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COVID-19 Infected Lung Computed Tomography Segmentation and Supervised Classification Approach
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作者 Aqib Ali Wali Khan Mashwani +6 位作者 Samreen Naeem Muhammad Irfan Uddin Wiyada Kumam Poom Kumam Hussam Alrabaiah Farrukh Jamal Christophe Chesneau 《Computers, Materials & Continua》 SCIE EI 2021年第7期391-407,共17页
The purpose of this research is the segmentation of lungs computed tomography(CT)scan for the diagnosis of COVID-19 by using machine learning methods.Our dataset contains data from patients who are prone to the epidem... The purpose of this research is the segmentation of lungs computed tomography(CT)scan for the diagnosis of COVID-19 by using machine learning methods.Our dataset contains data from patients who are prone to the epidemic.It contains three types of lungs CT images(Normal,Pneumonia,and COVID-19)collected from two different sources;the first one is the Radiology Department of Nishtar Hospital Multan and Civil Hospital Bahawalpur,Pakistan,and the second one is a publicly free available medical imaging database known as Radiopaedia.For the preprocessing,a novel fuzzy c-mean automated region-growing segmentation approach is deployed to take an automated region of interest(ROIs)and acquire 52 hybrid statistical features for each ROIs.Also,12 optimized statistical features are selected via the chi-square feature reduction technique.For the classification,five machine learning classifiers named as deep learning J4,multilayer perceptron,support vector machine,random forest,and naive Bayes are deployed to optimize the hybrid statistical features dataset.It is observed that the deep learning J4 has promising results(sensitivity and specificity:0.987;accuracy:98.67%)among all the deployed classifiers.As a complementary study,a statistical work is devoted to the use of a new statistical model to fit the main datasets of COVID-19 collected in Pakistan. 展开更多
关键词 COVID-19 machine learning fuzzy c-mean deep learning J4
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Designing Adaptive Multiple Dependent State Sampling Plan for Accelerated Life Tests 被引量:1
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作者 Pramote Charongrattanasakul Wimonmas Bamrungsetthapong Poom Kumam 《Computer Systems Science & Engineering》 SCIE EI 2023年第8期1631-1651,共21页
A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multi... A novel adaptive multiple dependent state sampling plan(AMDSSP)was designed to inspect products from a continuous manufacturing process under the accelerated life test(ALT)using both double sampling plan(DSP)and multiple dependent state sampling plan(MDSSP)concepts.Under accelerated conditions,the lifetime of a product follows the Weibull distribution with a known shape parameter,while the scale parameter can be determined using the acceleration factor(AF).The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive.An economic design of the proposed sampling plan was also considered for the ALT.A genetic algorithm with nonlinear optimization was used to estimate optimal plan parameters to minimize the average sample number(ASN)and total cost of inspection(TC)under both producer’s and consumer’s risks.Numerical results are presented to support the AMDSSP for the ALT,while performance comparisons between the AMDSSP,the MDSSP and a single sampling plan(SSP)for the ALT are discussed.Results indicated that the AMDSSP was more flexible and efficient for ASN and TC than the MDSSP and SSP plans under accelerated conditions.The AMDSSP also had a higher operating characteristic(OC)curve than both the existing sampling plans.Two real datasets of electronic devices for the ALT at high temperatures demonstrated the practicality and usefulness of the proposed sampling plan. 展开更多
关键词 Accelerated life test acceleration factor adaptive of multiple dependent state sampling plan average sample number total cost of inspection weibull distribution
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A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime 被引量:1
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作者 Pramote Charongrattanasakul Wimonmas Bamrungsetthapong Poom Kumam 《Computers, Materials & Continua》 SCIE EI 2022年第12期4611-4626,共16页
The design of a new adaptive version of the multiple dependent state(AMDS)sampling plan is presented based on the time truncated life test under the Weibull distribution.We achieved the proposed sampling plan by apply... The design of a new adaptive version of the multiple dependent state(AMDS)sampling plan is presented based on the time truncated life test under the Weibull distribution.We achieved the proposed sampling plan by applying the concept of the double sampling plan and existing multiple dependent state sampling plans.A warning sign for acceptance number was proposed to increase the probability of current lot acceptance.The optimal plan parameters were determined simultaneously with nonlinear optimization problems under the producer’s risk and consumer’s risk.A simulation study was presented to support the proposed sampling plan.A comparison between the proposed and existing sampling plans,namely multiple dependent state(MDS)sampling plans and a modified multiple dependent state(MMDS)sampling plan,was considered under the average sampling number and operating characteristic curve values.In addition,the use of two real datasets demonstrated the practicality and usefulness of the proposed sampling plan.The results indicated that the proposed plan is more flexible and efficient in terms of the average sample number compared to the existing MDS and MMDS sampling plans. 展开更多
关键词 Adaptive version of multiple dependent state sampling plan time truncated life test quality level weibull distribution mean lifetime
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