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Wavelength calibration and spectral analysis of vacuum ultraviolet spectroscopy in EAST
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作者 计华健 张洪明 +6 位作者 吕波 Cheonho BAE 何梁 林子超 尹相辉 沈永才 戴舒宇 《Plasma Science and Technology》 SCIE EI CAS CSCD 2024年第8期37-43,共7页
A vacuum ultraviolet(VUV)spectroscopy with a focal length of 1 m has been engineered specifically for observing edge impurity emissions in Experimental Advanced Superconducting Tokamak(EAST).In this study,wavelength c... A vacuum ultraviolet(VUV)spectroscopy with a focal length of 1 m has been engineered specifically for observing edge impurity emissions in Experimental Advanced Superconducting Tokamak(EAST).In this study,wavelength calibration for the VUV spectroscopy is achieved utilizing a zinc lamp.The grating angle and charge-coupled device(CCD)position are carefully calibrated for different wavelength positions.The wavelength calibration of the VUV spectroscopy is crucial for improving the accuracy of impurity spectral data,and is required to identify more impurity spectral lines for impurity transport research.Impurity spectra of EAST plasmas have also been obtained in the wavelength range of 50–300 nm with relatively high spectral resolution.It is found that the impurity emissions in the edge region are still dominated by low-Z impurities,such as carbon,oxygen,and nitrogen,albeit with the application of fulltungsten divertors on the EAST tokamak. 展开更多
关键词 vacuum ultraviolet spectroscopy wavelength calibration impurity spectra
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A New Method for Measurements of the Poloidal Rotation Velocities and Wavelength Calibration of X-ray Imaging Crystal Spectrometer in Magnetic Fusion Devices
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作者 石跃江 吕波 +3 位作者 王福地 M.BITTER K.W.HILL 叶民友 《Plasma Science and Technology》 SCIE EI CAS CSCD 2015年第4期265-267,共3页
A new simple method is presented for the wavelength calibration and measurement of poloidal rotation velocities with X-ray imaging crystal spectrometer(XICS)in magnetic fusion devices.In this method,the toroidal rot... A new simple method is presented for the wavelength calibration and measurement of poloidal rotation velocities with X-ray imaging crystal spectrometer(XICS)in magnetic fusion devices.In this method,the toroidal rotation of plasma is applied for high precise alignment and wavelength calibration of the poloidal XICS.The measurement threshold of poloidal rotation velocity can be lowered to 1-3 km/s with this method. 展开更多
关键词 X-ray imaging crystal spectrometer wavelength calibration poloidal rotation velocity
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Gas Absorption Center-Based Wavelength Calibration Technique in QEPAS System for SNR Improvement 被引量:2
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作者 Zongliang WANG Jun CHANG +2 位作者 Qi LIU Cunwei TIAN Qinduan ZHANG 《Photonic Sensors》 SCIE EI CAS CSCD 2018年第4期358-366,共9页
A simple and effective wavelength calibration scheme is proposed in a quartz enhanced photoacoustic spectroscopy (QEPAS) system for trace gas detection. A reference gas cell is connected an InGaAs photodetector for ... A simple and effective wavelength calibration scheme is proposed in a quartz enhanced photoacoustic spectroscopy (QEPAS) system for trace gas detection. A reference gas cell is connected an InGaAs photodetector for detecting the absorption intensity peak caused by the gas to calibrate the gas absorption center using distributed feedback laser diode (DFB-LD) with sawtooth wave driver current. The gas absorption wavelength calibration and gas sensing operations are conducted at a special internal to eliminate the wavelength shift of DFB-LD caused by the ambient fluctuations. Compared with the conventional wavelength modulation spectroscopy (WMS), this method uses a lower lock-in amplifier bandwidth and averaging algorithm to improve signal noise ratio (SNR). Water vapor is chosen as a sample gas to evaluate its performance. In the experiments, the impact of sawtooth wave frequency and lock-in amplifier bandwidth on the harmonic signal is analyzed, and the wavelength-calibration technique-based system achieves a minimum detection limit (MDL) of 790ppbv and SNR with 13.4 improvement factor compared with the conventional WMS system. 展开更多
关键词 QEPAS DFB-LD wavelength calibration fiber gas sensor
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Study on the wavelength calibration of type Ⅲ concave grating spectrometry system
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作者 白力 廖宁放 +1 位作者 栗兆剑 杨卫平 《Chinese Optics Letters》 SCIE EI CAS CSCD 2004年第3期174-176,共3页
We discuss and calibrate the spectronaetry system based on concave reflection grating. The working principle, structure and parameters of the spectrometry system are introduced. For the wavelength calibration problem,... We discuss and calibrate the spectronaetry system based on concave reflection grating. The working principle, structure and parameters of the spectrometry system are introduced. For the wavelength calibration problem, three methods are put forward and discussed in detail with formulation calculation method, circular iteration method and interpolation. Interpolation is used to calibrate the concave reflection grating spectrometry system and the error is less than 1 nm. Four spectrum images that the system collected are given in this paper. The experimental results indicate that a spectrometry system can be based on concave reflection grating and be calibrated by interpolation. 展开更多
关键词 Study on the wavelength calibration of type concave grating spectrometry system
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Wavelength calibration of narrowband ArF laser with iron hollow cathode lamp
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作者 袁志军 张海波 +3 位作者 叶韧 周军 魏运荣 楼祺洪 《Chinese Optics Letters》 SCIE EI CAS CSCD 2017年第7期51-55,共5页
Accurate and precise wavelength controlling of narrowband excimer lasers is essential for the lithography of an integrated circuit. High-precision wavelength tuning and calibration of a line-narrowed Ar F laser are pr... Accurate and precise wavelength controlling of narrowband excimer lasers is essential for the lithography of an integrated circuit. High-precision wavelength tuning and calibration of a line-narrowed Ar F laser are presented in this work. The laser spectrum is narrowed to a sub-picometer with a line narrowing system. Absolute wavelength calibration of the line-narrowed laser is performed based on the optogalvanic(OG) effect using iron hollow cathode discharge(HCD). An sccuracy of better than 0.1 pm for wavelength tuning and calibration is achieved with our homemade wavemeter. 展开更多
关键词 calibration cathode hollow tuning wavelength lithography spectrometer repetition absolute resonant
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High-speed VUV spectroscopy for edge impurity line emission measurements in HL-2A tokamak 被引量:1
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作者 Dianlin ZHENG Kai ZHANG +7 位作者 Zhengying CUI Ping SUN Chunfeng DONG Ping LU Bingzhong FU Zetian LIU Zhongbing SHI Qingwei YANG 《Plasma Science and Technology》 SCIE EI CAS CSCD 2018年第10期75-83,共9页
A 20 cm focal length normal incidence vacuum ultraviolet (VUV_20 cm) monochromator with a fast time response has been developed for measuring edge impurity line emission in the wavelength range of 300-2000 A on an H... A 20 cm focal length normal incidence vacuum ultraviolet (VUV_20 cm) monochromator with a fast time response has been developed for measuring edge impurity line emission in the wavelength range of 300-2000 A on an HL-2A tokamak. An aberration corrected concave holographic grating with 1200 grooves/mm is adopted in the monochromator, which provides a wavelength dispersion of 40 A mm-1. The aperture is f/4.5. A channel electron multiplier is used as a detector. The time resolution of the system is 17 μs. Wavelength calibration of the system has been done by using a hollow cathode light source in the laboratory with helium and argon gases. The obtained signals of helium and argon spectra are very strong since the inner surface of the monochromator vacuum chamber is blackened and the stray light level is then significantly reduced. The optical property of the system has been examined by scanning the width of the entrance and exit slits. The system is then installed at the mid-port of the HL-2A tokamak and typical line emissions from the HL-2A plasma are measured. Time behaviors of edge impurity line emissions are observed with the fast time response system in different plasma confinement regimes, especially in the H-mode discharges. The result shows that the VUV_20 cm system works very well to measure the edge impurity line emissions in the edge localized modes phase of H-mode discharges. 展开更多
关键词 VUV monochromator CEM detector wavelength calibration impurity line emission H-mode plasmas
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A Wavelength Monitoring System Using Tunable MEMS Filter Calibrated by F-P Laser
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作者 H. Y. Tam P. K. A. Wai W. H. Chung 《光学学报》 EI CAS CSCD 北大核心 2003年第S1期615-616,共2页
We report a wavelength and power monitoring system based on a scanning MEMS filter as wavelength discriminator and a near threshold-biased Fabry-Perot diode laser as wavelength reference. This system is capable of mon... We report a wavelength and power monitoring system based on a scanning MEMS filter as wavelength discriminator and a near threshold-biased Fabry-Perot diode laser as wavelength reference. This system is capable of monitoring 250 channels of DWDM signal at 25 GHz ITU Grid with an error of less than ±8 pm. 展开更多
关键词 DWDM FP LD MEMS A wavelength Monitoring System Using Tunable MEMS Filter Calibrated by F-P Laser by
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