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Capturing the non-equilibrium state in light–matter–free-electron interactions through ultrafast transmission electron microscopy
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作者 汪文韬 孙帅帅 +5 位作者 李俊 郑丁国 黄思远 田焕芳 杨槐馨 李建奇 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第1期88-101,共14页
Ultrafast transmission electron microscope(UTEM) with the multimodality of time-resolved diffraction, imaging,and spectroscopy provides a unique platform to reveal the fundamental features associated with the interact... Ultrafast transmission electron microscope(UTEM) with the multimodality of time-resolved diffraction, imaging,and spectroscopy provides a unique platform to reveal the fundamental features associated with the interaction between free electrons and matter. In this review, we summarize the principles, instrumentation, and recent developments of the UTEM and its applications in capturing dynamic processes and non-equilibrium transient states. The combination of the transmission electron microscope with a femtosecond laser via the pump–probe method guarantees the high spatiotemporal resolution, allowing the investigation of the transient process in real, reciprocal and energy spaces. Ultrafast structural dynamics can be studied by diffraction and imaging methods, revealing the coherent acoustic phonon generation and photoinduced phase transition process. In the energy dimension, time-resolved electron energy-loss spectroscopy enables the examination of the intrinsic electronic dynamics of materials, while the photon-induced near-field electron microscopy extends the application of the UTEM to the imaging of optical near fields with high real-space resolution. It is noted that light–free-electron interactions have the ability to shape electron wave packets in both longitudinal and transverse directions, showing the potential application in the generation of attosecond electron pulses and vortex electron beams. 展开更多
关键词 ultrafast transmission electron microscopy non-equilibrium structural dynamics photo-induced phase transition free-electron–photon interactions
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A transmission electron microscopy study of the diversity of Candida albicans cells induced by Euphorbia hirta L.leaf extract in vitro 被引量:3
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作者 Abu Arra Basma Zakaria Zuraini Sreenivasan Sasidharan 《Asian Pacific Journal of Tropical Biomedicine》 SCIE CAS 2011年第1期20-22,共3页
Objective:To determine the major changes in the microstructure of Candida albicans(C. albicans) after treatment with Euphorbia hirta(E.hirta) L.leaf extract.Methods:Transmission electron microscopy was used to study t... Objective:To determine the major changes in the microstructure of Candida albicans(C. albicans) after treatment with Euphorbia hirta(E.hirta) L.leaf extract.Methods:Transmission electron microscopy was used to study the ultrastructural changes caused by E.hirta extract on C. albicans cells al various exposure time.Results:It was found that the main abnormalities were the alterations in morphology,lysis and complete collapse of the yeast cells after 36 h of exposure to the extract.Whereas the control cultures showed a typical morphology of Candida with a uniform central density,typically structured nucleus,and a cytoplasm with several elements of endomembrane system and enveloped by a regular,intact cell wall.Conclusions:The significant antifungal activity shown by this methanol extract of E.hirta L.suggests its potential against infections caused by C.albicans.The extract may be developed as an anticandidal agent. 展开更多
关键词 CANDIDA ALBICANS EUPHORBIA hirta L. transmission electron microscopy Anticandidal agent
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High-resolution Transmission Electron Microscopy Characterization of the Structure of Cu Precipitate in a Thermal-aged Multicomponent Steel 被引量:1
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作者 Lizhan Han Qingdong Liu Jianfeng Gu 《Chinese Journal of Mechanical Engineering》 SCIE EI CAS CSCD 2019年第5期117-124,共8页
High-dispersed nanoscale Cu precipitates often contribute to extremely high strength due to precipitation hardening,and whereas usually lead to degraded toughness for especially ferritic steels.Hence,it is important t... High-dispersed nanoscale Cu precipitates often contribute to extremely high strength due to precipitation hardening,and whereas usually lead to degraded toughness for especially ferritic steels.Hence,it is important to understand the formation behaviors of the Cu precipitates.High-resolution transmission electron microscopy(TEM)is utilized to investigate the structure of Cu precipitates thermally formed in a high-strength low-alloy(HSLA)steel.The Cu precipitates were generally formed from solid solution and at the crystallographic defects such as martensite lath boundaries and dislocations.The Cu precipitates in the same aging condition have various structure of BCC,9 R and FCC,and the structural evolution does not greatly correlate with the actual sizes.The presence of different structures in an individual Cu precipitate is observed,which reflects the structural transformation occurring locally to relax the strain energy.The multiply additions in the steel possibly make the Cu precipitation more complex compared to the binary or the ternary Fe-Cu alloys with Ni or Mn additions.This research gives constructive suggestions on alloying design of Cu-bearing alloy steels. 展开更多
关键词 CU PRECIPITATE High-resolution transmission electron microscopy THERMAL aging HIGH-STRENGTH low-alloy STEEL
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Scanning transmission electron microscopy: A review of high angle annular dark field and annular bright field imaging and applications in lithium-ion batteries 被引量:1
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作者 仝毓昕 张庆华 谷林 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第6期23-34,共12页
Scanning transmission electron microscopy(STEM) has been shown as powerful tools for material characterization,especially after the appearance of aberration-corrector which greatly enhances the resolution of STEM. Hig... Scanning transmission electron microscopy(STEM) has been shown as powerful tools for material characterization,especially after the appearance of aberration-corrector which greatly enhances the resolution of STEM. High angle annular dark field(HAADF) and annular bright field(ABF) imaging of the aberration-corrected STEM are widely used due to their high-resolution capabilities and easily interpretable image contrasts. However, HAADF mode of the STEM is still limited in detecting light elements due to the weak electron-scattering power. ABF mode of the STEM could detect light and heavy elements simultaneously, providing unprecedented opportunities for probing unknown structures of materials. Atomiclevel structure investigation of materials has been achieved by means of these imaging modes, which is invaluable in many fields for either improving properties of materials or developing new materials. This paper aims to provide a introduction of HAADF and ABF imaging techniques and reviews their applications in characterization of cathode materials, study of electrochemical reaction mechanisms, and exploring the effective design of lithium-ion batteries(LIBs). The future prospects of the STEM are also discussed. 展开更多
关键词 scanning transmission electron microscopy high angle annular dark field annular bright field lithium-ion batteries
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Transmission Electron Microscopy as a Powerful Tool for Investigating Lithium-ion Battery Materials 被引量:1
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作者 LIN Cong LI Jian-Yuan +1 位作者 WANG Chong-Min PAN Feng 《Chinese Journal of Structural Chemistry》 SCIE CAS CSCD 2019年第12期2015-2019,共5页
Transmission electron microscopy(TEM) stands out as one of the most powerful tools for characterizing materials at multiple scales and dimensions. This unique technique has nowadays been widely employed in investigati... Transmission electron microscopy(TEM) stands out as one of the most powerful tools for characterizing materials at multiple scales and dimensions. This unique technique has nowadays been widely employed in investigating the lithium-ion battery(LIB) materials. The present perspective paper focuses on several LIB related aspects that are recently revealed by using TEM. Finally, we present outlook on the future directions of TEM for LIB research and development. 展开更多
关键词 transmission electron microscopy lithium-ion batteries STRUCTURES PROPERTIES
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A review of in situ transmission electron microscopy study on the switching mechanism and packaging reliability in non-volatile memory 被引量:1
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作者 Xin Yang Chen Luo +7 位作者 Xiyue Tian Fang Liang Yin Xia Xinqian Chen Chaolun Wang Steve Xin Liang Xing Wu Junhao Chu 《Journal of Semiconductors》 EI CAS CSCD 2021年第1期62-76,共15页
Non-volatile memory(NVM)devices with non-volatility and low power consumption properties are important in the data storage field.The switching mechanism and packaging reliability issues in NVMs are of great research i... Non-volatile memory(NVM)devices with non-volatility and low power consumption properties are important in the data storage field.The switching mechanism and packaging reliability issues in NVMs are of great research interest.The switching process in NVM devices accompanied by the evolution of microstructure and composition is fast and subtle.Transmission electron microscopy(TEM)with high spatial resolution and versatile external fields is widely used in analyzing the evolution of morphology,structures and chemical compositions at atomic scale.The various external stimuli,such as thermal,electrical,mechanical,optical and magnetic fields,provide a platform to probe and engineer NVM devices inside TEM in real-time.Such advanced technologies make it possible for an in situ and interactive manipulation of NVM devices without sacrificing the resolution.This technology facilitates the exploration of the intrinsic structure-switching mechanism of NVMs and the reliability issues in the memory package.In this review,the evolution of the functional layers in NVM devices characterized by the advanced in situ TEM technology is introduced,with intermetallic compounds forming and degradation process investigated.The principles and challenges of TEM technology on NVM device study are also discussed. 展开更多
关键词 MEMORY transmission electron microscopy in situ characterization PACKAGE RELIABILITY
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Recent progress on advanced transmission electron microscopy characterization for halide perovskite semiconductors 被引量:1
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作者 Xiaomei Wu Xiaoxing Ke Manling Sui 《Journal of Semiconductors》 EI CAS CSCD 2022年第4期67-81,共15页
Halide perovskites are strategically important in the field of energy materials. Along with the rapid development of the materials and related devices, there is an urgent need to understand the structure–property rel... Halide perovskites are strategically important in the field of energy materials. Along with the rapid development of the materials and related devices, there is an urgent need to understand the structure–property relationship from nanoscale to atomic scale. Much effort has been made in the past few years to overcome the difficulty of imaging limited by electron dose,and to further extend the investigation towards operando conditions. This review is dedicated to recent studies of advanced transmission electron microscopy(TEM) characterizations for halide perovskites. The irradiation damage caused by the interaction of electron beams and perovskites under conventional imaging conditions are first summarized and discussed. Low-dose TEM is then discussed, including electron diffraction and emerging techniques for high-resolution TEM(HRTEM) imaging. Atomic-resolution imaging, defects identification and chemical mapping on halide perovskites are reviewed. Cryo-TEM for halide perovskites is discussed, since it can readily suppress irradiation damage and has been rapidly developed in the past few years. Finally, the applications of in-situ TEM in the degradation study of perovskites under environmental conditions such as heating,biasing, light illumination and humidity are reviewed. More applications of emerging TEM characterizations are foreseen in the coming future, unveiling the structural origin of halide perovskite’s unique properties and degradation mechanism under operando conditions, so to assist the design of a more efficient and robust energy material. 展开更多
关键词 organic–inorganic hybrid perovskite solar cell materials energy materials scanning electron microscopy transmission electron microscopy irradiation damage
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Lattice Distortion Analysis Directly from High Resolution Transmission Electron Microscopy Images —the LADIA Program Package 被引量:2
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作者 Y.Rau, N.Y.Jin-Phillipp and F.PhillippMax-Planck-Institut fiir Metallforschung, Heisenbergstrasse 1, Stuttgart, D-70569, Germany 《Journal of Materials Science & Technology》 SCIE EI CAS CSCD 2002年第2期135-138,共4页
Direct strain mapping from high resolution transmission electron microscopy images is possible for coherent structures. At proper imaging conditions the intensity peaks in the image have a constant spatial relationshi... Direct strain mapping from high resolution transmission electron microscopy images is possible for coherent structures. At proper imaging conditions the intensity peaks in the image have a constant spatial relationship with the projected atom columns. This allows the determination of the geometry of the projected unit cell without comparison with image simulations. The fast procedure is particularly suited for the analysis of large areas. The software package LADIA is written in the PV-WAVE code and provides all necessary tools for image processing and analysis. Image intensity peaks are determined by a cross-correlation technique, which avoids problems from noise in the low spatial frequency range. The lower limit of strain that can be detected at a sampling rate of 44 pixels/nm is≈2%. 展开更多
关键词 电子显微镜 HRtem 金属 形态分析 金相分析
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3-1 Transmission Electron Microscopy Investigations of Bubble Formation in Grain Boundaries of He-implanted Polycrystalline SiC 被引量:2
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作者 Li Bingsheng Du Yangyang Wang Zhiguang 《IMP & HIRFL Annual Report》 2015年第1期89-90,共2页
Because of the low cross-section for neutron capture and its excellent structural, chemical and mechanical stability, silicon carbide (SiC) is an important material with application in the development of nuclear energ... Because of the low cross-section for neutron capture and its excellent structural, chemical and mechanical stability, silicon carbide (SiC) is an important material with application in the development of nuclear energy and waste technologies. For example, in the fourth generation of fission reactors, such as high-temperature gas-cooled reactors and gas-cooled fast reactors, TRISO-coated particle fuel is designed, because this fuel is very robust with no failures anticipated during irradiation and under accident conditions. 展开更多
关键词 transmission electron microscopy
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Movement of Dislocations in the Sub-Surface of a Polycrystalline Metal by Cavitation Peening Observed by Transmission Electron Microscopy 被引量:1
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作者 Osamu Takakuwa Akihiko Chiba Hitoshi Soyama 《Materials Sciences and Applications》 2015年第2期140-144,共5页
The impact produced when cavitation bubbles collapse can be utilized to modify surfaces in the same way as shot peening and it is called cavitation peening (CP). CP is one of a number of surface modification technique... The impact produced when cavitation bubbles collapse can be utilized to modify surfaces in the same way as shot peening and it is called cavitation peening (CP). CP is one of a number of surface modification techniques used to improve the fatigue strength of metallic materials by introducing compressive residual stress. Although it has been shown by an X-ray diffraction method that CP decreases the micro-strain related to dislocations in the sub-surface of a polycrystalline material, the mechanism for this decrease is unclear. In this paper, the movement of dislocations by CP was observed using transmission electron microscopy (TEM). 展开更多
关键词 Microstructure transmission electron microscopy DISLOCATION SURFACE Modification CAVITATION
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CONTAMINATION LINE METHOD AND COMPARISON OF FOIL THICKNESS MEASUREMENT METHODS IN TRANSMISSION ELECTRON MICROSCOPY
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作者 PAN ZhenpengGuangdong Mechanical College. Guangzhou. China 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 1994年第3期175-178,共4页
The paper brieflv introduces the Contamination Line Method for foil thicknessmeasurement in transmission electron microscopy and compares it with four conventionalmethods:the convergent beam diffraction method,thecont... The paper brieflv introduces the Contamination Line Method for foil thicknessmeasurement in transmission electron microscopy and compares it with four conventionalmethods:the convergent beam diffraction method,thecontamination spor method,themethods based on characteristic X-rav emission and cominuous X-rav emission on the epplication,operation and accuracvetc. 展开更多
关键词 transmission electron microscopy FOIL thickness MEASUREMENT
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Transmission Electron Microscopy Investigation of the Ar^+ Ion Irradiation Effect in Semiconductor GaAs
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作者 Yang Xiangxiu Wang Renhui +1 位作者 Yan Heping Zhang Ze 《Wuhan University Journal of Natural Sciences》 EI CAS 1998年第1期35-40,共6页
Room temperature irradiation effect of GaAs compound semiconductor by 100 keV Ar^+ ions hasbeen systematically studied by means of transmission electron microscopy. The dose dependence of the Arcion lrradlatlon and ro... Room temperature irradiation effect of GaAs compound semiconductor by 100 keV Ar^+ ions hasbeen systematically studied by means of transmission electron microscopy. The dose dependence of the Arcion lrradlatlon and room temperature annealing errects have been Investigated. The experimental results sho’vthat the structure of GaAs transforms from perrect crystalline through weakly snd severely damaged crystalline to amorphous states with the increase of the irradiation dose and the damaged states are changed during room temperature annealing. 展开更多
关键词 GAAS IRRADIATION EFFECT transmission electron microscopy
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Characterization of swift heavy ion tracks in MoS2 by transmission electron microscopy
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作者 徐丽君 翟鹏飞 +6 位作者 张胜霞 曾健 胡培培 李宗臻 刘丽 孙友梅 刘杰 《Chinese Physics B》 SCIE EI CAS CSCD 2020年第10期401-405,共5页
The various morphologies of tracks in MoS2 irradiated by swift heavy ions at normal and 30° incidence with 9.5–25.0 MeV/u 86Kr, 129Xe, 181Ta, and 209Bi ions were investigated by transmission electron microscopy.... The various morphologies of tracks in MoS2 irradiated by swift heavy ions at normal and 30° incidence with 9.5–25.0 MeV/u 86Kr, 129Xe, 181Ta, and 209Bi ions were investigated by transmission electron microscopy. The diameter of ion tracks increases from 1.9 nm to 4.5 nm with increasing electronic energy loss. The energy loss threshold of the track formation in MoS2 is predicted as about 9.7 keV/nm based on the thermal spike model and it seems consistent with the experimental results. It is shown that the morphology of ion tracks is related to the penetration length of ions in MoS2. The formation process of ion tracks is discussed based on the cooperative process of outflow and recrystallization of the molten phase during rapid quenching. 展开更多
关键词 ion track MOS2 transmission electron microscopy(tem) RECRYSTALLIZATION
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Visualization of atomic scale reaction dynamics of supported nanocatalysts during oxidation and ammonia synthesis using in-situ environmental(scanning) transmission electron microscopy
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作者 Michael R.Ward Robert W.Mitchell +1 位作者 Edward D.Boyes Pratibha L.Gai 《Journal of Energy Chemistry》 SCIE EI CAS CSCD 2021年第6期281-290,I0007,共11页
Reaction dynamics in gases at operating temperatures at the atomic level are the basis of heterogeneous gas-solid catalyst reactions and are crucial to the catalyst function.Supported noble metal nanocatalysts such as... Reaction dynamics in gases at operating temperatures at the atomic level are the basis of heterogeneous gas-solid catalyst reactions and are crucial to the catalyst function.Supported noble metal nanocatalysts such as platinum are of interest in fuel cells and as diesel oxidation catalysts for pollution control,and practical ruthenium nanocatalysts are explored for ammonia synthesis.Graphite and graphitic carbons are of interest as supports for the nanocatalysts.Despite considerable literature on the catalytic processes on graphite and graphitic supports,reaction dynamics of the nanocatalysts on the supports in different reactive gas environments and operating temperatures at the single atom level are not well understood.Here we present real time in-situ observations and analyses of reaction dynamics of Pt in oxidation,and practical Ru nanocatalysts in ammonia synthesis,on graphite and related supports under controlled reaction environments using a novel in-situ environmental(scanning) transmission electron microscope with single atom resolution.By recording snapshots of the reaction dynamics,the behaviour of the catalysts is imaged.The images reveal single metal atoms,clusters of a few atoms on the graphitic supports and the support function.These all play key roles in the mobility,sintering and growth of the catalysts.The experimental findings provide new structural insights into atomic scale reaction dynamics,morphology and stability of the nanocatalysts. 展开更多
关键词 In-situ visualization Atomic scale reaction dynamics In-situ environmental scanning transmission electron microscopy with single atom resolution Supported nanoparticles Ammonia synthesis Oxidation reactions
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Short Communication—A Novel Sample Preparation Method That Enables Ultrathin Sectioning of Urea-Formaldehyde Resin for Imaging by Transmission Electron Microscopy
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作者 Adya P. Singh Arif Nuryawan Byung- Dae Park 《Microscopy Research》 2013年第1期1-6,共6页
Urea-formaldehyde (UF) resin is widely used as an adhesive for the manufacture of a range of wood and fiber based products. Although the microstructure of this resin has been examined at high resolution by field-emiss... Urea-formaldehyde (UF) resin is widely used as an adhesive for the manufacture of a range of wood and fiber based products. Although the microstructure of this resin has been examined at high resolution by field-emission scanning electron microscopy and atomic force microscopy, transmission electron microscopy (TEM) has thus far not been used, perhaps because of difficulties in ultrathin sectioning this resin in cured (polymerized) state. In the technical note presented here, a novel sample preparation method is described which enabled us to examine the microstructural morphology of UF resin by transmission electron microscopy in ultrathin sections, revealing the presence of spherical particles within the resin. Our initial attempt to ultrathin section the resin directly was not successful as it was too brittle to trim blocks for sectioning. Then, we developed a sample preparation technique that involved impregnation ofPinus radiatawood tissues with the UF resin, and then embedding of resin impregnated wood tissues with Spurr’s low viscosity embedding medium, which has been widely employed in plant and wood ultrastructure work. The TEM images illustrated and the information on the microstructural morphology of the UF resin presented are based on this novel sample preparation approach. 展开更多
关键词 UREA-FORMALDEHYDE (UF) Resin ULTRATHIN Sectioning transmission electron microscopy PINUS RADIATA VENEER Microstructure Spherical Particles
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Nano Phase Characterization by Transmission Electron Microscopy: Experimental and Simulation
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作者 Francisco Miguel Ascencio Aguirre Lourdes Bazá +9 位作者 n-Dí az Rubé n Mendoza-Cruz Alfredo Gó mez-Rodrí guez Cristina Zorrilla-Cangas Raú l Herrera-Becerra 《Materials Sciences and Applications》 2015年第11期935-942,共8页
This paper introduces a methodology of characterization of nanostructured systems in which trans- mission electron microscopy is used as a central element of the study. Experimental studies of HREM are performed in pa... This paper introduces a methodology of characterization of nanostructured systems in which trans- mission electron microscopy is used as a central element of the study. Experimental studies of HREM are performed in parallel with studies in the Simula TEM program to stimulate high-resolution images and diffraction patterns. To confirm the accuracy of the results, studies of X-ray diffraction (XRD) were performed. In order to illustrate the methodology, bismuth oxide Bi2O3 nanoparticles are synthesized by a method of biosynthesis because this sample is rich in structural information. 展开更多
关键词 transmission electron microscopy NANOPARTICLES BISMUTH OXIDE BI2O3
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Misfit-layered compound PbTiS_3 with incommensurate modulation:Transmission electron microscopy analysis and transport properties
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作者 沈希 程丹 +3 位作者 赵豪飞 姚湲 刘晓旸 禹日成 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第11期423-426,共4页
The microstructural characteristic of the misfit-layered compound PbTiS3has been studied with transmission electron microscopy.All the incommensurate modulation-induced satellite spots and main diffraction spots of ba... The microstructural characteristic of the misfit-layered compound PbTiS3has been studied with transmission electron microscopy.All the incommensurate modulation-induced satellite spots and main diffraction spots of basic sublattices can be indexed systematically with a superspace group method.Finally,the relationship between the electronic transport properties and the crystal structure is discussed. 展开更多
关键词 透射电子显微镜分析 电子输运性质 层状化合物 非公度调制 错位 晶体结构 空间群 子格
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TRANSMISSION ELECTRON MICROSCOPY INVESTIGATIONS OF LOW-PRESSURE CVD GROWTH AND STRAIN RELAXATION OF Ge ISLANDS ON Si(110)
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作者 E.Spiecker L.Zhang +2 位作者 H.M.Lu W.Jaeger L.Vescan 《Acta Metallurgica Sinica(English Letters)》 SCIE EI CAS CSCD 2005年第3期427-432,共6页
Shapes, dimensions, arrangements and the microstructure of self-assembled island s fabricated by low-pressure chemical vapour deposition (LPCVD) of Ge at 700℃ o nto Si(110) substrates have been investigated for diffe... Shapes, dimensions, arrangements and the microstructure of self-assembled island s fabricated by low-pressure chemical vapour deposition (LPCVD) of Ge at 700℃ o nto Si(110) substrates have been investigated for different nominal Ge coverage by transmission electron microscopy (TEM) of plan-view and cross-section specime ns and have been compared with photoluminescence (PL) measurements of Si-capped layer samples. The transition from the 2-dimensional layer to the 3-dimensional island growth mode takes place for a Ge deposition of nominally less than 2 mono layers. Upon this transition, many coherent islands and few larger islands with extended defects are observed. The coherent islands possess a dome-like shape an d lateral sizes up to 130nm. Photoluminescence spectra show island-related peaks whose energy positions are shifted towards lower energy with higher Ge coverage . 展开更多
关键词 硅-锗半导体 电子显微镜 纳米结构 薄膜生长 化学气相沉积
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Transmission electron microscopic study of the fine-grained vein matrix in the Suizhou L6 meteorite
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作者 Xie Xiande Wang Jianbo +2 位作者 Gu Xiangping Xiong Yi Jia Shuangfeng 《Acta Geochimica》 EI CAS CSCD 2016年第2期105-110,共6页
The mineralogy of shock vein matrix in the Suizhou meteorite has been investigated by optical and transmission electron microscopy. It was revealed that the vein matrix is composed of majorite-pyrope garnet, magnesiow... The mineralogy of shock vein matrix in the Suizhou meteorite has been investigated by optical and transmission electron microscopy. It was revealed that the vein matrix is composed of majorite-pyrope garnet, magnesiowüstite, and ringwoodite, with FeNi–FeS intergrowths. The observation and character of ring-like selected electron diffraction(SAED) patterns indicate that the idiomorphic garnet crystals in the vein matrix have different orientations. The polycrystalline nature of magnesiowüstite is also confirmed by a ring-like SAED pattern.Both garnet and magnesiowüstite crystals showed sharp diffraction spots, signifying the good crystallinity of these two minerals. The SAED pattern of cryptocrystalline ringwoodite shows only diffuse concentric diffraction rings. FeNi metal and troilite(FeS), which were molten during the shock event, occur in the matrix as fine eutectic FeNi–FeS intergrowths filling the interstices between garnet and magnesiowüstite grains. Based on the phase diagram of the Allende chondrite and the results of this TEM study, it is inferred that majorite-pyrope garnet first crystallized from the Suizhou chondritic melt at 22–26 GPa,followed by crystallization of magnesiowüstite at 20–24 GPa, and then ringwoodite at 18–20 GPa. The eutectic intergrowths of FeNi-metal and troilite are proposed to have crystallized during meteorite cooling and solidified at the last stage of vein formation. 展开更多
关键词 随州陨石 静脉 透射电镜 基质 透射电子显微镜 石榴石晶体 矿物学特征 细粒
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Bacteriophage Morphological Characterization by Using Transmission Electron Microscopy
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作者 Giuseppe Aprea Anna Rita D'Angelo Vincenza Annunziata Prencipe Giacomo Migliorati 《Journal of Life Sciences》 2015年第5期214-220,共7页
关键词 透射电子显微镜 形态特征 噬菌体 单核细胞增生李斯特氏菌 tem分析 细菌病毒 乳酸乳球菌 生物净化剂
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