We study the temperature T and the phase of the Josephson critical current I（Ф） by taking into account the roughness scattering effect at inerface in an f-wave superconductor （S）/Insulator layer （I）/f-wave supe...We study the temperature T and the phase of the Josephson critical current I（Ф） by taking into account the roughness scattering effect at inerface in an f-wave superconductor （S）/Insulator layer （I）/f-wave superconductor （S） junction. It is found that the Josephson critical currents in f-wave Sir-wave S, the barrier strength and the roughness strength at inerface always suppress the Andreev reflection. When α=β, the phase dependence of the Josephson current I（Ф） between two f-wave S is predicted to be sin Ф; particularly, when a α≠ β, the phase dependence of the Josephson current I（Ф） between two f-wave superconductors is not predicted to be sin Ф and with the barrier strength increasing, the period of the I（Ф） turns decrease.展开更多
基金Supported by the"333"Project Funds of Jiangsu Province of China,the National Natural Science Foundation of China under Grant No.20571029by the Program for Excellent Talents in Huangshi Institute of Technology
文摘We study the temperature T and the phase of the Josephson critical current I（Ф） by taking into account the roughness scattering effect at inerface in an f-wave superconductor （S）/Insulator layer （I）/f-wave superconductor （S） junction. It is found that the Josephson critical currents in f-wave Sir-wave S, the barrier strength and the roughness strength at inerface always suppress the Andreev reflection. When α=β, the phase dependence of the Josephson current I（Ф） between two f-wave S is predicted to be sin Ф; particularly, when a α≠ β, the phase dependence of the Josephson current I（Ф） between two f-wave superconductors is not predicted to be sin Ф and with the barrier strength increasing, the period of the I（Ф） turns decrease.
