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Poly-Si Thin Film Grown by Excimer Laser Crystallization and Its Ellipsometric Analysis
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作者 ZENGXiang-bin XUZhong-yang 《Semiconductor Photonics and Technology》 CAS 2000年第2期96-99,104,共5页
A novel approach of two-step laser crystallization for the growth of poly-Si thin film on glass substrate is investigated.Using this approach,we fabricated poly-Si thin film transistors with electron mobility of 103 c... A novel approach of two-step laser crystallization for the growth of poly-Si thin film on glass substrate is investigated.Using this approach,we fabricated poly-Si thin film transistors with electron mobility of 103 cm^2/V·s and on/off current ration of 1×10^7,They are better than those of the poly-Si TFTs fabricated by conventional single-step excimer laser crystallization.We also analyzed the structure of the laser crysallized poly-Si thin film and calculated the ellipsometric spectra.The calculated results are in good agreement with the measured results. 展开更多
关键词 多晶硅 薄膜 激光 结晶化 薄膜电晶体 椭圆光度法
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