbon nanotube are manipulated under an optical microscope by two high precision microtranslators. When silicon probe and carbon nanotube are very close, several tens voltage is applied between them. And carbon nanotube is divided and attached to the end of silicon probe, which mainly due to the arc welding function. Comparing with the arc discharge method before, the new method here needs no coat silicon probe with metal film in advance, which can greatly reduce the fabrication's difficulty. The fabricated carbon nanotube probe shows good property of higher aspect ratio and can more accurately reflect the true topography of silicon grating than silicon probe. Under the same image drive force, carbon nanotube probe had less indentation depth on soft triblock copolymer sample than silicon probe. This showed that carbon nanotube probe has lower spring constant and less damage to the scan sample than silicon probe. 展开更多
关键词 Carbon nanotube (CNT) atomic force microscope afm Probe Fabrication
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Surface topography of La-Ti composite oxide nanocrystallines examined with atomic force microscope 被引量:1
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作者 谷俐 王远亮 +4 位作者 杨华 唐丽灵 吴浚瀚 夏烈文 罗琦 《中国有色金属学会会刊:英文版》 CSCD 2003年第2期294-297,共4页
By means of atomic force microscope, the surface pattern, particle size distribution, and specific surface area of La Ti composite oxide were studied. The compound particle surface appears as a smooth sheet, the even ... By means of atomic force microscope, the surface pattern, particle size distribution, and specific surface area of La Ti composite oxide were studied. The compound particle surface appears as a smooth sheet, the even size of the compound ranges from 19.85 nm to 25.38 nm. The particle seems smooth, which erects at a height from 4.69 nm to 5.88 nm.The surface area ranges from 58.90 nm 2 to 1 238.04 nm 2. The La Ti composite oxide nanocrystallines enjoy a narrow and even particle size distribution and accumulate closely. 展开更多
关键词 镧钛复合氧化物 表面形貌 原子力显微镜 非晶 检验
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基于AFM的SBS改性沥青老化过程力学特性研究 被引量:1
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作者 曲恒辉 丁昕 +4 位作者 李孟 田冬军 冯美军 王飞 王鹏 《市政技术》 2024年第1期212-218,共7页
为了探究改性沥青在老化过程中宏观与微观性能的变化,制备了掺量为5.5%的SBS改性沥青,并进行了短期与长期老化试验,分析了其基本性能指标。采用温度扫描与频率扫描试验研究了SBS改性沥青的流变性能,采用AFM试验分析了其表面微观形貌和... 为了探究改性沥青在老化过程中宏观与微观性能的变化,制备了掺量为5.5%的SBS改性沥青,并进行了短期与长期老化试验,分析了其基本性能指标。采用温度扫描与频率扫描试验研究了SBS改性沥青的流变性能,采用AFM试验分析了其表面微观形貌和耗散力,并结合力曲线分析了其黏附力及杨氏模量在老化前后的变化。研究结果表明,短期老化对SBS改性沥青流变性能的影响较小,长期老化对其流变性能影响显著,弹性模量和黏性模量均增大,呈现出变硬、变脆的特性;AFM试验表明SBS改性沥青在老化后高度增大,且蜂状结构尺寸增大、数量增多,黏附力和耗散力均降低,杨氏模量增大,验证了宏观流变试验的结果。 展开更多
关键词 afm SBS改性沥青 老化 力学特性
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Edge Effects and Coupling Effects in Atomic Force Microscope Images
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作者 张向军 《Journal of Wuhan University of Technology(Materials Science)》 SCIE EI CAS 2004年第B10期63-65,共3页
The AFM images were obtained by an atomic force microscope (AFM) and transformed from the deformation of AFM micro cantilever probe. However, due to the surface topography and surface forces applied on the AFM tip of ... The AFM images were obtained by an atomic force microscope (AFM) and transformed from the deformation of AFM micro cantilever probe. However, due to the surface topography and surface forces applied on the AFM tip of sample, the deformation of AFM probe results in obvious edge effects and coupling effects in the AFM images.The deformation of AFM probe was analyzed,the mechanism of the edge effects and the coupling effects was investigated, and their results in the AFM images were studied. It is demonstrated by the theoretical analysis and AFM experiments that the edge effects make lateral force images more clear than the topography images,also make extraction of frictional force from lateral force images more complex and difficult. While the coupling effects make the comparison between topography images and lateral force images more advantage to acquire precise topography information by AFM. 展开更多
关键词 atomic force microscope micro-scale topography edge effects coupling effects
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Preparation of La-Ti Composite Oxide Nanocrystal and Examination of Their Surface Topography with Atomic Force Microscope
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作者 LiGU YuanLiangWANG +2 位作者 LiLingTANG JiuJinZHU JunHanWU 《Chinese Chemical Letters》 SCIE CAS CSCD 2003年第4期429-432,共4页
With sol-gel method, nanometer La-Ti composite oxide was successfully prepared at a low temperature (750~800C) using polyethylene glycol as dispersant. By means of atomic force microscope, the surface pattern, partic... With sol-gel method, nanometer La-Ti composite oxide was successfully prepared at a low temperature (750~800C) using polyethylene glycol as dispersant. By means of atomic force microscope, the surface pattern, particle size distribution, and specific surface area were studied. The compound particle surface appears as a smooth sheet, the mean size of the compound is 25.38 nm. On the specific surface, the particle erects at a height of 4.69 nm. The surface area is 58.90 nm2. The La-Ti composite oxide nanocrystal prefers to narrow and even particle size distribution and the homogeneity of surface topography. 展开更多
关键词 La-Ti composite oxide nanocrystal surface pattern atomic force microscope.
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Competitive Adsorption between Bovine Serum Albumin and Collagen Observed by Atomic Force Microscope
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作者 Yong YU Pei Qing YING Gang JIN National Microgravity Lab,Institute of Mechanics,Chinese Academy of Sciences, Beijing 100080 《Chinese Chemical Letters》 SCIE CAS CSCD 2004年第12期1465-1468,共4页
Atomic force microscopy (AFM) was used to study the competitive adsorption betweenbovine serum albumin (BSA) and type Ⅰ collagen on hydrophilic and hydrophobic silicon wafers.BSA showed a grain shape and the type Ⅰ ... Atomic force microscopy (AFM) was used to study the competitive adsorption betweenbovine serum albumin (BSA) and type Ⅰ collagen on hydrophilic and hydrophobic silicon wafers.BSA showed a grain shape and the type Ⅰ collagen displayed fibril-like molecules with relativelyhomogeneous height and width, characterized with clear twisting (helical formation). These AFMimages illustrated that quite a lot of type Ⅰ collagen appeared in the adsorption layer on hydrophilicsurface in a competitive adsorption state, but the adsorption of BSA was more preponderant than thatof type Ⅰ collagen on hydrophobic silicon wafer surface. The experiments showed that theinfluence of BSA on type Ⅰ collagen adsorption on hydrophilic surface was less than that onhydrophobic surface. 展开更多
关键词 atomic force microscope protein competitive adsorption COLLAGEN bovine serum albumin.
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Studying Aggregate in Lysozyme Solution by Atomic Force Microscope
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作者 GuoLiangDAI YongYU QiKANG WenRuiHU 《Chinese Chemical Letters》 SCIE CAS CSCD 2004年第10期1237-1240,共4页
The aggregates in lysozyme solution with different NaCl concentration were investigated by Atomic Force Microscope (AFM). The AFM images show that there exist lysozyme monomers, n-mers and clusters in lysozyme solutio... The aggregates in lysozyme solution with different NaCl concentration were investigated by Atomic Force Microscope (AFM). The AFM images show that there exist lysozyme monomers, n-mers and clusters in lysozyme solution when the conditions are not suitable for crystal growth. In favorable conditions for crystal growth, the lysozyme clusters disappear and almost only monomers exist in solution. 展开更多
关键词 LYSOZYME AGGREGATE atomic force microscope.
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Development of XY scanner with minimized coupling motions for high-speed atomic force microscope
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作者 PARK Jong-kyu MOON Won-kyu 《Journal of Central South University》 SCIE EI CAS 2011年第3期697-703,共7页
The design and fabrication processes of a novel scanner with minimized coupling motions for a high-speed atomic force microscope (AFM) were addressed. An appropriate design modification was proposed through the anal... The design and fabrication processes of a novel scanner with minimized coupling motions for a high-speed atomic force microscope (AFM) were addressed. An appropriate design modification was proposed through the analyses of the dynamic characteristics of existing linear motion stages using a dynamic analysis program, Recurdyn. Because the scanning speed of each direction may differ, the linear motion stage for a high-speed scanner was designed to have different resonance frequencies for the modes, with one dominant displacement in the desired directions. This objective was achieved by using one-direction flexure mechanisms for each direction and mounting one stage for fast motion on the other stage for slow motion. This unsymmetrical configuration separated the frequencies of two vibration modes with one dominant displacement in each desired direction, and hence suppressed the coupling between motions in two directions. A pair of actuators was used for each axis to decrease the crosstalk between the two motions and give a sufficient force to actuate the slow motion stage, which carried the fast motion stage, A lossy material, such as grease, was inserted into the flexure hinge to suppress vibration problems that occurred when using an input triangular waveforrn. With these design modifications and the vibration suppression method, a novel scanner with a scanning speed greater than 20 Hz is achieved. 展开更多
关键词 atomic force microscope SCANNER piezoelectric stack actuator CROSSTALK flexure hinge
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