In order to monitor the fabrication process, an infrared imaging system was established to detect the shunted regions in crystalline silicon solar cells.The temperature of the shunted region was obviously higher than ...In order to monitor the fabrication process, an infrared imaging system was established to detect the shunted regions in crystalline silicon solar cells.The temperature of the shunted region was obviously higher than that of the non-shunted region when the cell was biased under direct voltage due to the Joule heat effect, and the shunted region could be detected by infrared imaging.The shunts caused by seven different reasons can be identified using metallurgical microscopy, scanning electron microscopy, and energy dispersive X-ray spectroscopy.Approaches for diminishing shunts are presented.The methods are beneficial for the optimization of the cell fabrication processes and the improvement of the cell performances.展开更多
基金supported by the PhD Program Foundation of the Ministry of Education of China(No.4111283) the Science and Technology Planning Program of Guangdong Province (No. 2007A010700002)
文摘In order to monitor the fabrication process, an infrared imaging system was established to detect the shunted regions in crystalline silicon solar cells.The temperature of the shunted region was obviously higher than that of the non-shunted region when the cell was biased under direct voltage due to the Joule heat effect, and the shunted region could be detected by infrared imaging.The shunts caused by seven different reasons can be identified using metallurgical microscopy, scanning electron microscopy, and energy dispersive X-ray spectroscopy.Approaches for diminishing shunts are presented.The methods are beneficial for the optimization of the cell fabrication processes and the improvement of the cell performances.
