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Detection and Characterization of Defects in Additive Manufacturing by Polarization-Based Imaging System
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作者 Xing Peng Lingbao Kong 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2023年第5期120-140,共21页
Additive manufacturing (AM) technology such as selective laser melting (SLM) often produces a high refection phenomenon that makes defect detection and information extraction challenging. Meanwhile, it is essential to... Additive manufacturing (AM) technology such as selective laser melting (SLM) often produces a high refection phenomenon that makes defect detection and information extraction challenging. Meanwhile, it is essential to establish a characterization method for defect analysis to provide sufcient information for process diagnosis and optimization. However, there is still a lack of universal standards for the characterization of defects in SLM parts. In this study, a polarization-based imaging system was proposed, and a set of characterization parameters for SLM defects was established. The contrast, defect contour information, and high refection suppression efect of the SLM part defects were analyzed. Comparative analysis was conducted on defect characterization parameters, including geometric and texture parameters. The experimental results demonstrated the efects of the polarization imaging system and verifed the feasibility of the defect feature extraction and characterization method. The research work provides an efective solution for defect detection and helps to establish a universal standard for defect characterization in additive manufacturing. 展开更多
关键词 Additive manufacturing Selective laser melting High refection Defect characterization polarizationbased imaging
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