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A test device for isotopic γ-ray imaging with CdZnTe detector
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作者 HUANG Jin WANG Xiaolian +1 位作者 ZENG Hui XU Zizong 《Nuclear Science and Techniques》 SCIE CAS CSCD 2007年第2期107-110,共4页
A test device for isotopic γ-ray imaging, which consists of an isotope γ-ray source, a CdZnTe γ-ray spec- trometer and other auxiliary equipment, is studied here. Compared with the conventional X-ray, the isotope ... A test device for isotopic γ-ray imaging, which consists of an isotope γ-ray source, a CdZnTe γ-ray spec- trometer and other auxiliary equipment, is studied here. Compared with the conventional X-ray, the isotope γ-ray, which is utilized in this project, has its own advantages in imaging. Furthermore, with a room-temperature high-energy-resolution CdZnTe detector and a modern imaging processing technique, this device is capable of effec- tively suppressing the background and gaining more information, thus it can obtain a better image than conventional X-ray devices. In the experiment of PCB imaging, all soldered points and chip components are sharply demonstrated. 展开更多
关键词 同位素γ射线源 成像 检测装置 cdznte探测器
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