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Effect of external magnetic field on the instability of THz plasma waves in nanoscale graphene field-effect transistors
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作者 张丽萍 孙宗耀 +1 位作者 李佳妮 苏俊燕 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第4期683-689,共7页
The instability of plasma waves in the channel of field-effect transistors will cause the electromagnetic waves with THz frequency.Based on a self-consistent quantum hydrodynamic model,the instability of THz plasmas w... The instability of plasma waves in the channel of field-effect transistors will cause the electromagnetic waves with THz frequency.Based on a self-consistent quantum hydrodynamic model,the instability of THz plasmas waves in the channel of graphene field-effect transistors has been investigated with external magnetic field and quantum effects.We analyzed the influence of weak magnetic fields,quantum effects,device size,and temperature on the instability of plasma waves under asymmetric boundary conditions numerically.The results show that the magnetic fields,quantum effects,and the thickness of the dielectric layer between the gate and the channel can increase the radiation frequency.Additionally,we observed that increase in temperature leads to a decrease in both oscillation frequency and instability increment.The numerical results and accompanying images obtained from our simulations provide support for the above conclusions. 展开更多
关键词 graphene field-effect transistors external magnetic field radiation frequency instability increment
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A field-effect WSe_(2)/Si heterojunction diode
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作者 余睿 盛喆 +5 位作者 胡文楠 王越 董建国 孙浩然 程增光 张增星 《Chinese Physics B》 SCIE EI CAS CSCD 2023年第1期592-597,共6页
It is significant to develop a heterogeneous integration technology to promote the application of two-dimensional(2D)materials in silicon roadmap. In this paper, we reported a field-effect WSe_(2)/Si heterojunction di... It is significant to develop a heterogeneous integration technology to promote the application of two-dimensional(2D)materials in silicon roadmap. In this paper, we reported a field-effect WSe_(2)/Si heterojunction diode based on ambipolar 2D WSe_(2) and silicon on insulator(SOI). Our results indicate that the device exhibits a p–n diode behavior with a rectifying ratio of ~300 and an ideality factor of 1.37. As a photodetector, it has optoelectronic properties with a response time of 0.13 ms, responsivity of 0.045 A/W, detectivity of 4.5×10~(10) Jones and external quantum efficiency(EQE) of 8.9 %.Due to the ambipolar behavior of the WSe_(2), the rectifying and optoelectronic properties of the heterojunction diode can be modulated by the gate electrical field, enabling various potential applications such as logic optoelectronic devices and neuromorphic optoelectronic devices for in-sensor computing circuits. Thanks to the process based on the mature SOI technique, our field-effect heterojunction diode should have obvious advantages in device isolation and integration. 展开更多
关键词 two-dimensional material ambipolar semiconductor field-effect transistor optoelectronic device
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Novel GaN-based double-channel p-heterostructure field-effect transistors with a p-GaN insertion layer
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作者 牛雪锐 侯斌 +7 位作者 张濛 杨凌 武玫 张新创 贾富春 王冲 马晓华 郝跃 《Chinese Physics B》 SCIE EI CAS CSCD 2023年第10期678-683,共6页
GaN-based p-channel heterostructure field-effect transistors(p-HFETs)face significant constraints on on-state currents compared with n-channel high electron mobility transistors.In this work,we propose a novel double ... GaN-based p-channel heterostructure field-effect transistors(p-HFETs)face significant constraints on on-state currents compared with n-channel high electron mobility transistors.In this work,we propose a novel double heterostructure which introduces an additional p-GaN insertion layer into traditional p-HFETs.The impact of the device structure on the hole densities and valence band energies of both the upper and lower channels is analyzed by using Silvaco TACD simulations,including the thickness of the upper AlGaN layer and the doping impurities and concentration in the GaN buffer layer,as well as the thickness and Mg-doping concentration in the p-GaN insertion layer.With the help of the p-GaN insertion layer,the C-doping concentration in the GaN buffer layer can be reduced,while the density of the two-dimensional hole gas in the lower channel is enhanced at the same time.This work suggests that a double heterostructure with a p-GaN insertion layer is a better approach to improve p-HFETs compared with those devices with C-doped buffer layer alone. 展开更多
关键词 GaN double-channel heterostructure field-effect transistors p-GaN insertion layer C-doped buffer layer
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Effect of spin on the instability of THz plasma waves in field-effect transistors under non-ideal boundary conditions
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作者 张丽萍 李佳妮 +1 位作者 冯江旭 苏俊燕 《Plasma Science and Technology》 SCIE EI CAS CSCD 2023年第12期24-30,共7页
Terahertz(THz) radiation can be generated due to the instability of THz plasma waves in field-effect transistors(FETs). In this work, we discuss the instability of THz plasma waves in the channel of FETs with spin and... Terahertz(THz) radiation can be generated due to the instability of THz plasma waves in field-effect transistors(FETs). In this work, we discuss the instability of THz plasma waves in the channel of FETs with spin and quantum effects under non-ideal boundary conditions. We obtain a linear dispersion relation by using the hydrodynamic equation, Maxwell equation and spin equation. The influence of source capacitance, drain capacitance, spin effects, quantum effects and channel width on the instability of THz plasma waves under the non-ideal boundary conditions is investigated in great detail. The results of numerical simulation show that the THz plasma wave is unstable when the drain capacitance is smaller than the source capacitance;the oscillation frequency with asymmetric boundary conditions is smaller than that under non-ideal boundary conditions;the instability gain of THz plasma waves becomes lower under non-ideal boundary conditions. This finding provides a new idea for finding efficient THz radiation sources and opens up a new mechanism for the development of THz technology. 展开更多
关键词 the instability of THz plasma waves spin effects non-ideal boundary conditions quantum effects field-effect transistors
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Impact of low/high-κ spacer-source overlap on characteristics of tunnel dielectric based tunnel field-effect transistor
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作者 蒋智 庄奕琪 +2 位作者 李聪 王萍 刘予琪 《Journal of Central South University》 SCIE EI CAS CSCD 2017年第11期2572-2581,共10页
The effects of low-κ and high-κ spacer were investigated on the novel tunnel dielectric based tunnel field-effect transistor(TD-FET) mainly based upon ultra-thin dielectric direct tunneling mechanism. Drive currents... The effects of low-κ and high-κ spacer were investigated on the novel tunnel dielectric based tunnel field-effect transistor(TD-FET) mainly based upon ultra-thin dielectric direct tunneling mechanism. Drive currents consist of direct tunneling current and band-to-band tunneling(BTBT) current. Meanwhile, tunneling position of the TD-FET differs from conventional tunnel-FET in which the electron and hole tunneling occur at intermediate rather than surface in channel(or source-channel junction under gate dielectric). The 2-D nature of TD-FET current flow is also discussed that the on-current is degraded with an increase in the spacer width. BTBT current will not begin to play part in tunneling current until gate voltage is 0.2 V. We clearly identify the influence of the tunneling dielectric layer and spacer electrostatic field on the device characteristics by numerical simulations. The inserted Si_3N_4 tunnel layer between P+ region and N+ region can significantly shorten the direct and band-to-band tunneling path, so a reduced subthreshold slope(Ss) and a high on-current can be achieved. Above all the ambipolar current is effectively suppressed, thus reducing off-current. TD-FET demonstrates excellent performance for low-power applications. 展开更多
关键词 tunnel dielectric based tunnel field-effect transistor tunnel field-effect transistor band-to-band tunneling tunneling dielectric layer subthreshold slope off-current on-current
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Two-Dimensional Transition Metal Dichalcogenides and Their Charge Carrier Mobilities in Field-Effect Transistors 被引量:9
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作者 Sohail Ahmed Jiabao Yi 《Nano-Micro Letters》 SCIE EI CAS 2017年第4期152-174,共23页
Two-dimensional(2D) materials have attracted extensive interest due to their excellent electrical, thermal,mechanical, and optical properties. Graphene has been one of the most explored 2D materials. However, its zero... Two-dimensional(2D) materials have attracted extensive interest due to their excellent electrical, thermal,mechanical, and optical properties. Graphene has been one of the most explored 2D materials. However, its zero band gap has limited its applications in electronic devices. Transition metal dichalcogenide(TMDC), another kind of 2D material,has a nonzero direct band gap(same charge carrier momentum in valence and conduction band) at monolayer state,promising for the efficient switching devices(e.g., field-effect transistors). This review mainly focuses on the recent advances in charge carrier mobility and the challenges to achieve high mobility in the electronic devices based on 2DTMDC materials and also includes an introduction of 2D materials along with the synthesis techniques. Finally, this review describes the possible methodology and future prospective to enhance the charge carrier mobility for electronic devices. 展开更多
关键词 2D materials TMDC layers Charge carrier mobility field-effect transistor HETEROSTRUCTURE Charge carrier scattering
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Review of gallium oxide based field-effect transistors and Schottky barrier diodes 被引量:5
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作者 刘增 李培刚 +3 位作者 支钰崧 王小龙 褚旭龙 唐为华 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第1期65-81,共17页
Gallium oxide(Ga_2O_3), a typical ultra wide bandgap semiconductor, with a bandgap of ~4.9 e V, critical breakdown field of 8 MV/cm, and Baliga's figure of merit of 3444, is promising to be used in high-power and ... Gallium oxide(Ga_2O_3), a typical ultra wide bandgap semiconductor, with a bandgap of ~4.9 e V, critical breakdown field of 8 MV/cm, and Baliga's figure of merit of 3444, is promising to be used in high-power and high-voltage devices.Recently, a keen interest in employing Ga_2O_3 in power devices has been aroused. Many researches have verified that Ga_2O_3 is an ideal candidate for fabricating power devices. In this review, we summarized the recent progress of field-effect transistors(FETs) and Schottky barrier diodes(SBDs) based on Ga_2O_3, which may provide a guideline for Ga_2O_3 to be preferably used in power devices fabrication. 展开更多
关键词 GALLIUM oxide(Ga2O3) field-effect transistors(FETs) Schottky barrier diodes(SBDs)
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Unique Characteristics of Vertical Carbon Nanotube Field-effect Transistors on Silicon 被引量:2
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作者 Jingqi Li Weisheng Yue +4 位作者 Zaibing Guo Yang Yang Xianbin Wang Ahad A.Syed Yafei Zhang 《Nano-Micro Letters》 SCIE EI CAS 2014年第3期287-292,共6页
A vertical carbon nanotube field-effect transistor(CNTFET) based on silicon(Si) substrate has been proposed and simulated using a semi-classical theory. A single-walled carbon nanotube(SWNT) and an n-type Si nanowire ... A vertical carbon nanotube field-effect transistor(CNTFET) based on silicon(Si) substrate has been proposed and simulated using a semi-classical theory. A single-walled carbon nanotube(SWNT) and an n-type Si nanowire in series construct the channel of the transistor. The CNTFET presents ambipolar characteristics at positive drain voltage(Vd) and n-type characteristics at negative Vd. The current is significantly influenced by the doping level of n-Si and the SWNT band gap. The n-branch current of the ambipolar characteristics increases with increasing doping level of the n-Si while the p-branch current decreases. The SWNT band gap has the same influence on the p-branch current at a positive Vd and n-type characteristics at negative Vd. The lower the SWNT band gap, the higher the current. However, it has no impact on the n-branch current in the ambipolar characteristics. Thick oxide is found to significantly degrade the current and the subthreshold slope of the CNTFETs. 展开更多
关键词 Carbon Nanotube field-effect Transistors Semi-classical Simulation
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Environmental Analysis with 2D Transition-Metal Dichalcogenide-Based Field-Effect Transistors 被引量:2
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作者 Xiaoyan Chen Chengbin Liu Shun Mao 《Nano-Micro Letters》 SCIE EI CAS CSCD 2020年第8期1-24,共24页
Field-effect transistors(FETs)present highly sensitive,rapid,and in situ detection capability in chemical and biological analysis.Recently,two-dimensional(2D)transition-metal dichalcogenides(TMDCs)attract significant ... Field-effect transistors(FETs)present highly sensitive,rapid,and in situ detection capability in chemical and biological analysis.Recently,two-dimensional(2D)transition-metal dichalcogenides(TMDCs)attract significant attention as FET channel due to their unique structures and outstanding properties.With the booming of studies on TMDC FETs,we aim to give a timely review on TMDCbased FET sensors for environmental analysis in different media.First,theoretical basics on TMDC and FET sensor are introduced.Then,recent advances of TMDC FET sensor for pollutant detection in gaseous and aqueous media are,respectively,discussed.At last,future perspectives and challenges in practical application and commercialization are given for TMDC FET sensors.This article provides an overview on TMDC sensors for a wide variety of analytes with an emphasize on the increasing demand of advanced sensing technologies in environmental analysis. 展开更多
关键词 Environmental analysis Two-dimensional transition-metal dichalcogenide field-effect transistor Gas sensor BIOSENSOR
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Modeling electric field of power metal-oxide-semiconductor field-effect transistor with dielectric trench based on Schwarz–Christoffel transformation 被引量:1
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作者 汪志刚 廖涛 王亚南 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第5期366-373,共8页
A power metal-oxide-semiconductor field-effect transistor(MOSFET) with dielectric trench is investigated to enhance the reversed blocking capability. The dielectric trench with a low permittivity to reduce the electri... A power metal-oxide-semiconductor field-effect transistor(MOSFET) with dielectric trench is investigated to enhance the reversed blocking capability. The dielectric trench with a low permittivity to reduce the electric field at reversed blocking state has been studied. To analyze the electric field, the drift region is segmented into four regions, where the conformal mapping method based on Schwarz–Christoffel transformation has been applied. According to the analysis, the improvement in the electric field for using the low permittivity trench is mainly due to the two electric field peaks generated in the drift region around this dielectric trench. The analytical results of the electric field and the potential models are in good agreement with the simulation results. 展开更多
关键词 CONFORMAL mapping Schwarz–Christoffel TRANSFORMATION electric field TRENCH metal-oxidesemiconductor field-effect transistor (MOSFET) breakdown voltage
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A review for compact model of graphene field-effect transistors 被引量:1
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作者 卢年端 汪令飞 +1 位作者 李泠 刘明 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第3期96-113,共18页
Graphene has attracted enormous interests due to its unique physical, mechanical, and electrical properties. Specially,graphene-based field-effect transistors(FETs) have evolved rapidly and are now considered as an op... Graphene has attracted enormous interests due to its unique physical, mechanical, and electrical properties. Specially,graphene-based field-effect transistors(FETs) have evolved rapidly and are now considered as an option for conventional silicon devices. As a critical step in the design cycle of modern IC products, compact model refers to the development of models for integrated semiconductor devices for use in circuit simulations. The purpose of this review is to provide a theoretical description of current compact model of graphene field-effect transistors. Special attention is devoted to the charge sheet model, drift-diffusion model, Boltzmann equation, density of states(DOS), and surface-potential-based compact model. Finally, an outlook of this field is briefly discussed. 展开更多
关键词 two-dimensional material GRAPHENE field-effect transistor compact model
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A combined virtual impactor and field-effect transistor microsystem for particulate matter separation and detection 被引量:1
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作者 Yanna Li Muqing Fu +2 位作者 Wei Pang Ye Chang Xuexin Duan 《Nanotechnology and Precision Engineering》 CAS CSCD 2021年第1期17-25,共9页
Ambient suspended particulate matter(PM)(primarily with particle diameter 2.5m or less,i.e.,PM2.5)can adversely affect ecosystems and human health.Currently,optical particle sensors based on light scattering dominate... Ambient suspended particulate matter(PM)(primarily with particle diameter 2.5m or less,i.e.,PM2.5)can adversely affect ecosystems and human health.Currently,optical particle sensors based on light scattering dominate the portable PM sensing market.However,the light scattering method has poor adaptability to different-sized PM and adverse environmental conditions.Here,we design and develop a portable PM sensing microsystem that consists of a micromachined virtual impactor(VI)for particle separation,a thermophoretic deposition chip for particle collection,and an extended-gate field-effect transistor(FET)for particle analysis.This system can realize on-site separation,collection,and analysis of aerosol particles without being influenced by environmental factors.In this study,the design of the VI is thoroughly analyzed by numerical simulation,and mixtures of different-sized silicon dioxide(SiO2)particles are used in an experimental verification of the performance of the VI and FET.Considering the low cost and compact design of the whole system,the proposed PM analysis microsystem has potential for PM detection under a wide range of conditions,such as heavily polluted industrial environments and for point-of-need outdoor and indoor air quality monitoring. 展开更多
关键词 Particulate matter MICROSYSTEM Virtual impactor 50%cutoff diameter field-effect transistor
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High-performance junction field-effect transistor based on black phosphorus/β-Ga2O3 heterostructure 被引量:1
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作者 Chang Li Cheng Chen +6 位作者 Jie Chen Tao He Hongwei Li Zeyuan Yang Liu Xie Zhongchang Wang Kai Zhang 《Journal of Semiconductors》 EI CAS CSCD 2020年第8期52-58,共7页
Black phosphorous(BP),an excellent two-dimensional(2D)monoelemental layered p-type semiconductor material with high carrier mobility and thickness-dependent tunable direct bandgap structure,has been widely applied in ... Black phosphorous(BP),an excellent two-dimensional(2D)monoelemental layered p-type semiconductor material with high carrier mobility and thickness-dependent tunable direct bandgap structure,has been widely applied in various devices.As the essential building blocks for modern electronic and optoelectronic devices,high quality PN junctions based on semiconductors have attracted widespread attention.Herein,we report a junction field-effect transistor(JFET)by integrating narrow-gap p-type BP and ultra-wide gap n-typeβ-Ga2O3 nanoflakes for the first time.BP andβ-Ga2O3 form a vertical van der Waals(vdW)heterostructure by mechanically exfoliated method.The BP/β-Ga2O3 vdW heterostructure exhibits remarkable PN diode rectifying characteristics with a high rectifying ratio about 107 and a low reverse current around pA.More interestingly,by using the BP as the gate andβ-Ga2O3 as the channel,the BP/β-Ga2O3 JFET devices demonstrate excellent n-channel JFET characteristics with the on/off ratio as high as 107,gate leakage current around as low as pA,maximum transconductance(gm)up to 25.3μS and saturation drain current(IDSS)of 16.5μA/μm.Moreover,it has a pinch-off voltage of–20 V and a minimum subthreshold swing of 260 mV/dec.These excellent n-channel JFET characteristics will expand the application of BP in future nanoelectronic devices. 展开更多
关键词 two-dimensional semiconductor black phosphorous β-gallium oxide vdWs heterostructure junction field-effect transistor
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Hunting down the ohmic contact of organic field-effect transistor
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作者 M Micjan M Novota +2 位作者 P Telek M Donoval M Weis 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第11期382-387,共6页
We report properties of contact resistances observed on pentacene organic field-effect transistors(OFET) with four different source/drain electrodes, namely, copper(Cu), gold(Au), silver(Ag), and germanium(Ge). The me... We report properties of contact resistances observed on pentacene organic field-effect transistors(OFET) with four different source/drain electrodes, namely, copper(Cu), gold(Au), silver(Ag), and germanium(Ge). The metals were selected to provide a wide range of energy barriers for charge injection, from blocking contact to smooth injection. All OFETs exhibited strong voltage dependence of the contact resistance, even for devices with smooth injection, which is in strong disagreement with the definition of ohmic contacts. A comparison with current crowding, resistive network, Fowler–Nordheim tunneling, and electric field enhanced thermionic injection(Schottky emission) pointed to importance of local electric fields and/or electrostatic field charges. 展开更多
关键词 organic field-effect TRANSISTORS contact resistance CHARGE INJECTION
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Optimization of ambipolar current and analog/RF performance for T-shaped tunnel field-effect transistor with gate dielectric spacer
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作者 韩茹 张海潮 +1 位作者 王党辉 李翠 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第1期656-662,共7页
A new T-shaped tunnel field-effect transistor(TTFET) with gate dielectric spacer(GDS) structure is proposed in this paper. To further studied the effects of GDS structure on the TTFET, detailed device characteristics ... A new T-shaped tunnel field-effect transistor(TTFET) with gate dielectric spacer(GDS) structure is proposed in this paper. To further studied the effects of GDS structure on the TTFET, detailed device characteristics such as current-voltage relationships, energy band diagrams, band-to-band tunneling(BTBT) rate and the magnitude of the electric field are investigated by using TCAD simulation. It is found that compared with conventional TTFET and TTFET with gate-drain overlap(GDO) structure, GDS-TTFET not only has the minimum ambipolar current but also can suppress the ambipolar current under a more extensive bias range. Furthermore, the analog/RF performances of GDS-TTFET are also investigated in terms of transconductance, gate-source capacitance, gate-drain capacitance, cutoff frequency, and gain bandwidth production. By inserting a low-κ spacer layer between the gate electrode and the gate dielectric, the GDS structure can effectively reduce parasitic capacitances between the gate and the source/drain, which leads to better performance in term of cutoff frequency and gain bandwidth production. Finally, the thickness of the gate dielectric spacer is optimized for better ambipolar current suppression and improved analog/RF performance. 展开更多
关键词 tunneling field effect TRANSISTOR T-SHAPED TUNNEL field-effect TRANSISTOR gate dielectric SPACER ambipolar current analog/RF performance
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Performance Improvement in Hydrogenated Few-Layer Black Phosphorus Field-Effect Transistors
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作者 郑和梅 孙顺明 +5 位作者 刘浩 还亚炜 杨建国 朱宝 刘文军 丁士进 《Chinese Physics Letters》 SCIE CAS CSCD 2018年第12期49-51,共3页
A capping layer for black phosphorus(BP) field-effect transistors(FETs) can provide effective isolation from the ambient air; however, this also brings inconvenience to the post-treatment for optimizing devices. We pe... A capping layer for black phosphorus(BP) field-effect transistors(FETs) can provide effective isolation from the ambient air; however, this also brings inconvenience to the post-treatment for optimizing devices. We perform low-temperature hydrogenation on Al_2 O_3 capped BP FETs. The hydrogenated BP devices exhibit a pronounced improvement of mobility from 69.6 to 107.7 cm^2 v^(-1) s^(-1), and a dramatic decrease of subthreshold swing from8.4 to 2.6 V/dec. Furthermore, high/low frequency capacitance-voltage measurements suggest reduced interface defects in hydrogenated BP FETs. This could be due to the passivation of interface traps at both Al_2 O_3/BP and BP/SiO_2 interfaces with hydrogen revealed by secondary ion mass spectroscopy. 展开更多
关键词 Performance Improvement in Hydrogenated Few-Layer BLACK PHOSPHORUS field-effect TRANSISTORS BP Al
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Characteristics of cylindrical surrounding-gate GaAs_xSb_(1-x)/In_yGa_(1-y)As heterojunction tunneling field-effect transistors
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作者 关云鹤 李尊朝 +2 位作者 骆东旭 孟庆之 张也非 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第10期513-517,共5页
A Ⅲ-Ⅴ heterojunction tunneling field-effect transistor(TFET) can enhance the on-state current effectively,and GaAs_xSb_1_x/In_yGa_1_yAs heterojunction exhibits better performance with the adjustable band alignment b... A Ⅲ-Ⅴ heterojunction tunneling field-effect transistor(TFET) can enhance the on-state current effectively,and GaAs_xSb_1_x/In_yGa_1_yAs heterojunction exhibits better performance with the adjustable band alignment by modulating the alloy composition.In this paper,the performance of the cylindrical surrounding-gate GaAs_xSb_1_x/In_yGa_1_yAs heterojunction TFET with gate-drain underlap is investigated by numerical simulation.We validate that reducing drain doping concentration and increasing gate-drain underlap could be effective ways to reduce the off-state current and subthreshold swing(SS),while increasing source doping concentration and adjusting the composition of GaAs_xSb_1_xIn_yGa_1_yAs can improve the on-state current.In addition,the resonant TFET based on GaAs_xSb_1_x/In_yGa_1_yAs is also studied,and the result shows that the minimum and average of SS reach 11 mV/decade and 20 mV/decade for five decades of drain current,respectively,and is much superior to the conventional TFET. 展开更多
关键词 tunneling field-effect transistor surrounding-gate subthreshold swing resonant tunneling
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Electron mobility in the linear region of an AlGaN/AlN/GaN heterostructure field-effect transistor
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作者 于英霞 林兆军 +3 位作者 栾崇彪 王玉堂 陈弘 王占国 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第6期530-535,共6页
We simulate the current-voltage(I-V) characteristics of AlGaN/AlN/GaN heterostructure field-effect transistors(HFETs) with different gate lengths using the quasi-two-dimensional(quasi-2D) model.The calculation results... We simulate the current-voltage(I-V) characteristics of AlGaN/AlN/GaN heterostructure field-effect transistors(HFETs) with different gate lengths using the quasi-two-dimensional(quasi-2D) model.The calculation results obtained using the modified mobility model are found to accord well with the experimental data.By analyzing the variation of the electron mobility for the two-dimensional electron gas(2DEG) with the electric field in the linear region of the AlGaN/AlN/GaN HFET I-V output characteristics,it is found that the polarization Coulomb field scattering still plays an important role in the electron mobility of AlGaN/AlN/GaN HFETs at the higher drain voltage and channel electric field.As drain voltage and channel electric field increase,the 2DEG density reduces and the polarization Coulomb field scattering increases,as a result,the 2DEG electron mobility decreases. 展开更多
关键词 AlGaN/AlN/GaN heterostructure field-effect transistors quasi-two-dimensional model the polarization Coulomb field scattering the two-dimensional electron gas mobility
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Lateral depletion-mode 4H-SiC n-channel junction field-effect transistors operational at 400℃
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作者 刘思成 汤晓燕 +4 位作者 宋庆文 袁昊 张艺蒙 张义门 张玉明 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第2期567-572,共6页
This paper presents the development of lateral depletion-mode n-channel 4 H-SiC junction field-effect transistors(LJFETs)using double-mesa process toward high-temperature integrated circuit(IC)applications.At room tem... This paper presents the development of lateral depletion-mode n-channel 4 H-SiC junction field-effect transistors(LJFETs)using double-mesa process toward high-temperature integrated circuit(IC)applications.At room temperature,the fabricated LJFETs show a drain-to-source saturation current of 23.03μA/μm,which corresponds to a current density of 7678 A/cm^(2).The gate-to-source parasitic resistance of 17.56 kΩ·μm is reduced to contribute only 13.49%of the on-resistance of 130.15 kΩ·μm,which helps to improve the transconductance up to 8.61μS/μm.High temperature characteristics of LJFETs were performed from room temperature to 400℃.At temperatures up to 400℃in air,it is observed that the fabricated LJFETs still show normally-on operating characteristics.The drain-to-source saturation current,transconductance and intrinsic gain at 400℃are 7.47μA/μm,2.35μS/μm and 41.35,respectively.These results show significant improvement over state-of-the-art and make them attractive for high-temperature IC applications. 展开更多
关键词 junction field-effect transistors high temperature 4H-SIC DEPLETION-MODE
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Design and investigation of novel ultra-high-voltage junction field-effect transistor embedded with NPN
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作者 冯希昆 顾晓峰 +2 位作者 马琴玲 杨燕妮 梁海莲 《Chinese Physics B》 SCIE EI CAS CSCD 2021年第7期619-623,共5页
Ultra-high-voltage(UHV)junction field-effect transistors(JFETs)embedded separately with the lateral NPN(JFETLNPN),and the lateral and vertical NPN(JFET-LVNPN),are demonstrated experimentally for improving the electros... Ultra-high-voltage(UHV)junction field-effect transistors(JFETs)embedded separately with the lateral NPN(JFETLNPN),and the lateral and vertical NPN(JFET-LVNPN),are demonstrated experimentally for improving the electrostatic discharge(ESD)robustness.The ESD characteristics show that both JFET-LNPN and JFET-LVNPN can pass the 5.5-k V human body model(HBM)test.The JFETs embedded with different NPNs have 3.75 times stronger in ESD robustness than the conventional JFET.The failure analysis of the devices is performed with scanning electron microscopy,and the obtained delayer images illustrate that the JFETs embedded with NPN transistors have good voltage endurance capabilities.Finally,the internal physical mechanism of the JFETs embedded with different NPNs is investigated with emission microscopy and Sentaurus simulation,and the results confirm that the JFET-LVNPN has stronger ESD robustness than the JFET-LNPN,because the vertical NPN has a better electron collecting capacity.The JFET-LVNPN is helpful in providing a strong ESD protection and functions for a power device. 展开更多
关键词 junction field-effect transistors NPN electrostatic discharge(ESD)robustness ESD protection
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