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Design Analysis of a Novel Low Triggering Voltage Dual Direction SCR ESD Device in 0.18μm Mixed Mode RFCMOS Technology 被引量:1
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作者 朱科翰 于宗光 +1 位作者 董树荣 韩雁 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第11期2164-2168,共5页
A novel SCR on-chip ESD device is proposed to protect IC chips against ESD stressing in two opposite direc- tions. The triggering voltages of four types of dual direction SCRs (DDSCR) are compared and analyzed, pMOS... A novel SCR on-chip ESD device is proposed to protect IC chips against ESD stressing in two opposite direc- tions. The triggering voltages of four types of dual direction SCRs (DDSCR) are compared and analyzed, pMOS or nMOS are embedded into the structures to adjust their triggering voltages. Both MOSFETs embedded DDSCRs have tunable triggering voltage,low DC leakage (~pA), and fast turn on speed snapback I-V characteristics without latch-up problem. It achieves high ESD performance of ~94V/μm. The new ESD protection devices are area efficient and can reduce the parasitic effects significantly. 展开更多
关键词 electrostatic discharge dual direction SCR SNAPBACK
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