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Fault diagnosis and process monitoring using a statistical pattern framework based on a self-organizing map 被引量:2
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作者 宋羽 姜庆超 颜学峰 《Journal of Central South University》 SCIE EI CAS CSCD 2015年第2期601-609,共9页
A multivariate method for fault diagnosis and process monitoring is proposed. This technique is based on a statistical pattern(SP) framework integrated with a self-organizing map(SOM). An SP-based SOM is used as a cla... A multivariate method for fault diagnosis and process monitoring is proposed. This technique is based on a statistical pattern(SP) framework integrated with a self-organizing map(SOM). An SP-based SOM is used as a classifier to distinguish various states on the output map, which can visually monitor abnormal states. A case study of the Tennessee Eastman(TE) process is presented to demonstrate the fault diagnosis and process monitoring performance of the proposed method. Results show that the SP-based SOM method is a visual tool for real-time monitoring and fault diagnosis that can be used in complex chemical processes.Compared with other SOM-based methods, the proposed method can more efficiently monitor and diagnose faults. 展开更多
关键词 statistic pattern framework self-organizing map fault diagnosis process monitoring
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